{"id":"https://openalex.org/W4233424493","doi":"https://doi.org/10.1109/tc.2021.3125228","title":"Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs","display_name":"Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W4233424493","doi":"https://doi.org/10.1109/tc.2021.3125228"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2021.3125228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2021.3125228","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009217361","display_name":"Lizhou Wu","orcid":"https://orcid.org/0000-0003-4439-7436"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Lizhou Wu","raw_affiliation_strings":["Quantum & Computer Engineering, Delft University of Technology, 2860 Delft, South Holland, Netherlands, 2628CD (e-mail: njuwulizhou@163.com)","PhD at Delft University of Technology, the Netherlands","Delft University of Technology, Delft, the Netherlands","are with IMEC, Leuven, Belgium","School of Computer, NUDT, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Quantum & Computer Engineering, Delft University of Technology, 2860 Delft, South Holland, Netherlands, 2628CD (e-mail: njuwulizhou@163.com)","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"PhD at Delft University of Technology, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"are with IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"School of Computer, NUDT, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002378343","display_name":"Siddharth Rao","orcid":"https://orcid.org/0000-0001-6161-3052"},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Siddharth Rao","raw_affiliation_strings":["Emerging memory technologies, IMEC, 71351 Delft, Vlaams-Brabant, Belgium, (e-mail: Siddharth.Rao@imec.be)","Delft University of Technology, Delft, the Netherlands","PhD at Delft University of Technology, the Netherlands","School of Computer, NUDT, China","are with IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Emerging memory technologies, IMEC, 71351 Delft, Vlaams-Brabant, Belgium, (e-mail: Siddharth.Rao@imec.be)","institution_ids":["https://openalex.org/I196972281"]},{"raw_affiliation_string":"Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"PhD at Delft University of Technology, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"School of Computer, NUDT, China","institution_ids":[]},{"raw_affiliation_string":"are with IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042250419","display_name":"Mottaqiallah Taouil","orcid":"https://orcid.org/0000-0002-9911-4846"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Mottaqiallah Taouil","raw_affiliation_strings":["Computer Engineering, Tu Delft, Delft, Zuid-holland, Netherlands, 2628 CD (e-mail: M.Taouil@tudelft.nl)","are with IMEC, Leuven, Belgium","PhD at Delft University of Technology, the Netherlands","School of Computer, NUDT, China","Delft University of Technology, Delft, the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering, Tu Delft, Delft, Zuid-holland, Netherlands, 2628 CD (e-mail: M.Taouil@tudelft.nl)","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"are with IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"PhD at Delft University of Technology, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"School of Computer, NUDT, China","institution_ids":[]},{"raw_affiliation_string":"Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044629739","display_name":"Erik Jan Marinissen","orcid":"https://orcid.org/0000-0002-5058-8303"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Erik Jan Marinissen","raw_affiliation_strings":["IMEC, IMEC, Leuven, Vlaams-Brabant, Belgium, 3001 (e-mail: erik.jan.marinissen@imec.be)","are with IMEC, Leuven, Belgium","PhD at Delft University of Technology, the Netherlands","Delft University of Technology, Delft, the Netherlands","School of Computer, NUDT, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC, IMEC, Leuven, Vlaams-Brabant, Belgium, 3001 (e-mail: erik.jan.marinissen@imec.be)","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"are with IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"PhD at Delft University of Technology, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"School of Computer, NUDT, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080181961","display_name":"Gouri Sankar Kar","orcid":"https://orcid.org/0000-0003-3122-4237"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Gouri Sankar Kar","raw_affiliation_strings":["Emering Memory Technologies, IMEC, 71351 Delft, Vlaams-Brabant, Belgium, (e-mail: Gouri.Kar@imec.be)","School of Computer, NUDT, China","Delft University of Technology, Delft, the Netherlands","are with IMEC, Leuven, Belgium","PhD at Delft University of Technology, the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Emering Memory Technologies, IMEC, 71351 Delft, Vlaams-Brabant, Belgium, (e-mail: Gouri.Kar@imec.be)","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"School of Computer, NUDT, China","institution_ids":[]},{"raw_affiliation_string":"Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"are with IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"PhD at Delft University of Technology, the Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technology, Delft, Zuid Holland, Netherlands, 2628CD (e-mail: s.hamdioui@tudelft.nl)","are with IMEC, Leuven, Belgium","Delft University of Technology, Delft, the Netherlands","PhD at Delft University of Technology, the Netherlands","School of Computer, NUDT, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technology, Delft, Zuid Holland, Netherlands, 2628CD (e-mail: s.hamdioui@tudelft.nl)","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"are with IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"PhD at Delft University of Technology, the Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"School of