{"id":"https://openalex.org/W2345221967","doi":"https://doi.org/10.1109/tc.2015.2490058","title":"Low-Cost and High-Reduction Approaches for Power Droop During Launch-On-Shift Scan-Based Logic BIST","display_name":"Low-Cost and High-Reduction Approaches for Power Droop During Launch-On-Shift Scan-Based Logic BIST","publication_year":2015,"publication_date":"2015-01-01","ids":{"openalex":"https://openalex.org/W2345221967","doi":"https://doi.org/10.1109/tc.2015.2490058","mag":"2345221967"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2015.2490058","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2015.2490058","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11568/1025936","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019220326","display_name":"M. Oma\u00f1a","orcid":"https://orcid.org/0000-0001-8976-5365"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Martin Omana","raw_affiliation_strings":["DEI, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076546330","display_name":"Daniele Rossi","orcid":"https://orcid.org/0000-0002-9487-378X"},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Daniele Rossi","raw_affiliation_strings":["ECS, University of Southampton, Southampton, United Kingdom"],"affiliations":[{"raw_affiliation_string":"ECS, University of Southampton, Southampton, United Kingdom","institution_ids":["https://openalex.org/I43439940"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060856924","display_name":"Edda Beniamino","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Edda Beniamino","raw_affiliation_strings":["DEI, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010725489","display_name":"Cecilia Metra","orcid":"https://orcid.org/0000-0002-1408-5725"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Cecilia Metra","raw_affiliation_strings":["DEI, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"DEI, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111987206","display_name":"Chandra Tirumurti","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandra Tirumurti","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049951159","display_name":"Rajesh Galivanche","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajesh Galivanche","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5019220326"],"corresponding_institution_ids":["https://openalex.org/I9360294"],"apc_list":null,"apc_paid":null,"fwci":0.9955,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.78458584,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.7235599756240845},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.7095514535903931},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6896347403526306},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.622171938419342},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6039959192276001},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5977686047554016},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5319554805755615},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5279430747032166},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.513613224029541},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5132893919944763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5084749460220337},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.47160300612449646},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4594290256500244},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4165896475315094},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.38049501180648804},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.37733450531959534},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.263389527797699},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2507149577140808},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23584958910942078},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1582125723361969}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.7235599756240845},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.7095514535903931},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6896347403526306},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.622171938419342},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6039959192276001},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5977686047554016},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5319554805755615},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5279430747032166},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.513613224029541},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5132893919944763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5084749460220337},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.47160300612449646},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4594290256500244},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4165896475315094},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.38049501180648804},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.37733450531959534},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.263389527797699},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2507149577140808},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23584958910942078},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1582125723361969},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.1109/tc.2015.2490058","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2015.2490058","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},{"id":"pmh:oai:eprints.soton.ac.uk:393473","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:westminsterresearch.westminster.ac.uk:q0w71","is_oa":false,"landing_page_url":"https://doi.org/10.1109/TC.2015.2490058","pdf_url":null,"source":{"id":"https://openalex.org/S4306400277","display_name":"WestminsterResearch (University of Westminster)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I94951947","host_organization_name":"University