{"id":"https://openalex.org/W1921858215","doi":"https://doi.org/10.1109/tc.1986.1676831","title":"Checkpoint Faults are not Sufficient Target Faults for Test Generation","display_name":"Checkpoint Faults are not Sufficient Target Faults for Test Generation","publication_year":1986,"publication_date":"1986-08-01","ids":{"openalex":"https://openalex.org/W1921858215","doi":"https://doi.org/10.1109/tc.1986.1676831","mag":"1921858215"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1986.1676831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1986.1676831","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010732789","display_name":"Abramovici","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Abramovici","raw_affiliation_strings":["AT&T Information Systems","AT&T Information Systems, Inc., Naperville, IL, USA"],"affiliations":[{"raw_affiliation_string":"AT&T Information Systems","institution_ids":["https://openalex.org/I1283103587"]},{"raw_affiliation_string":"AT&T Information Systems, Inc., Naperville, IL, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048748809","display_name":"Menon","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Menon","raw_affiliation_strings":["AT&T Information Systems, Inc., Naperville, IL, USA"],"affiliations":[{"raw_affiliation_string":"AT&T Information Systems, Inc., Naperville, IL, USA","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109240477","display_name":"M. A. Miller","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miller","raw_affiliation_strings":["AT&T Information Systems, Inc., Naperville, IL, USA"],"affiliations":[{"raw_affiliation_string":"AT&T Information Systems, Inc., Naperville, IL, USA","institution_ids":["https://openalex.org/I1283103587"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5010732789"],"corresponding_institution_ids":["https://openalex.org/I1283103587"],"apc_list":null,"apc_paid":null,"fwci":0.9022,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.76114474,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"C-35","issue":"8","first_page":"769","last_page":"771"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6975390911102295},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.595173180103302},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5906901955604553},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5888632535934448},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.584465503692627},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5454003810882568},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5009102821350098},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.48243340849876404},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41335806250572205},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4128912091255188},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40433239936828613},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38602927327156067},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.24927249550819397},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1640542447566986},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11326771974563599},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08191302418708801}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6975390911102295},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.595173180103302},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5906901955604553},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5888632535934448},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.584465503692627},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5454003810882568},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5009102821350098},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.48243340849876404},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41335806250572205},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4128912091255188},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40433239936828613},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38602927327156067},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.24927249550819397},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1640542447566986},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11326771974563599},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08191302418708801},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1986.1676831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1986.1676831","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1677852443","https://openalex.org/W1982245925","https://openalex.org/W1992651332","https://openalex.org/W2021218329","https://openalex.org/W2047357356","https://openalex.org/W2068889354","https://openalex.org/W2071512974","https://openalex.org/W2076000316","https://openalex.org/W2150944068","https://openalex.org/W2159880265","https://openalex.org/W4236231374"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W3147038789","https://openalex.org/W2068571131","https://openalex.org/W1555400249","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W2913077774","https://openalex.org/W1493811107"],"abstract_inverted_index":{"Stuck-at":[0],"faults":[1,13,26,46,56,66],"on":[2],"primary":[3],"inputs":[4],"and":[5],"fan-out":[6],"branches":[7],"are":[8],"commonly":[9],"used":[10],"as":[11],"target":[12,34,45],"in":[14,67],"test":[15],"generation":[16],"algorithms":[17],"for":[18,40],"combinational":[19],"circuits.":[20],"This":[21],"correspondence":[22],"shows":[23],"that":[24,50],"these":[25],"may":[27],"not":[28],"constitute":[29],"an":[30],"adequate":[31],"set":[32,43,59],"of":[33,44,53,63],"faults.":[35],"A":[36],"procedure":[37],"is":[38],"presented":[39],"selecting":[41],"a":[42],"with":[47],"the":[48,51,61,68],"property":[49],"detection":[52,62],"all":[54,64],"detectable":[55,65],"from":[57],"this":[58],"guarantees":[60],"circuit.":[69]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}