{"id":"https://openalex.org/W1992651332","doi":"https://doi.org/10.1109/tc.1985.1676573","title":"Layout Influences Testability","display_name":"Layout Influences Testability","publication_year":1985,"publication_date":"1985-03-01","ids":{"openalex":"https://openalex.org/W1992651332","doi":"https://doi.org/10.1109/tc.1985.1676573","mag":"1992651332"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1985.1676573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1985.1676573","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Spencer","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spencer","raw_affiliation_strings":["Stanford University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stanford University","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026340388","display_name":"Savir","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Savir","raw_affiliation_strings":["Stanford University","IBM, ,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Stanford University","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"IBM, ,","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0755,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.80037313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"C-34","issue":"3","first_page":"287","last_page":"290"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8666648268699646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7349156141281128},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.5661342740058899},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5256337523460388},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4958723485469818},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4867093861103058},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4726735055446625},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.47190433740615845},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4328271448612213},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.42363080382347107},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.39214062690734863},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.354113906621933},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3418864905834198},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19799372553825378},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.18171682953834534},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0958818793296814},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07872241735458374}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8666648268699646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7349156141281128},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.5661342740058899},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5256337523460388},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4958723485469818},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4867093861103058},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4726735055446625},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.47190433740615845},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4328271448612213},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.42363080382347107},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.39214062690734863},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.354113906621933},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3418864905834198},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19799372553825378},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.18171682953834534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0958818793296814},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07872241735458374},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1985.1676573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1985.1676573","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1978667923","https://openalex.org/W1991051632","https://openalex.org/W2004437077","https://openalex.org/W2020269241","https://openalex.org/W2029060794","https://openalex.org/W2056156539","https://openalex.org/W2140824755","https://openalex.org/W6651354974"],"related_works":["https://openalex.org/W2369589212","https://openalex.org/W2543176856","https://openalex.org/W1579528621","https://openalex.org/W2141620082","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2129713538","https://openalex.org/W2341817401","https://openalex.org/W2408214455","https://openalex.org/W1953724919"],"abstract_inverted_index":{"This":[0],"correspondence":[1],"addresses":[2],"actual":[3],"implementation":[4,22,46,59],"of":[5,35,47],"a":[6,16],"multiway":[7,37],"fan-out":[8,21,38,49,58],"and":[9],"its":[10],"effect":[11],"on":[12],"test":[13,17,30],"generation.":[14],"If":[15],"generation":[18],"ignores":[19],"the":[20,29,36,48],"faults":[23],"may":[24,39,50,61],"be":[25],"left":[26],"undetected":[27],"by":[28],"set.":[31],"Moreover,":[32],"different":[33,42],"implementations":[34],"lead":[40],"to":[41],"fault":[43],"coverages.":[44],"Careless":[45],"also":[51],"yield":[52],"undetectable":[53],"faults.":[54],"Some":[55],"guidelines":[56],"for":[57],"that":[60],"enhance":[62],"testability":[63],"are":[64],"given":[65],"in":[66],"this":[67],"correspondence.":[68]},"counts_by_year":[],"updated_date":"2026-07-07T14:30:12.667765","created_date":"2025-10-10T00:00:00"}