{"id":"https://openalex.org/W2044407030","doi":"https://doi.org/10.1109/tcad.1987.1270266","title":"On the Repair of Redundant RAM's","display_name":"On the Repair of Redundant RAM's","publication_year":1987,"publication_date":"1987-03-01","ids":{"openalex":"https://openalex.org/W2044407030","doi":"https://doi.org/10.1109/tcad.1987.1270266","mag":"2044407030"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.1987.1270266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1987.1270266","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111539337","display_name":"Chin\u2010Long Wey","orcid":null},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Chin-Long Wey","raw_affiliation_strings":["Department of Electrical Engineering and Systems Science, Michigan State University, East Lansing, MI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Systems Science, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I188538660","display_name":"University of Colorado Boulder","ror":"https://ror.org/02ttsq026","country_code":"US","type":"education","lineage":["https://openalex.org/I188538660"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Lombardi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Colorado, Boulder, CO, USA","Department of Electrical and Computer Engineering, University of Colorado, Boulder, CO. USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Colorado, Boulder, CO, USA","institution_ids":["https://openalex.org/I188538660"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Colorado, Boulder, CO. USA","institution_ids":["https://openalex.org/I188538660"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111539337"],"corresponding_institution_ids":["https://openalex.org/I87216513"],"apc_list":null,"apc_paid":null,"fwci":5.7342,"has_fulltext":false,"cited_by_count":114,"citation_normalized_percentile":{"value":0.9641527,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"6","issue":"2","first_page":"222","last_page":"231"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.96670001745224,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9620000123977661,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.7974859476089478},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7617337703704834},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7118246555328369},{"id":"https://openalex.org/keywords/adaptability","display_name":"Adaptability","score":0.6554079651832581},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5312799215316772},{"id":"https://openalex.org/keywords/row","display_name":"Row","score":0.49977564811706543},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.46906447410583496},{"id":"https://openalex.org/keywords/independence","display_name":"Independence (probability theory)","score":0.4638383984565735},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4578307271003723},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.36207109689712524},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3583361804485321},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15550553798675537},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11537083983421326},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10305297374725342},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.06884881854057312}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.7974859476089478},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7617337703704834},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7118246555328369},{"id":"https://openalex.org/C177606310","wikidata":"https://www.wikidata.org/wiki/Q5674297","display_name":"Adaptability","level":2,"score":0.6554079651832581},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5312799215316772},{"id":"https://openalex.org/C135598885","wikidata":"https://www.wikidata.org/wiki/Q1366302","display_name":"Row","level":2,"score":0.49977564811706543},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.46906447410583496},{"id":"https://openalex.org/C35651441","wikidata":"https://www.wikidata.org/wiki/Q625303","display_name":"Independence (probability theory)","level":2,"score":0.4638383984565735},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4578307271003723},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.36207109689712524},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3583361804485321},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15550553798675537},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11537083983421326},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10305297374725342},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.06884881854057312},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.1987.1270266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1987.1270266","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.4099999964237213,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W92754296","https://openalex.org/W93897505","https://openalex.org/W1974658533","https://openalex.org/W2021792911","https://openalex.org/W2038176281","https://openalex.org/W2038799143","https://openalex.org/W2054055438","https://openalex.org/W2068693260","https://openalex.org/W2104613728","https://openalex.org/W2105453813","https://openalex.org/W2109824347","https://openalex.org/W2295649826","https://openalex.org/W3145695359","https://openalex.org/W3203143386","https://openalex.org/W6603759269"],"related_works":["https://openalex.org/W2357124094","https://openalex.org/W2387399993","https://openalex.org/W2389739210","https://openalex.org/W2376859990","https://openalex.org/W2348924972","https://openalex.org/W2912704652","https://openalex.org/W2344117897","https://openalex.org/W2096502566","https://openalex.org/W2433052208","https://openalex.org/W2126381726"],"abstract_inverted_index":{"This":[0,46],"paper":[1],"describes":[2],"a":[3,13,85,98,109],"set":[4],"of":[5,19,30,36,41,51,56,82,84,104,111,114,139],"novel":[6],"conditions":[7],"that":[8,67,75,91],"can":[9],"be":[10],"integrated":[11],"in":[12,44,48,100,120],"computer-aided-testing":[14],"(CAT)":[15],"package":[16],"for":[17],"repair":[18,77,101],"redundant":[20,122],"RAM's.":[21],"A":[22],"new":[23],"approach":[24,32,96],"is":[25,33,129],"proposed;":[26],"the":[27,34,39,65,112,121,137,140],"innovative":[28],"feature":[29],"this":[31,57,95],"independence":[35],"analysis":[37],"on":[38],"distribution":[40],"faulty":[42],"bits":[43],"memory.":[45],"results":[47,132],"better":[49],"exploitation":[50],"redundancy":[52],"and":[53,71,79,118],"efficient":[54],"adaptability":[55],"technique":[58],"to":[59,135],"various":[60],"testing":[61],"methods,":[62],"such":[63],"as":[64,108],"ones":[66],"employ":[68],"region":[69],"totalizers":[70],"fault":[72],"counters.":[73],"Algorithms":[74],"provide":[76],"solution":[78],"earliest":[80],"detection":[81],"unrepairability":[83,105],"device":[86],"are":[87,106,133],"presented.":[88],"The":[89],"benefits":[90],"result":[92],"by":[93],"using":[94],"include":[97],"reduction":[99],"time.":[102],"Conditions":[103],"given":[107],"function":[110],"number":[113],"spare":[115],"resources":[116],"(columns":[117],"rows)":[119],"memory;":[123],"significant":[124],"improvement":[125],"over":[126],"existing":[127],"techniques":[128],"accomplished.":[130],"Simulation":[131],"provided":[134],"substantiate":[136],"validity":[138],"proposed":[141],"theory.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}