{"id":"https://openalex.org/W2077073187","doi":"https://doi.org/10.1109/tcad.1984.1270062","title":"DC Statistical Circuit Analysis for Bipolar IC's Using Parameter Correlations-An Experimental Example","display_name":"DC Statistical Circuit Analysis for Bipolar IC's Using Parameter Correlations-An Experimental Example","publication_year":1984,"publication_date":"1984-01-01","ids":{"openalex":"https://openalex.org/W2077073187","doi":"https://doi.org/10.1109/tcad.1984.1270062","mag":"2077073187"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.1984.1270062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1984.1270062","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056057250","display_name":"D. Divekar","orcid":null},"institutions":[{"id":"https://openalex.org/I1324840837","display_name":"Hewlett-Packard (United States)","ror":"https://ror.org/059rn9488","country_code":"US","type":"company","lineage":["https://openalex.org/I1324840837"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D.A. Divekar","raw_affiliation_strings":["H-P Design Aids, Hewlett Packard Company, Cupertino, CA, USA","Zymos Corporation, Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"H-P Design Aids, Hewlett Packard Company, Cupertino, CA, USA","institution_ids":["https://openalex.org/I1324840837"]},{"raw_affiliation_string":"Zymos Corporation, Sunnyvale, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5056057250"],"corresponding_institution_ids":["https://openalex.org/I1324840837"],"apc_list":null,"apc_paid":null,"fwci":0.5584,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69910693,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"3","issue":"1","first_page":"101","last_page":"103"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.5353702902793884},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.5235464572906494},{"id":"https://openalex.org/keywords/discrete-circuit","display_name":"Discrete circuit","score":0.5102128982543945},{"id":"https://openalex.org/keywords/network-analysis","display_name":"Network analysis","score":0.50462806224823},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.47983166575431824},{"id":"https://openalex.org/keywords/electronic-circuit-simulation","display_name":"Electronic circuit simulation","score":0.4757930040359497},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.4464501738548279},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44171109795570374},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42381545901298523},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.4230636656284332},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2972392141819},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2799278795719147},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26922523975372314},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19788837432861328},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18033409118652344},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16288435459136963}],"concepts":[{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.5353702902793884},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.5235464572906494},{"id":"https://openalex.org/C188058453","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Discrete circuit","level":4,"score":0.5102128982543945},{"id":"https://openalex.org/C32946077","wikidata":"https://www.wikidata.org/wiki/Q618079","display_name":"Network analysis","level":2,"score":0.50462806224823},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.47983166575431824},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.4757930040359497},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.4464501738548279},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44171109795570374},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42381545901298523},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.4230636656284332},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2972392141819},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2799278795719147},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26922523975372314},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19788837432861328},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18033409118652344},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16288435459136963}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.1984.1270062","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.1984.1270062","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2124551145","https://openalex.org/W2793366120"],"related_works":["https://openalex.org/W2366072341","https://openalex.org/W2517340991","https://openalex.org/W2391157593","https://openalex.org/W4248234938","https://openalex.org/W1961251444","https://openalex.org/W2888775009","https://openalex.org/W1970528334","https://openalex.org/W2375888161","https://openalex.org/W3112445088","https://openalex.org/W1972185800"],"abstract_inverted_index":{"Statistical":[0],"analysis":[1],"simulates":[2],"circuit":[3,12,19,29],"performance":[4],"variations":[5,9],"caused":[6],"by":[7],"tolerance":[8],"and":[10,51,55],"other":[11],"production":[13],"factors.":[14],"The":[15,67],"procedure":[16],"of":[17,26,37],"statistical":[18,52],"simulation":[20,47],"is":[21,76],"illustrated":[22],"with":[23,45,56],"the":[24,46,61,65,72],"help":[25],"a":[27,35],"simple":[28],"example.":[30],"Measurements":[31],"are":[32,43],"made":[33],"on":[34],"sample":[36],"this":[38,79],"circuit.":[39,66],"These":[40],"measured":[41],"results":[42,48],"compared":[44],"from":[49,78],"worst-case":[50],"analyses":[53],"without":[54],"model":[57,73],"parameter":[58,74],"correlations":[59,75],"for":[60,69],"devices":[62],"used":[63],"in":[64],"necessity":[68],"properly":[70],"including":[71],"evident":[77],"comparison.":[80]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}