{"id":"https://openalex.org/W2036404449","doi":"https://doi.org/10.1109/tcad.1985.1270153","title":"Monte Carlo Simulation of the Photoelectron Crosstalk in Silicon Imaging Devices","display_name":"Monte Carlo Simulation of the Photoelectron Crosstalk in Silicon Imaging Devices","publication_year":1985,"publication_date":"1985-10-01","ids":{"openalex":"https://openalex.org/W2036404449","doi":"https://doi.org/10.1109/tcad.1985.1270153","mag":"2036404449"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.1985.1270153","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1985.1270153","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111680523","display_name":"James P. Lavine","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.P. Lavine","raw_affiliation_strings":["Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113439125","display_name":"Win-Chyi Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Win-Chyi Chang","raw_affiliation_strings":["Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001227106","display_name":"C. Anagnostopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.N. Anagnostopoulos","raw_affiliation_strings":["Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084700908","display_name":"B.C. Burkey","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.C. Burkey","raw_affiliation_strings":["Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113392044","display_name":"Edward T. Nelson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140030","display_name":"Eastman Chemical Company (United States)","ror":"https://ror.org/053ng1p06","country_code":"US","type":"company","lineage":["https://openalex.org/I4210140030"]},{"id":"https://openalex.org/I4210159451","display_name":"Kodak (United States)","ror":"https://ror.org/04rn3ph18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210159451"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.T. Nelson","raw_affiliation_strings":["Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Laboratories, Eastman Kodak (Japan) Limited, Rochester, NY, USA","institution_ids":["https://openalex.org/I4210140030","https://openalex.org/I4210159451"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.14233282,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"4","issue":"4","first_page":"531","last_page":"535"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.9003521203994751},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.6789051294326782},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4813733398914337},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.4721125364303589},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.4249131977558136},{"id":"https://openalex.org/keywords/solid-state","display_name":"Solid-state","score":0.4211072623729706},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34470751881599426},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3360748291015625},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2973458170890808},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2787763476371765},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.19187361001968384},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.10002738237380981},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08596938848495483},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0531308650970459}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.9003521203994751},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.6789051294326782},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4813733398914337},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4721125364303589},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.4249131977558136},{"id":"https://openalex.org/C107814960","wikidata":"https://www.wikidata.org/wiki/Q611957","display_name":"Solid-state","level":2,"score":0.4211072623729706},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34470751881599426},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3360748291015625},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2973458170890808},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2787763476371765},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.19187361001968384},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.10002738237380981},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08596938848495483},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0531308650970459}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.1985.1270153","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1985.1270153","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1973180058","https://openalex.org/W1988606308","https://openalex.org/W1999959129","https://openalex.org/W2002226413","https://openalex.org/W2005597171","https://openalex.org/W2032347749","https://openalex.org/W2035490861","https://openalex.org/W2044263475","https://openalex.org/W2049425141","https://openalex.org/W2052827816","https://openalex.org/W2060544268","https://openalex.org/W2061543372","https://openalex.org/W2061620672","https://openalex.org/W2068028807","https://openalex.org/W2071850585","https://openalex.org/W2077519583","https://openalex.org/W2117706508","https://openalex.org/W2140395241","https://openalex.org/W2149229729","https://openalex.org/W2158619894","https://openalex.org/W2215474272","https://openalex.org/W3048087219"],"related_works":["https://openalex.org/W2167472940","https://openalex.org/W2622826586","https://openalex.org/W4280525841","https://openalex.org/W2560789951","https://openalex.org/W2492758367","https://openalex.org/W2807571008","https://openalex.org/W1975375876","https://openalex.org/W4388636991","https://openalex.org/W3031634380","https://openalex.org/W1987029007"],"abstract_inverted_index":{"The":[0,16,30],"Monte":[1,31],"Carlo":[2,32],"method":[3,33],"is":[4,34],"used":[5,35],"to":[6],"evaluate":[7],"the":[8,11],"extent":[9],"of":[10],"crosstalk":[12],"in":[13,20,25],"solid-state":[14],"imagers.":[15],"calculations":[17],"are":[18,24],"performed":[19],"three":[21],"dimensions":[22],"and":[23],"excellent":[26],"agreement":[27],"with":[28],"experiment.":[29],"because":[36],"it":[37],"handles":[38],"adjacent":[39],"regions":[40],"that":[41],"either":[42],"collect":[43],"or":[44],"reflect":[45],"minority":[46],"carriers.":[47]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}