{"id":"https://openalex.org/W3214360577","doi":"https://doi.org/10.1109/tc.2021.3128501","title":"Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements","display_name":"Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements","publication_year":2021,"publication_date":"2021-11-16","ids":{"openalex":"https://openalex.org/W3214360577","doi":"https://doi.org/10.1109/tc.2021.3128501","mag":"3214360577"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2021.3128501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2021.3128501","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/6408552","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048992301","display_name":"Pablo R. Bodmann","orcid":"https://orcid.org/0000-0002-0950-0023"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Pablo R. Bodmann","raw_affiliation_strings":["PPGC, Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brasil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"PPGC, Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brasil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036767968","display_name":"George N. Papadimitriou","orcid":"https://orcid.org/0000-0002-3772-5019"},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"George Papadimitriou","raw_affiliation_strings":["University of Athens, Athens, Greece"],"raw_orcid":"https://orcid.org/0000-0002-3772-5019","affiliations":[{"raw_affiliation_string":"University of Athens, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078833355","display_name":"Rubens Luiz Rech","orcid":"https://orcid.org/0000-0002-3007-2297"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Rubens L. Rech Junior","raw_affiliation_strings":["PPGC, Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brasil"],"raw_orcid":"https://orcid.org/0000-0002-3007-2297","affiliations":[{"raw_affiliation_string":"PPGC, Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brasil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007119083","display_name":"Dimitris Gizopoulos","orcid":"https://orcid.org/0000-0002-1613-9061"},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Dimitris Gizopoulos","raw_affiliation_strings":["University of Athens, Athens, Greece"],"raw_orcid":"https://orcid.org/0000-0002-1613-9061","affiliations":[{"raw_affiliation_string":"University of Athens, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054264208","display_name":"Paolo Rech","orcid":"https://orcid.org/0000-0002-0821-1879"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Rech","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino, Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0002-0821-1879","affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.9743,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.91994831,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"71","issue":"10","first_page":"2358","last_page":"2369"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6979367136955261},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5833320021629333},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.500690221786499},{"id":"https://openalex.org/keywords/central-processing-unit","display_name":"Central processing unit","score":0.5001497268676758},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48648449778556824},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.45299622416496277},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4430271089076996},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.43339332938194275},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4267064929008484},{"id":"https://openalex.org/keywords/arm-architecture","display_name":"ARM architecture","score":0.42544716596603394},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4236920475959778},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.35557296872138977},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.31353265047073364},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18434715270996094},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.10842940211296082},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10144785046577454},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09403812885284424}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6979367136955261},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5833320021629333},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.500690221786499},{"id":"https://openalex.org/C49154492","wikidata":"https://www.wikidata.org/wiki/Q5300","display_name":"Central processing unit","level":2,"score":0.5001497268676758},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48648449778556824},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.45299622416496277},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4430271089076996},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.43339332938194275},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4267064929008484},{"id":"https://openalex.org/C26771161","wikidata":"https://www.wikidata.org/wiki/Q16980","display_name":"ARM architecture","level":2,"score":0.42544716596603394},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4236920475959778},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35557296872138977},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.31353265047073364},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18434715270996094},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.10842940211296082},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10144785046577454},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09403812885284424},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tc.2021.3128501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2021.3128501","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},{"id":"pmh:oai:zenodo.org:6408552","is_oa":true,"landing_page_url":"https://zenodo.org/record/6408552","pdf_url":"https://zenodo.org/record/6408552","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:iris.unitn.it:11572/346717","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9616430","pdf_url":null,"source":{"id":"https://openalex.org/S4377196320","display_name":"Iris (University of Trento)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I193223587","host_organization_name":"University of