{"id":"https://openalex.org/W1792710789","doi":"https://doi.org/10.1109/tc.1986.1676665","title":"The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's","display_name":"The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's","publication_year":1986,"publication_date":"1986-01-01","ids":{"openalex":"https://openalex.org/W1792710789","doi":"https://doi.org/10.1109/tc.1986.1676665","mag":"1792710789"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1986.1676665","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1986.1676665","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5098407764","display_name":"Rajski","orcid":null},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]},{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA","PL"],"is_corresponding":false,"raw_author_name":"Rajski","raw_affiliation_strings":["Department of Electrical Engineering, McGill University, Montreal, QUE, Canada","Technical University of Pozna\u0144, Poznan, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"Technical University of Pozna\u0144, Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5098218783","display_name":"Tyszer","orcid":null},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Tyszer","raw_affiliation_strings":["Computer Center, Technical University of Pozna\u0144, Poznan, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Center, Technical University of Pozna\u0144, Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9378,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.76849894,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"C-35","issue":"1","first_page":"81","last_page":"85"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9424999952316284,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.8169816136360168},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5992016196250916},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5956882238388062},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5605648756027222},{"id":"https://openalex.org/keywords/row","display_name":"Row","score":0.539910078048706},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5228543877601624},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5137454271316528},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4946138560771942},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.40792155265808105},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14457431435585022},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13821008801460266},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12686222791671753},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10323640704154968}],"concepts":[{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.8169816136360168},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5992016196250916},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5956882238388062},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5605648756027222},{"id":"https://openalex.org/C135598885","wikidata":"https://www.wikidata.org/wiki/Q1366302","display_name":"Row","level":2,"score":0.539910078048706},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5228543877601624},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5137454271316528},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4946138560771942},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.40792155265808105},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14457431435585022},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13821008801460266},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12686222791671753},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10323640704154968},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1986.1676665","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1986.1676665","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310638","display_name":"McGill University","ror":"https://ror.org/01pxwe438"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1805015378","https://openalex.org/W1991051632","https://openalex.org/W1991643564","https://openalex.org/W2020269241","https://openalex.org/W2024467749","https://openalex.org/W2027257919","https://openalex.org/W2034124249","https://openalex.org/W2039532848","https://openalex.org/W2065966163","https://openalex.org/W2070238330","https://openalex.org/W2077746646","https://openalex.org/W2088013285"],"related_works":["https://openalex.org/W4281971614","https://openalex.org/W2390933768","https://openalex.org/W2467236363","https://openalex.org/W3081694532","https://openalex.org/W3175260668","https://openalex.org/W2953259538","https://openalex.org/W3008919008","https://openalex.org/W3122721839","https://openalex.org/W2184455175","https://openalex.org/W2383699822"],"abstract_inverted_index":{"It":[0,127],"is":[1,70,97,128],"relatively":[2],"easy":[3],"to":[4,25,31,40],"generate":[5],"a":[6,16,20,49,104,147],"complete":[7],"single":[8,50],"contact":[9,64,160],"fault":[10,45,51,65,77,133],"detection":[11,52],"test":[12,21,53],"set":[13,22,54],"Tc":[14,55,73,100,124,137,154],"for":[15,150],"PLA.":[17],"However":[18],"such":[19],"may":[23],"fail":[24],"detect":[26],"all":[27,159],"multiple":[28,44,63,76,132],"faults":[29,108,161],"due":[30],"the":[32,43,75,88,120,131,140],"phenomenon":[33],"of":[34,48,107,119,123,136,144,146,158,162],"masking.":[35,111],"In":[36,85],"previous":[37],"papers":[38],"attempting":[39],"quantitatively":[41],"predict":[42],"coverage":[46,121,134],"capability":[47,122],"in":[56,66,93,101],"PLA's,":[57],"it":[58,96],"was":[59],"proved":[60],"that":[61,99,130],"every":[62],"an":[67],"irredundant":[68],"PLA":[69,148],"detected":[71],"by":[72],"if":[74],"does":[78],"not":[79],"contain":[80],"any":[81],"four-way":[82,110],"masking":[83,89],"cycle.":[84],"this":[86],"correspondence,":[87],"relations":[90],"are":[91,125],"studied":[92],"detail":[94],"and":[95,149],"shown":[98,129],"fact":[102],"detects":[103,155],"signifilcant":[105],"percentage":[106],"with":[109,139],"Based":[112],"on":[113],"these":[114],"results":[115],"more":[116],"realistic":[117],"bounds":[118],"determined.":[126],"ratio":[135],"increases":[138],"increasing":[141],"number":[142],"m":[143,151],"rows":[145],"=":[152],"24":[153],"99":[156],"percent":[157],"size":[163],"8":[164],"or":[165],"less.":[166]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}