{"id":"https://openalex.org/W1965395779","doi":"https://doi.org/10.1109/tc.1986.1676703","title":"An Algorithm for Determining the Fault Diagnosability of a System","display_name":"An Algorithm for Determining the Fault Diagnosability of a System","publication_year":1986,"publication_date":"1986-11-01","ids":{"openalex":"https://openalex.org/W1965395779","doi":"https://doi.org/10.1109/tc.1986.1676703","mag":"1965395779"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1986.1676703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1986.1676703","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109919148","display_name":"Narasimhan","orcid":null},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]},{"id":"https://openalex.org/I2800736688","display_name":"Burroughs Wellcome Fund","ror":"https://ror.org/01d35cw23","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I2800736688"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Narasimhan","raw_affiliation_strings":["Burroughs Corporation, Mission Viejo, CA, USA","Department of Electrical Engineering Computer Science, Texas Tech University, Lubbock, TX, USA","Department of Electrical Engineering, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"Burroughs Corporation, Mission Viejo, CA, USA","institution_ids":["https://openalex.org/I2800736688"]},{"raw_affiliation_string":"Department of Electrical Engineering Computer Science, Texas Tech University, Lubbock, TX, USA","institution_ids":["https://openalex.org/I12315562"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113685748","display_name":"Nakajima","orcid":null},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]},{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]},{"id":"https://openalex.org/I2800736688","display_name":"Burroughs Wellcome Fund","ror":"https://ror.org/01d35cw23","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I2800736688"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nakajima","raw_affiliation_strings":["Burroughs Corporation, Mission Viejo, CA, USA","Department of Electrical Engineering Computer Science, Texas Tech University, Lubbock, TX, USA","Department of Electrical Engineering, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"Burroughs Corporation, Mission Viejo, CA, USA","institution_ids":["https://openalex.org/I2800736688"]},{"raw_affiliation_string":"Department of Electrical Engineering Computer Science, Texas Tech University, Lubbock, TX, USA","institution_ids":["https://openalex.org/I12315562"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5109919148"],"corresponding_institution_ids":["https://openalex.org/I12315562","https://openalex.org/I2800736688","https://openalex.org/I66946132"],"apc_list":null,"apc_paid":null,"fwci":1.0342,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.78588162,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"C-35","issue":"11","first_page":"1004","last_page":"1008"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6410963535308838},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6122317910194397},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5298409461975098},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4462392330169678},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.43194496631622314},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1796770989894867}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6410963535308838},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6122317910194397},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5298409461975098},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4462392330169678},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.43194496631622314},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1796770989894867},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1986.1676703","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1986.1676703","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322554","display_name":"Javna Agencija za Raziskovalno Dejavnost RS","ror":"https://ror.org/059bp8k51"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1702564718","https://openalex.org/W1896350292","https://openalex.org/W1965395779","https://openalex.org/W1975564985","https://openalex.org/W2015152844","https://openalex.org/W2037529689","https://openalex.org/W2041211631","https://openalex.org/W2073271665","https://openalex.org/W2086240546","https://openalex.org/W2086934045","https://openalex.org/W2115602674","https://openalex.org/W2150233937","https://openalex.org/W2278011845"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3107994849","https://openalex.org/W2051487156","https://openalex.org/W4247143848","https://openalex.org/W2073681303","https://openalex.org/W2735573198","https://openalex.org/W2009883749","https://openalex.org/W2390279801","https://openalex.org/W29442446","https://openalex.org/W2358668433"],"abstract_inverted_index":{"The":[0],"fault":[1],"diagnosability":[2,56],"problem":[3,6,33],"is":[4],"the":[5,9,35,50],"of":[7,12,24,49],"computing":[8],"maximum":[10],"number":[11],"faulty":[13,28],"units":[14],"which":[15],"a":[16,46,59],"system":[17,60],"can":[18],"tolerate":[19],"without":[20],"losing":[21],"its":[22],"capability":[23],"identifying":[25],"all":[26],"such":[27],"units.":[29],"We":[30,44],"study":[31],"this":[32,62],"for":[34,58],"model":[36],"introduced":[37],"by":[38],"Barsi,":[39],"Grandoni,":[40],"and":[41,52],"Maestrini":[42],"[2].":[43],"present":[45],"new":[47],"characterization":[48],"model,":[51],"develop":[53],"an":[54],"efficient":[55],"algorithm":[57],"in":[61],"model.":[63]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}