{"id":"https://openalex.org/W4293198489","doi":"https://doi.org/10.1109/tc.2022.3199994","title":"A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress","display_name":"A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress","publication_year":2022,"publication_date":"2022-08-25","ids":{"openalex":"https://openalex.org/W4293198489","doi":"https://doi.org/10.1109/tc.2022.3199994"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2022.3199994","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tc.2022.3199994","pdf_url":"https://ieeexplore.ieee.org/ielx7/12/4358213/09861726.pdf","source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/12/4358213/09861726.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060364710","display_name":"Francesco Angione","orcid":"https://orcid.org/0000-0003-2978-1130"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Francesco Angione","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":"https://orcid.org/0000-0003-2978-1130","affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024226992","display_name":"D. Appello","orcid":"https://orcid.org/0000-0001-8178-2785"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Davide Appello","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Bernardi","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":"https://orcid.org/0000-0002-0985-9327","affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009501718","display_name":"Claudia Bertani","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Claudia Bertani","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111801108","display_name":"Giovambattista Gallo","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giovambattista Gallo","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030928390","display_name":"Stefano Littardi","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Littardi","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074023126","display_name":"Giorgio Pollaccia","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giorgio Pollaccia","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012937642","display_name":"Walter Ruggeri","orcid":"https://orcid.org/0000-0002-6788-4782"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Walter Ruggeri","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":"https://orcid.org/0000-0002-6788-4782","affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"raw_orcid":"https://orcid.org/0000-0003-2899-7669","affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043908290","display_name":"Vincenzo Tancorre","orcid":"https://orcid.org/0000-0001-7959-0784"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Vincenzo Tancorre","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy"],"raw_orcid":"https://orcid.org/0000-0001-7959-0784","affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091628822","display_name":"R. Ugioli","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Ugioli","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5060364710"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.6466,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.66662099,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"72","issue":"5","first_page":"1447","last_page":"1459"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7854076027870178},{"id":"https://openalex.org/keywords/firmware","display_name":"Firmware","score":0.7545287609100342},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6056373119354248},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5758323669433594},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4944648742675781},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4721241891384125}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7854076027870178},{"id":"https://openalex.org/C67212190","wikidata":"https://www.wikidata.org/wiki/Q104851","display_name":"Firmware","level":2,"score":0.7545287609100342},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6056373119354248},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5758323669433594},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4944648742675781},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4721241891384125},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.2022.3199994","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tc.2022.3199994","pdf_url":"https://ieeexplore.ieee.org/ielx7/12/4358213/09861726.pdf","source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tc.2022.3199994","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tc.2022.3199994","pdf_url":"https://ieeexplore.ieee.org/ielx7/12/4358213/09861726.pdf","source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4293198489.pdf","grobid_xml":"https://content.openalex.org/works/W4293198489.grobid-xml"},"referenced_works_count":42,"referenced_works":["https://openalex.org/W1496925300","https://openalex.org/W1996996894","https://openalex.org/W2019483755","https://openalex.org/W2096148246","https://openalex.org/W2097278944","https://openalex.org/W2101177145","https://openalex.org/W2101900253","https://openalex.org/W2103050772","https://openalex.org/W2107974086","https://openalex.org/W2108852347","https://openalex.org/W2109581582","https://openalex.org/W2109748960","https://openalex.org/W2113139456","https://openalex.org/W2127913861","https://openalex.org/W2129282906","https://openalex.org/W2134869803","https://openalex.org/W2134998505","https://openalex.org/W2135509339","https://openalex.org/W2135627440","https://openalex.org/W2137656581","https://openalex.org/W2148015755","https://openalex.org/W2153485205","https://openalex.org/W2153662495","https://openalex.org/W2163620213","https://openalex.org/W2220693505","https://openalex.org/W2542038790","https://openalex.org/W2543563735","https://openalex.org/W2549346635","https://openalex.org/W2613613142","https://openalex.org/W2789864115","https://openalex.org/W2790410977","https://openalex.org/W2806909220","https://openalex.org/W2947039574","https://openalex.org/W2955745197","https://openalex.org/W3007848906","https://openalex.org/W3114094139","https://openalex.org/W3116594239","https://openalex.org/W3124406777","https://openalex.org/W3160934116","https://openalex.org/W3188239650","https://openalex.org/W4210789659","https://openalex.org/W4232310948"],"related_works":["https://openalex.org/W142369612","https://openalex.org/W2373685464","https://openalex.org/W2380194417","https://openalex.org/W2392099550","https://openalex.org/W3022475936","https://openalex.org/W2155774171","https://openalex.org/W2064427534","https://openalex.org/W129473303","https://openalex.org/W3023147568","https://openalex.org/W3094920005"],"abstract_inverted_index":{"Burn-In":[0,75],"test":[1],"equipment":[2,85],"usually":[3],"owns":[4],"extensive":[5],"memory":[6,44],"capabilities":[7],"to":[8,12,15,24,92,135,166,194,207,234,248],"store":[9],"pre-computed":[10,224],"patterns":[11,120],"be":[13,78],"applied":[14],"the":[16,28,32,43,73,96,104,115,124,192,217,241],"circuit":[17],"inputs":[18],"as":[19,21],"well":[20],"ad-hoc":[22],"circuitries":[23],"drive":[25],"and":[26,47,67,148,156,181,198],"read":[27],"DUT":[29,116],"pins":[30],"during":[31],"BI":[33],"phase.":[34],"The":[35,131,161,185,227,236],"solution":[36],"proposed":[37,74],"in":[38],"this":[39],"paper":[40,99],"dramatically":[41],"reduces":[42],"size":[45],"requirement":[46],"just":[48],"demands":[49],"a":[50,57,68,81,108,140,145,149,209,220],"generic":[51],"microcontroller":[52],"unit":[53],"(MCU)":[54],"equipped":[55],"with":[56,95,117,191,243],"couple":[58],"of":[59,106,151,187,212,219,223],"embedded":[60],"processors,":[61],"some":[62],"standard":[63],"common":[64],"peripheral":[65,152],"units,":[66],"few":[69],"KB":[70],"memories.":[71],"Moreover,":[72],"tester":[76,132,162,242],"could":[77],"integrated":[79],"into":[80],"System":[82],"Level":[83],"Test":[84],"which":[86,112],"is":[87,164,232,246],"typically":[88],"based":[89,143],"on":[90,144],"MCUs":[91],"communicate":[93],"functionally":[94],"DUT.":[97],"This":[98],"provides":[100],"full":[101],"details":[102],"about":[103,173,249],"architecture":[105],"such":[107],"low-cost":[109,141],"innovative":[110],"tester,":[111],"can":[113],"supply":[114],"unlimited":[118],"pseudo-random":[119,188],"created":[121],"autonomously":[122],"by":[123,216,240],"MCU":[125,147],"firmware":[126],"from":[127],"any":[128],"selected":[129],"seed.":[130],"prototype":[133,163],"developed":[134],"collect":[136],"experimental":[137],"results":[138],"includes":[139],"System-on-Chip":[142],"multi-core":[146],"set":[150,222],"cores,":[153],"encompassing":[154],"timers":[155],"Direct":[157],"Memory":[158],"Access":[159],"modules.":[160],"used":[165],"stress":[167,213],"an":[168],"automotive":[169],"chip":[170],"accounting":[171],"for":[172,200],"20":[174],"million":[175],"gates,":[176],"700":[177],"thousand":[178],"scan":[179,183,197],"flip-flops,":[180],"several":[182],"modes.":[184],"combination":[186],"pattern":[189],"generation":[190],"ability":[193],"control":[195],"different":[196],"Design":[199],"Testability":[201],"(DfT)":[202],"modes,":[203],"including":[204],"LBIST,":[205],"permits":[206],"reach":[208],"higher":[210],"coverage":[211,229],"metrics":[214],"than":[215],"application":[218,237],"limited":[221],"ATPG":[225],"patterns.":[226],"toggle":[228],"level":[230],"reached":[231],"up":[233,247],"95.89%.":[235],"speed":[238],"achieved":[239],"non-optimized":[244],"connections":[245],"10MHz.":[250]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2023,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}