{"id":"https://openalex.org/W4230359732","doi":"https://doi.org/10.1109/tcad.2007.8361591","title":"High-quality transition fault atpg for small delay defects","display_name":"High-quality transition fault atpg for small delay defects","publication_year":2007,"publication_date":"2007-05-01","ids":{"openalex":"https://openalex.org/W4230359732","doi":"https://doi.org/10.1109/tcad.2007.8361591"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2007.8361591","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2007.8361591","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008118580","display_name":"Mahilchi Milir Vaseekar Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahilchi Milir Vaseekar Kumar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL 62901 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL 62901 USA","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083284025","display_name":"Spyros Tragoudas","orcid":"https://orcid.org/0009-0006-2575-3588"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spyros Tragoudas","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL 62901 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL 62901 USA","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.5035,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.80736725,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"26","issue":"5","first_page":"983","last_page":"989"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tree-traversal","display_name":"Tree traversal","score":0.8361824750900269},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7113417983055115},{"id":"https://openalex.org/keywords/novelty","display_name":"Novelty","score":0.6371331214904785},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5386026501655579},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5372616648674011},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5370650887489319},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5364131927490234},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5323947668075562},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.49693039059638977},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4129975736141205},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32280299067497253},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.21568337082862854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21056905388832092},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.15183278918266296},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11952477693557739},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07206574082374573},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.06910982728004456}],"concepts":[{"id":"https://openalex.org/C140745168","wikidata":"https://www.wikidata.org/wiki/Q1210082","display_name":"Tree traversal","level":2,"score":0.8361824750900269},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7113417983055115},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.6371331214904785},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5386026501655579},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5372616648674011},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5370650887489319},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5364131927490234},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5323947668075562},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.49693039059638977},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4129975736141205},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32280299067497253},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.21568337082862854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21056905388832092},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.15183278918266296},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11952477693557739},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07206574082374573},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.06910982728004456},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2007.8361591","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2007.8361591","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W2021253405","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W1991935474","https://openalex.org/W2786111245"],"abstract_inverted_index":{"A":[0],"new":[1],"framework":[2],"is":[3,29,54],"proposed":[4,41],"to":[5,10,32,36,56],"generate":[6,34,57],"compact":[7],"quality":[8],"tests":[9,38],"detect":[11],"small":[12],"delay":[13],"defects":[14],"by":[15],"activating":[16],"and":[17],"propagating":[18],"transition":[19],"faults":[20],"only":[21],"along":[22],"implicitly":[23,33],"kept":[24],"sensitizable":[25],"critical":[26,71],"paths.":[27,72],"It":[28],"shown":[30],"how":[31],"functions":[35,60],"derive":[37],"for":[39],"the":[40,46,58,68,76,79],"framework.":[42],"The":[43],"novelty":[44],"of":[45,67,70,78],"method":[47],"relies":[48],"on":[49],"a":[50,62],"multivalued":[51],"algebra":[52],"that":[53],"used":[55],"test":[59],"with":[61],"single":[63],"circuit":[64],"traversal,":[65],"independent":[66],"number":[69],"Experimental":[73],"results":[74],"demonstrate":[75],"effectiveness":[77],"method.":[80]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}