Computer, NUDT, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5621,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.63231461,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5702179670333862},{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.5625705718994141},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5392708778381348},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5080108642578125},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49568045139312744},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.45755019783973694},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.45322734117507935},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4522162675857544},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4476878345012665},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.43777772784233093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4168555438518524},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4160520136356354},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38416188955307007},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3714919686317444},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.22751343250274658},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17350512742996216},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.17213350534439087},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16668376326560974},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14425230026245117},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.09497484564781189}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5702179670333862},{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.5625705718994141},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5392708778381348},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5080108642578125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49568045139312744},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.45755019783973694},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.45322734117507935},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4522162675857544},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4476878345012665},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.43777772784233093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4168555438518524},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4160520136356354},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38416188955307007},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3714919686317444},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.22751343250274658},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17350512742996216},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.17213350534439087},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16668376326560974},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14425230026245117},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.09497484564781189},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tc.2021.3125228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2021.3125228","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},{"id":"pmh:oai:tudelft.nl:uuid:3f2c392d-6d2e-4749-b1ba-8f4213af0ee3","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:3f2c392d-6d2e-4749-b1ba-8f4213af0ee3","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1983562124","https://openalex.org/W1995605289","https://openalex.org/W2013984675","https://openalex.org/W2014178805","https://openalex.org/W2044272827","https://openalex.org/W2061761071","https://openalex.org/W2123863700","https://openalex.org/W2157908889","https://openalex.org/W2165911664","https://openalex.org/W2292629091","https://openalex.org/W2326134708","https://openalex.org/W2328430807","https://openalex.org/W2464187654","https://openalex.org/W2465019737","https://openalex.org/W2540344385","https://openalex.org/W2568019164","https://openalex.org/W2790747874","https://openalex.org/W2793776854","https://openalex.org/W2912745226","https://openalex.org/W2913178838","https://openalex.org/W2913402275","https://openalex.org/W2914110167","https://openalex.org/W2922523256","https://openalex.org/W2955456144","https://openalex.org/W2967501850","https://openalex.org/W2996741906","https://openalex.org/W3000617315","https://openalex.org/W3003850204","https://openalex.org/W3005785620","https://openalex.org/W3005886446","https://openalex.org/W3006330715","https://openalex.org/W3006384944","https://openalex.org/W3006655620","https://openalex.org/W3007474556","https://openalex.org/W3033017298","https://openalex.org/W3033062045","https://openalex.org/W3036606009","https://openalex.org/W3039722321","https://openalex.org/W3097826648","https://openalex.org/W3109020741","https://openalex.org/W3121377334","https://openalex.org/W4235904384","https://openalex.org/W6772827998"],"related_works":["https://openalex.org/W2160372845","https://openalex.org/W1977755618","https://openalex.org/W1545438037","https://openalex.org/W1890124164","https://openalex.org/W4226197542","https://openalex.org/W2798982538","https://openalex.org/W2897770615","https://openalex.org/W4214681414","https://openalex.org/W2131964951","https://openalex.org/W2032117939"],"abstract_inverted_index":{"Understanding":[0],"defects":[1,31],"in":[2,32,165],"magnetic":[3],"tunnel":[4],"junctions":[5],"(MTJs)":[6],"and":[7,39,96,107,114,130,139,162,188],"their":[8],"faulty":[9],"behaviors":[10],"are":[11],"paramount":[12],"for":[13,18,150],"developing":[14],"high-quality":[15],"test":[16,26,108,115,121,192],"solutions":[17],"STT-MRAM.":[19],"This":[20],"article":[21],"applies":[22],"the":[23,56,78,82,91,102,128,196],"advanced":[24],"device-aware":[25,120,191],"to":[27,75,111,159,180,194],"intermediate":[28],"(IM)":[29],"state":[30,44,87,177,198],"MTJ":[33,67,136],"devices":[34,68],"based":[35,155],"on":[36,66,90,156],"silicon":[37,64,143],"measurements":[38,65],"circuit":[40,157],"simulations.":[41],"An":[42],"IM":[43,86,176,197],"manifests":[45],"itself":[46],"as":[47],"an":[48,175],"abnormal":[49],"third":[50],"resistive":[51],"state,":[52],"which":[53],"differs":[54],"from":[55,72],"two":[57],"bi-stable":[58],"states":[59],"of":[60,85],"MTJ.":[61],"We":[62,99,124],"performed":[63],"with":[69,142],"diameter":[70],"ranging":[71],"60":[73],"nm":[74],"120":[76],"nm;":[77],"results":[79,172],"show":[80,173],"that":[81,101,174],"occurrence":[83],"probability":[84],"strongly":[88],"depends":[89],"switching":[92],"direction,":[93],"device":[94],"size,":[95],"bias":[97],"voltage.":[98],"demonstrate":[100],"conventional":[103],"resistor-based":[104],"fault":[105,153,168],"modeling":[106],"approach":[109],"fails":[110],"appropriately":[112],"model":[113,127,138,147],"such":[116],"a":[117,134,151,166,190],"defect.":[118,199],"Therefore,":[119],"is":[122,148],"applied.":[123],"first":[125],"physically":[126],"defect":[129,178],"incorporate":[131],"it":[132,141],"into":[133],"Verilog-A":[135],"compact":[137],"calibrate":[140],"data.":[144],"Thereafter,":[145],"this":[146],"used":[149],"systematic":[152],"analysis":[154],"simulations":[158],"obtain":[160],"accurate":[161],"realistic":[163],"faults":[164],"pre-defined":[167],"space.":[169],"Our":[170],"simulation":[171],"leads":[179],"intermittent":[181],"write":[182],"transition":[183],"faults.":[184],"Finally,":[185],"we":[186],"propose":[187],"implement":[189],"solution":[193],"detect":[195]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}