{"id":"https://openalex.org/W2053003597","doi":"https://doi.org/10.1109/tcad.1987.1270317","title":"On the C-Testability of Generalized Counters","display_name":"On the C-Testability of Generalized Counters","publication_year":1987,"publication_date":"1987-09-01","ids":{"openalex":"https://openalex.org/W2053003597","doi":"https://doi.org/10.1109/tcad.1987.1270317","mag":"2053003597"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.1987.1270317","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1987.1270317","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.ideals.illinois.edu/items/100541/bitstreams/321105/data.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["Computer system group, Coordinated Science Laboratory, University of Illinois, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Computer system group, Coordinated Science Laboratory, University of Illinois, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.A. Abraham","raw_affiliation_strings":["Computer system group, Coordinated Science Laboratory, University of Illinois, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Computer system group, Coordinated Science Laboratory, University of Illinois, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5069579193"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":2.7622,"has_fulltext":true,"cited_by_count":18,"citation_normalized_percentile":{"value":0.91541187,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":"5","first_page":"713","last_page":"726"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.802497148513794},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7273873090744019},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.6006969809532166},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.5227335095405579},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.516987681388855},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.5020124912261963},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49130386114120483},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4578072726726532},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44344812631607056},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.29710495471954346},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07071036100387573},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.058266669511795044}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.802497148513794},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7273873090744019},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.6006969809532166},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.5227335095405579},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.516987681388855},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.5020124912261963},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49130386114120483},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4578072726726532},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44344812631607056},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.29710495471954346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07071036100387573},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.058266669511795044},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcad.1987.1270317","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1987.1270317","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:www.ideals.illinois.edu:2142/74382","is_oa":true,"landing_page_url":"http://hdl.handle.net/2142/74382","pdf_url":"https://www.ideals.illinois.edu/items/100541/bitstreams/321105/data.pdf","source":{"id":"https://openalex.org/S4306401358","display_name":"Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2801919071","host_organization_name":"University of Illinois System","host_organization_lineage":["https://openalex.org/I2801919071"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:www.ideals.illinois.edu:2142/74382","is_oa":true,"landing_page_url":"http://hdl.handle.net/2142/74382","pdf_url":"https://www.ideals.illinois.edu/items/100541/bitstreams/321105/data.pdf","source":{"id":"https://openalex.org/S4306401358","display_name":"Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2801919071","host_organization_name":"University of Illinois System","host_organization_lineage":["https://openalex.org/I2801919071"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2053003597.pdf","grobid_xml":"https://content.openalex.org/works/W2053003597.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W133385242","https://openalex.org/W1578458555","https://openalex.org/W1970313909","https://openalex.org/W2005960695","https://openalex.org/W2034265748","https://openalex.org/W2047086995","https://openalex.org/W2048531255","https://openalex.org/W2053003597","https://openalex.org/W2056625210","https://openalex.org/W2532227279","https://openalex.org/W2626182530","https://openalex.org/W2751094585","https://openalex.org/W3133279294","https://openalex.org/W4285719527","https://openalex.org/W6739706066","https://openalex.org/W6743855190"],"related_works":["https://openalex.org/W3217463396","https://openalex.org/W2790557758","https://openalex.org/W3196607417","https://openalex.org/W2013839957","https://openalex.org/W2168652618","https://openalex.org/W2122383394","https://openalex.org/W1970410908","https://openalex.org/W2782719366","https://openalex.org/W2515747490","https://openalex.org/W1518382973"],"abstract_inverted_index":{"This":[0],"paper":[1],"investigates":[2],"the":[3,14,40,69,84,137],"testability":[4,93],"of":[5,8,16,18,21,28,46,71,87,94,136],"a":[6],"class":[7,45],"circuits,":[9],"called":[10],"counters,":[11],"that":[12,82,119],"perform":[13],"addition":[15],"sets":[17,81],"input":[19,138],"bits":[20],"equal":[22],"arithmetic":[23],"weight.":[24],"These":[25],"circuits":[26,48,73,89,96,113,121],"consist":[27],"full":[29],"and":[30,52],"half":[31],"adders":[32],"interconnected":[33],"in":[34],"an":[35],"iterative":[36,62,85],"manner":[37],"defined":[38],"by":[39,99],"counting":[41],"process.":[42],"The":[43,92],"general":[44],"counter":[47,72,88,112,120],"contain":[49],"reconvergent":[50],"fanouts":[51],"are":[53,90,114],"not":[54],"as":[55,58],"structurally":[56],"regular":[57],"one-":[59],"or":[60,132],"two-dimensional":[61],"logic":[63],"arrays.":[64],"A":[65],"model":[66],"for":[67,78,108],"analyzing":[68],"structure":[70,86],"is":[74,97,117],"proposed.":[75,115],"Several":[76],"schemes":[77],"generating":[79,109],"test":[80],"exploit":[83],"presented.":[91],"such":[95],"enhanced":[98],"imposing":[100],"certain":[101],"design":[102],"constraints":[103],"on":[104],"them.":[105],"Some":[106],"methods":[107],"easily":[110],"testable":[111,128],"It":[116],"shown":[118],"can":[122],"always":[123],"be":[124,127],"designed":[125],"to":[126],"with":[129],"either":[130],"eight":[131],"ten":[133],"tests,":[134],"irrespective":[135],"size.":[139]},"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}