Trento","host_organization_lineage":["https://openalex.org/I193223587"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:purl.org/net/epubs:work/50910758","is_oa":false,"landing_page_url":"http://purl.org/net/epubs/work/50910758","pdf_url":null,"source":{"id":"https://openalex.org/S4306400600","display_name":"ePubs (Science and Technology Facilities Council, Research Councils UK)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162524378","host_organization_name":"Science and Technology Facilities Council","host_organization_lineage":["https://openalex.org/I162524378"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:6408552","is_oa":true,"landing_page_url":"https://zenodo.org/record/6408552","pdf_url":"https://zenodo.org/record/6408552","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.8199999928474426}],"awards":[{"id":"https://openalex.org/G1420173466","display_name":"Pursuing Efficient Reliability of Object Detection for automotive and aerospace applications","funder_award_id":"886202","funder_id":"https://openalex.org/F4320338337","funder_display_name":"H2020 Marie Sk\u0142odowska-Curie Actions"},{"id":"https://openalex.org/G4405270383","display_name":null,"funder_award_id":"611404","funder_id":"https://openalex.org/F4320338335","funder_display_name":"H2020 European Research Council"}],"funders":[{"id":"https://openalex.org/F4320321091","display_name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior","ror":"https://ror.org/00x0ma614"},{"id":"https://openalex.org/F4320338335","display_name":"H2020 European Research Council","ror":"https://ror.org/0472cxd90"},{"id":"https://openalex.org/F4320338337","display_name":"H2020 Marie Sk\u0142odowska-Curie Actions","ror":null}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W3214360577.pdf"},"referenced_works_count":42,"referenced_works":["https://openalex.org/W944143979","https://openalex.org/W1921113851","https://openalex.org/W1978082708","https://openalex.org/W1986905947","https://openalex.org/W1999900893","https://openalex.org/W2007565138","https://openalex.org/W2062980181","https://openalex.org/W2063884320","https://openalex.org/W2099569658","https://openalex.org/W2100597484","https://openalex.org/W2120876718","https://openalex.org/W2147657366","https://openalex.org/W2148644350","https://openalex.org/W2155603569","https://openalex.org/W2173097224","https://openalex.org/W2201265203","https://openalex.org/W2292469857","https://openalex.org/W2313420215","https://openalex.org/W2322585385","https://openalex.org/W2413549506","https://openalex.org/W2415689457","https://openalex.org/W2545452358","https://openalex.org/W2592188707","https://openalex.org/W2605277893","https://openalex.org/W2615815445","https://openalex.org/W2752470767","https://openalex.org/W2766281607","https://openalex.org/W2767321582","https://openalex.org/W2791305177","https://openalex.org/W2806983213","https://openalex.org/W2884175902","https://openalex.org/W2901848761","https://openalex.org/W2903187878","https://openalex.org/W2969553121","https://openalex.org/W3149134903","https://openalex.org/W3215500439","https://openalex.org/W4232751114","https://openalex.org/W4236268500","https://openalex.org/W4244652158","https://openalex.org/W4249144718","https://openalex.org/W6643510916","https://openalex.org/W6756902520"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2969553121","https://openalex.org/W2593605297","https://openalex.org/W2782341877","https://openalex.org/W3196277062","https://openalex.org/W2485576852","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Extensive":[0],"research":[1],"efforts":[2],"are":[3],"being":[4],"carried":[5],"out":[6],"to":[7,30,52,106,223],"evaluate":[8,155],"and":[9,45,62,96,119,131,145,154,160,191,236,249],"improve":[10],"the":[11,54,75,81,85,97,101,111,177,188,192,195,198,213,224,253],"reliability":[12,71,157,228],"of":[13,77,87,90,110,173,179,194],"computing":[14],"devices":[15],"either":[16],"through":[17],"beam":[18,47,125],"experiments":[19,48,126],"or":[20],"simulation-based":[21],"fault":[22,33,133,242],"injection.":[23],"Unfortunately,":[24],"it":[25],"is":[26,220],"still":[27],"largely":[28],"unclear":[29],"which":[31,219],"extend":[32],"injection":[34,243],"can":[35,49],"provide":[36],"an":[37,93,146,152],"accurate":[38,245],"error":[39],"rate":[40,204,218],"estimation":[41],"at":[42],"early":[43],"stages":[44],"if":[46],"be":[50],"used":[51],"identify":[53],"weakest":[55],"resources":[56],"in":[57,79,92,158],"a":[58,66,140],"device.":[59],"The":[60],"importance":[61],"challenges":[63],"associated":[64],"with":[65,74,84,100,123,176],"timely,":[67],"but":[68,208],"yet":[69],"realistic":[70],"evaluation":[72],"grow":[73],"increase":[76,197],"complexity":[78],"both":[80,187],"hardware":[82],"domain,":[83,99],"integration":[86,190,235],"different":[88,206],"types":[89],"cores":[91],"SoC":[94,153,189,234],"(System-on-Chip),":[95],"software":[98],"OS":[102,196,237],"(operating":[103],"system)":[104],"required":[105],"take":[107],"full":[108],"advantage":[109],"available":[112],"resources.":[113],"In":[114],"this":[115],"paper,":[116],"we":[117,184],"combine":[118],"analyze":[120],"data":[121,165],"gathered":[122],"extensive":[124],"(on":[127],"thefinalphysical":[128],"CPU":[129,136,144,149,225],"hardware)":[130],"microarchitectural":[132],"injections":[134,183],"(onearlymicroarchitectural":[135],"models).":[137],"We":[138],"target":[139],"standalone":[141],"Arm":[142,147],"Cortex-A5":[143],"Cortex-A9":[148],"integrated":[150],"into":[151],"their":[156],"bare-metal":[159],"Linux-based":[161],"configurations.":[162],"Combining":[163],"experimental":[164],"that":[166,186,231],"covers":[167],"more":[168,180],"than":[169,181],"18":[170],"million":[171],"years":[172],"device":[174],"time":[175],"result":[178],"176,000":[182],"find":[185],"presence":[193],"system":[199],"DUEs":[200],"(Detected":[201],"Unrecoverable":[202],"Errors)":[203],"(for":[205],"reasons)":[207],"do":[209],"not":[210],"significantly":[211],"impact":[212],"SDCs":[214],"(Silent":[215],"Data":[216],"Corruptions)":[217],"solely":[221],"attributed":[222],"core.":[226],"Our":[227],"analysis":[229],"demonstrates":[230],"even":[232],"considering":[233],"inclusion,":[238],"early,":[239],"pre-silicon":[240],"microarchitecture-level":[241],"delivers":[244],"SDC":[246],"rates":[247],"estimations":[248],"lower":[250],"bounds":[251],"for":[252],"DUE":[254],"rates.":[255]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":22},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":2}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}