of Westminster","host_organization_lineage":["https://openalex.org/I94951947"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"journal-article"},{"id":"pmh:oai:arpi.unipi.it:11568/1025936","is_oa":true,"landing_page_url":"http://hdl.handle.net/11568/1025936","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:cris.unibo.it:11585/559475","is_oa":false,"landing_page_url":"http://hdl.handle.net/11585/559475","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:uhra.herts.ac.uk:2299/19545","is_oa":false,"landing_page_url":"http://hdl.handle.net/2299/19545","pdf_url":null,"source":{"id":"https://openalex.org/S4306400241","display_name":"University of Hertfordshire Research Archive (University of Hertfordshire)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I141584323","host_organization_name":"University of Hertfordshire","host_organization_lineage":["https://openalex.org/I141584323"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:arpi.unipi.it:11568/1025936","is_oa":true,"landing_page_url":"http://hdl.handle.net/11568/1025936","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.5,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1867538663","https://openalex.org/W1900996732","https://openalex.org/W1905213452","https://openalex.org/W1994136514","https://openalex.org/W1996111092","https://openalex.org/W2025698297","https://openalex.org/W2034294653","https://openalex.org/W2039868523","https://openalex.org/W2090728180","https://openalex.org/W2102355929","https://openalex.org/W2108471909","https://openalex.org/W2111755940","https://openalex.org/W2119521940","https://openalex.org/W2139356796","https://openalex.org/W2141568925","https://openalex.org/W2141866079","https://openalex.org/W2153171864","https://openalex.org/W2163950950","https://openalex.org/W2168376225","https://openalex.org/W2497555727","https://openalex.org/W3140239545","https://openalex.org/W6639759450"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2075356617","https://openalex.org/W2143881398","https://openalex.org/W2074302528","https://openalex.org/W2154529098","https://openalex.org/W2105463797","https://openalex.org/W4233954302"],"abstract_inverted_index":{"During":[0],"at-speed":[1,104],"test":[2,21,54,78,105,218,253,292,329,342,376,386],"of":[3,106,125,139,150,188,201,217,274,285,290,307,328,385],"high":[4],"performance":[5],"sequential":[6,107],"ICs":[7],"using":[8,113],"scan-based":[9,110,133,166,223,369],"Logic":[10,111],"BIST,":[11],"the":[12,19,51,98,114,120,126,137,140,148,151,156,184,215,221,227,245,308,322,326,346,358],"IC":[13],"activity":[14],"factor":[15],"(AF)":[16],"induced":[17],"by":[18],"applied":[20],"vectors":[22,219,293],"is":[23,62,145,160],"significantly":[24,318,340,374],"higher":[25],"than":[26,367],"that":[27],"experienced":[28],"during":[29,41,103,190,325],"its":[30],"in":[31,86,183,199,244,283,321,357],"field":[32],"operation.":[33],"Consequently,":[34,147],"power":[35],"droop":[36],"(PD)":[37],"may":[38,80],"take":[39],"place":[40],"both":[42],"shift":[43],"and":[44,210,255,288,388],"capture":[45,102,144,273,362],"phases,":[46],"which":[47],"will":[48],"slow":[49],"down":[50],"circuit":[52],"under":[53],"(CUT)":[55],"signal":[56],"transitions.":[57],"At":[58],"capture,":[59,154,159,249],"this":[60,90],"phenomenon":[61],"likely":[63],"to":[64,70,96,131,164,173,225,234,263,276,305,345],"be":[65,81],"erroneously":[66],"recognized":[67],"as":[68,174,264],"due":[69],"delay":[71],"faults.":[72],"As":[73],"a":[74,76,179,196,241,295,317,334,339,354,373],"result,":[75],"false":[77],"fail":[79],"generated,":[82],"with":[83,109,129,279],"consequent":[84],"increase":[85,119,214],"yield":[87],"loss.":[88],"In":[89],"paper,":[91],"we":[92],"propose":[93],"two":[94,306],"approaches":[95,118],"reduce":[97],"PD":[99,157,189,270],"generated":[100],"at":[101,143,153,158,248,272,361],"circuits":[108],"BIST":[112],"Launch-On-Shift":[115],"scheme.":[116],"Both":[117],"correlation":[121],"between":[122],"adjacent":[123],"bits":[124],"scan":[127,141,246,323,359],"chains":[128,142,247,324,360],"respect":[130],"conventional":[132,165,191,222,368],"LBIST.":[134,167],"This":[135],"way,":[136],"AF":[138,149,243,320,356],"reduced.":[146],"CUT":[152],"thus":[155],"also":[161],"reduced":[162],"compared":[163,233,304],"The":[168,258],"former":[169],"approach,":[170,260],"hereinafter":[171,261],"referred":[172,262],"Low-Cost":[175],"Approach":[176,266],"(LCA),":[177],"enables":[178,268,316,353],"50":[180],"percent":[181,207,365,395],"reduction":[182],"worst":[185],"case":[186],"magnitude":[187],"logic":[192],"BIST.":[193],"It":[194],"requires":[195],"small":[197],"cost":[198],"terms":[200,284],"area":[202,256,286,336,390],"overhead":[203,287,337,391],"(of":[204,392],"approximately":[205,393],"1.5":[206],"on":[208,381,396],"average),":[209],"it":[211],"does":[212],"not":[213],"number":[216,289,384],"over":[220,299],"LBIST":[224],"achieve":[226],"same":[228],"Fault":[229],"Coverage":[230],"(FC).":[231],"Moreover,":[232],"three":[235,309],"recent":[236,310],"alternative":[237,311,348],"solutions,":[238],"LCA":[239,301],"features":[240],"comparable":[242,335,389],"while":[250,331,371],"requiring":[251,332,372],"lower":[252,319,341,366,375,383],"time":[254,377],"overhead.":[257],"second":[259],"High-Reduction":[265],"(HRA),":[267],"scalable":[269],"reductions":[271],"up":[275],"87":[277],"percent,":[278],"limited":[280],"additional":[281],"costs":[282],"required":[291],"for":[294],"given":[296],"target":[297],"FC,":[298],"our":[300],"approach.":[302],"Particularly,":[303],"solutions":[312,349],"mentioned":[313,350],"above,":[314,351],"HRA":[315,352],"application":[327],"vectors,":[330],"either":[333],"or":[338],"time.":[343],"Compared":[344],"remaining":[347],"similar":[355],"(approximately":[363,378],"90":[364],"LBIST),":[370],"4.87":[379],"times":[380],"average":[382],"vectors)":[387],"1.9":[394],"average).":[397]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2016-06-24T00:00:00"}