{"id":"https://openalex.org/W2098158195","doi":"https://doi.org/10.1109/tcad.2009.2024709","title":"Optimal Test Margin Computation for At-Speed Structural Test","display_name":"Optimal Test Margin Computation for At-Speed Structural Test","publication_year":2009,"publication_date":"2009-08-24","ids":{"openalex":"https://openalex.org/W2098158195","doi":"https://doi.org/10.1109/tcad.2009.2024709","mag":"2098158195"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2009.2024709","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2009.2024709","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030156276","display_name":"Jinjun Xiong","orcid":"https://orcid.org/0000-0002-2620-4859"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jinjun Xiong","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102740578","display_name":"V. Zolotov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Zolotov","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113494689","display_name":"C. Visweswariah","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Visweswariah","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002055089","display_name":"Peter Habitz","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P.A. Habitz","raw_affiliation_strings":["IBM Systems and Technology Group, Essex Junction, VT, USA","IBM Systems and Technology Group, Essex Junction, VT"],"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Essex Junction, VT, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Systems and Technology Group, Essex Junction, VT","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5030156276"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":0.7915,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.7322151,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"28","issue":"9","first_page":"1414","last_page":"1423"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5939807891845703},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5010256767272949},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43732547760009766},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.41846945881843567},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35129672288894653},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3315216302871704},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.22601598501205444},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08850795030593872},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06951847672462463}],"concepts":[{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5939807891845703},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5010256767272949},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43732547760009766},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.41846945881843567},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35129672288894653},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3315216302871704},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.22601598501205444},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08850795030593872},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06951847672462463},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2009.2024709","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2009.2024709","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1508076293","https://openalex.org/W1558262503","https://openalex.org/W1581327216","https://openalex.org/W1595368737","https://openalex.org/W2007068450","https://openalex.org/W2097410912","https://openalex.org/W2104785869","https://openalex.org/W2112662324","https://openalex.org/W2126564504","https://openalex.org/W2132844001","https://openalex.org/W2156306402","https://openalex.org/W2158291854","https://openalex.org/W2162484339","https://openalex.org/W2163262735","https://openalex.org/W2165740397","https://openalex.org/W2314878748","https://openalex.org/W4231005419","https://openalex.org/W4235221304","https://openalex.org/W4237955880","https://openalex.org/W4246743157","https://openalex.org/W6641884055"],"related_works":["https://openalex.org/W303980170","https://openalex.org/W2351491280","https://openalex.org/W2386767533","https://openalex.org/W2274227655","https://openalex.org/W2371447506","https://openalex.org/W2796547653","https://openalex.org/W2996386983","https://openalex.org/W2951109249","https://openalex.org/W3141679561","https://openalex.org/W2621393357"],"abstract_inverted_index":{"In":[0],"the":[1,28,33,40,110],"face":[2],"of":[3,78,87,113],"increased":[4],"process":[5,105,118],"variations,":[6],"at-speed":[7],"manufacturing":[8],"test":[9,64,88],"is":[10,42,107],"necessary":[11],"to":[12,91,126],"detect":[13],"subtle":[14],"delay":[15],"defects.":[16],"This":[17],"procedure":[18],"necessarily":[19],"tests":[20],"chips":[21],"at":[22],"a":[23,97,128],"slightly":[24],"higher":[25],"speed":[26],"than":[27],"target":[29],"frequency":[30],"required":[31,38],"in":[32],"field.":[34],"The":[35],"additional":[36],"performance":[37],"on":[39],"tester":[41],"called":[43],"<i":[44,47,129,132,135],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[45,48,130,133,136],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">test</i>":[46,134],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">margin</i>":[49,137],".":[50],"There":[51],"are":[52],"many":[53],"good":[54],"reasons":[55],"for":[56,72],"margin,":[57],"including":[58],"voltage":[59],"and":[60,70],"temperature":[61],"requirements,":[62],"incomplete":[63],"coverage,":[65],"aging":[66],"effects,":[67,69],"coupling":[68],"accounting":[71],"modeling":[73],"inaccuracies.":[74],"By":[75],"taking":[76],"advantage":[77],"statistical":[79],"timing,":[80],"this":[81,121],"paper":[82],"proposes":[83],"an":[84],"optimal":[85],"method":[86],"margin":[89],"determination":[90],"maximize":[92],"yield":[93],"while":[94],"staying":[95],"within":[96],"prescribed":[98],"shipped":[99],"product":[100],"quality":[101],"loss":[102],"limit.":[103],"If":[104],"information":[106,122],"available":[108],"from":[109],"wafer":[111],"testing":[112],"scribe-line":[114],"structures":[115],"or":[116],"on-chip":[117],"monitoring":[119],"circuitry,":[120],"can":[123,139],"be":[124],"leveraged":[125],"determine":[127],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">per-chip</i>":[131],"which":[138],"further":[140],"improve":[141],"yield.":[142]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}