{"id":"https://openalex.org/W4410087565","doi":"https://doi.org/10.1109/tc.2025.3566871","title":"Prophet: SSD Failure Analysis and Prediction Guided by Flash Reliability Characteristics in Data Centers","display_name":"Prophet: SSD Failure Analysis and Prediction Guided by Flash Reliability Characteristics in Data Centers","publication_year":2025,"publication_date":"2025-05-05","ids":{"openalex":"https://openalex.org/W4410087565","doi":"https://doi.org/10.1109/tc.2025.3566871"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2025.3566871","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2025.3566871","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101530474","display_name":"Yunpeng Song","orcid":"https://orcid.org/0009-0006-3822-3551"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yunpeng Song","raw_affiliation_strings":["MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]},{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001238391","display_name":"Yujiong Liang","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujiong Liang","raw_affiliation_strings":["MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]},{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100456638","display_name":"Jialin Liu","orcid":"https://orcid.org/0000-0002-0661-8886"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jialin Liu","raw_affiliation_strings":["MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]},{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073520075","display_name":"Liang Shi","orcid":"https://orcid.org/0000-0002-9977-529X"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Shi","raw_affiliation_strings":["MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application and the School of Computer Science and Technology, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]},{"raw_affiliation_string":"MoE Engineering Research Center of Software/Hardware Co-Design Technology and Application, East China Normal University, Shanghai, China","institution_ids":["https://openalex.org/I66867065"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101530474"],"corresponding_institution_ids":["https://openalex.org/I66867065"],"apc_list":null,"apc_paid":null,"fwci":4.67,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.9461344,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"74","issue":"8","first_page":"2529","last_page":"2541"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9072999954223633,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6820066571235657},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.627308189868927},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6073641180992126},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.5479661226272583},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11205089092254639}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6820066571235657},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.627308189868927},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6073641180992126},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.5479661226272583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11205089092254639},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.2025.3566871","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2025.3566871","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1562848178","https://openalex.org/W1911084152","https://openalex.org/W1967042859","https://openalex.org/W2023917386","https://openalex.org/W2042970394","https://openalex.org/W2088794999","https://openalex.org/W2109628770","https://openalex.org/W2114739461","https://openalex.org/W2126969025","https://openalex.org/W2140612937","https://openalex.org/W2141992894","https://openalex.org/W2147088981","https://openalex.org/W2150780222","https://openalex.org/W2166481425","https://openalex.org/W2169379048","https://openalex.org/W2172047636","https://openalex.org/W2295598076","https://openalex.org/W2296719434","https://openalex.org/W2481347112","https://openalex.org/W2745319966","https://openalex.org/W2752311492","https://openalex.org/W2883087177","https://openalex.org/W2887322623","https://openalex.org/W2984602844","https://openalex.org/W3003346454","https://openalex.org/W3016129047","https://openalex.org/W3095564427","https://openalex.org/W3131082255","https://openalex.org/W3189653494","https://openalex.org/W4292402161","https://openalex.org/W4372263684","https://openalex.org/W4385154364","https://openalex.org/W4394907743","https://openalex.org/W6631825601","https://openalex.org/W6678803342","https://openalex.org/W6695128442","https://openalex.org/W6763729197","https://openalex.org/W6771864707","https://openalex.org/W6773884966","https://openalex.org/W6774033027","https://openalex.org/W6790972629"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"Solid-state":[0],"drives":[1,107],"(SSDs)":[2],"are":[3],"massively":[4],"deployed":[5],"in":[6,10,28,34,57,195,211,217],"various":[7],"fields,":[8],"especially":[9],"data":[11,35,49,110],"centers,":[12],"for":[13,188,314],"their":[14,23],"excellent":[15],"cost-effectiveness.":[16],"However,":[17],"SSDs":[18,75,194],"may":[19],"fail":[20],"due":[21],"to":[22,176,236,251,275],"imperfect":[24],"manufacturing":[25],"processes,":[26],"resulting":[27],"system-level":[29],"failures":[30,128,231],"and":[31,53,76,84,127,146,282,305],"even":[32],"downtime":[33],"centers.":[36],"This":[37],"makes":[38],"SSD":[39,88,124,136,161,214,256],"failure":[40,83,89,102,137,162,242,257],"prediction":[41,90,149,163,258],"critical.":[42],"Current":[43],"studies":[44],"focus":[45],"on":[46,152,157],"dealing":[47],"with":[48,178],"missing,":[50],"numerical":[51],"normalization,":[52],"other":[54],"statistical":[55],"issues":[56],"using":[58],"machine":[59,190],"learning":[60,191],"methods,":[61],"but":[62],"the":[63,66,70,77,101,135,171,179,200,207,213,234,253,262,288,293,315],"consideration":[64],"of":[65,69,74,87,104,148,193,202,209,219,240,255,287,296,317],"reliability":[67,154,225],"characteristics":[68,103,138],"underlying":[71],"flash":[72,153,224],"media":[73],"timeliness":[78,147,254,268],"(time":[79],"duration":[80],"between":[81,123,144,181,229],"predicted":[82],"real":[85,289],"failure)":[86],"result":[91,259],"is":[92,129,166,186,249,298],"missing.":[93],"<p":[94],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[95],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">In":[96],"this":[97],"work,":[98],"we":[99,133,227],"study":[100],"over":[105,112],"200,000":[106],"from":[108,139],"industry":[109],"centers":[111],"a":[113,159,183,245,302],"4-year":[114],"period,":[115],"as":[116,118,280],"well":[117],"daily":[119],"data.":[120],"The":[121,266,284],"relationship":[122],"attribute":[125],"values":[126,210],"first":[130],"investigated.":[131],"Then,":[132],"analyzed":[134],"several":[140],"aspects":[141],"(causes,":[142],"differences":[143,180],"failures,":[145,182],"results)":[150],"relying":[151],"characteristics.":[155],"Based":[156],"these,":[158],"novel":[160],"method":[164,185,248],"(Prophet)":[165],"proposed.":[167],"Specifically,":[168],"Prophet":[169,297],"contains":[170],"following":[172],"two":[173],"components.":[174],"First,":[175],"cope":[177],"diff-state":[184],"proposed":[187,250],"differential":[189],"modeling":[192],"different":[196,230,241],"\u201cStates\u201d.":[197],"We":[198],"define":[199],"\u201cState\u201d":[201],"an":[203],"SSD,":[204],"which":[205,212],"represents":[206],"range":[208],"currently":[215],"lies":[216],"terms":[218],"some":[220],"key":[221],"attributes.":[222],"Through":[223],"characteristics,":[226],"distinguish":[228],"before":[232],"training":[233],"model":[235],"obtain":[237],"accurate":[238],"predictions":[239],"behaviors.":[243],"Second,":[244],"recovery":[246],"period":[247],"enhance":[252],"by":[260,272],"designing":[261],"sample":[263],"selection":[264],"method.":[265],"enhanced":[267],"can":[269],"be":[270],"utilized":[271],"operations":[273],"personnel":[274],"handle":[276],"failed":[277,318],"SSDs,":[278],"such":[279],"replacement":[281],"repair.":[283],"evaluation":[285],"results":[286],"dataset":[290],"show":[291],"that":[292],"predictive":[294],"ability":[295],"improved":[299],"amazingly,":[300],"realizing":[301],"high":[303],"recall":[304],"low":[306],"false-positive":[307],"rates":[308],"while":[309],"providing":[310],"sufficient":[311],"response":[312],"time":[313],"processing":[316],"SSDs.":[319]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}