{"id":"https://openalex.org/W2416449194","doi":"https://doi.org/10.1109/tc.2015.2479618","title":"Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS","display_name":"Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS","publication_year":2015,"publication_date":"2015-09-18","ids":{"openalex":"https://openalex.org/W2416449194","doi":"https://doi.org/10.1109/tc.2015.2479618","mag":"2416449194"},"language":"en","primary_location":{"id":"doi:10.1109/tc.2015.2479618","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2015.2479618","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003384880","display_name":"Panagiota Papavramidou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Panagiota Papavramidou","raw_affiliation_strings":["TIMA Laboratory, Felix Viallet, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Felix Viallet, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062704166","display_name":"M. Nicolaidis","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Michael Nicolaidis","raw_affiliation_strings":["TIMA Laboratory, Felix Viallet, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Felix Viallet, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5003384880"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":2.6531,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.90504062,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"65","issue":"7","first_page":"2284","last_page":"2298"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8094000220298767},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6285726428031921},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.538861870765686},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46066680550575256},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.45397356152534485},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4403954744338989},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43577396869659424},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34358519315719604},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.33995622396469116},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24661484360694885},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09808334708213806}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8094000220298767},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6285726428031921},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.538861870765686},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46066680550575256},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.45397356152534485},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4403954744338989},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43577396869659424},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34358519315719604},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.33995622396469116},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24661484360694885},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09808334708213806},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tc.2015.2479618","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.2015.2479618","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01333937v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01333937","pdf_url":null,"source":{"id":"https://openalex.org/S4406922466","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Computers, 2016, 65 (7), pp.2284-2298. ⟨10.1109/TC.2015.2479618⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W67823304","https://openalex.org/W611078108","https://openalex.org/W646173351","https://openalex.org/W1667843264","https://openalex.org/W1792362277","https://openalex.org/W1927459197","https://openalex.org/W1967547903","https://openalex.org/W1973508428","https://openalex.org/W1977575391","https://openalex.org/W2021708499","https://openalex.org/W2026285055","https://openalex.org/W2105168930","https://openalex.org/W2110637318","https://openalex.org/W2112727903","https://openalex.org/W2129780639","https://openalex.org/W2134822007","https://openalex.org/W2144572396","https://openalex.org/W2152652532","https://openalex.org/W2160093572","https://openalex.org/W2162925991","https://openalex.org/W2163439504","https://openalex.org/W2166623528","https://openalex.org/W2169087039","https://openalex.org/W2170382128","https://openalex.org/W2171019527","https://openalex.org/W2171372273","https://openalex.org/W2416449194","https://openalex.org/W4229821096"],"related_works":["https://openalex.org/W2082914599","https://openalex.org/W2756570351","https://openalex.org/W3014521742","https://openalex.org/W4211139140","https://openalex.org/W2007805353","https://openalex.org/W2132500134","https://openalex.org/W2387433897","https://openalex.org/W2617868873","https://openalex.org/W2100589902","https://openalex.org/W2008392873"],"abstract_inverted_index":{"In":[0,29],"modern":[1],"SoCs":[2],"embedded":[3],"memories":[4],"should":[5,18],"be":[6,20],"protected":[7],"by":[8,32],"ECC":[9,54],"against":[10],"field":[11],"failures":[12],"to":[13,24,65,134],"achieve":[14,25],"acceptable":[15,26],"reliability.":[16],"They":[17],"also":[19],"repaired":[21],"after":[22],"fabrication":[23,27],"yield.":[28],"technologies":[30],"affected":[31],"high":[33,40,79],"defect":[34,80,130,147],"densities,":[35],"conventional":[36],"repair":[37,88],"induces":[38],"very":[39,91],"costs.":[41],"To":[42,95],"reduce":[43],"it,":[44],"we":[45,73,99,112],"can":[46],"use":[47],"ECC-based":[48,87],"repair,":[49],"consisting":[50],"in":[51,75,122,138],"using":[52],"the":[53,82,129],"for":[55,78,86],"fixing":[56],"words":[57],"comprising":[58],"a":[59,101,110],"single":[60],"faulty":[61,69],"cell":[62],"and":[63,125],"self-repair":[64],"fix":[66,96],"all":[67],"other":[68],"words.":[70],"However,":[71],"as":[72,114,142],"show":[74],"this":[76,97],"paper,":[77],"densities":[81,131],"diagnosis":[83],"circuitry":[84],"required":[85],"may":[89],"induce":[90],"large":[92],"hardware":[93],"cost.":[94],"issue,":[98],"introduce":[100],"new":[102],"family":[103],"of":[104],"memory":[105],"test":[106],"algorithms":[107],"that":[108],"exhibit":[109],"property":[111],"termed":[113],"\u201csingle-read":[115],"double-fault":[116],"detection\u201d.":[117],"This":[118],"approach":[119],"gains":[120],"interest":[121],"ultimate":[123],"CMOS":[124],"post-CMOS":[126],"technologies,":[127],"where":[128],"are":[132],"expected":[133],"increase":[135],"significantly,":[136],"and/or":[137],"very-low":[139,143],"power":[140],"design,":[141],"voltage":[144],"sharply":[145],"increases":[146],"densities.":[148]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-03-29T08:15:47.926485","created_date":"2025-10-10T00:00:00"}