{"id":"https://openalex.org/W2015152844","doi":"https://doi.org/10.1109/tc.1984.5009366","title":"A Diagnosis Algorithm for the BGM System Level Fault Model","display_name":"A Diagnosis Algorithm for the BGM System Level Fault Model","publication_year":1984,"publication_date":"1984-08-01","ids":{"openalex":"https://openalex.org/W2015152844","doi":"https://doi.org/10.1109/tc.1984.5009366","mag":"2015152844"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1984.5009366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1984.5009366","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105938048","display_name":"G\u00e9rard G. L. Meyer","orcid":null},"institutions":[{"id":"https://openalex.org/I145311948","display_name":"Johns Hopkins University","ror":"https://ror.org/00za53h95","country_code":"US","type":"education","lineage":["https://openalex.org/I145311948"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Gerard G. L. Meyer","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Johns Hopkins University, Baltimore, MD, USA","Department of Electrical Engineering and Computer Science, The Johns Hopkins University, Baltimore, MD 21218#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]},{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, The Johns Hopkins University, Baltimore, MD 21218#TAB#","institution_ids":["https://openalex.org/I145311948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5105938048"],"corresponding_institution_ids":["https://openalex.org/I145311948"],"apc_list":null,"apc_paid":null,"fwci":2.396,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.88766368,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"C-33","issue":"8","first_page":"756","last_page":"758"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.656640887260437},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6544800996780396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6522567272186279},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4912094473838806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.092754065990448}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.656640887260437},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6544800996780396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6522567272186279},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4912094473838806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.092754065990448},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1984.5009366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1984.5009366","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1702564718","https://openalex.org/W1975564985","https://openalex.org/W2037529689","https://openalex.org/W2136416982","https://openalex.org/W2150233937","https://openalex.org/W6680045237"],"related_works":["https://openalex.org/W2166897423","https://openalex.org/W2091334132","https://openalex.org/W1794505928","https://openalex.org/W2620568181","https://openalex.org/W2160179184","https://openalex.org/W2352104657","https://openalex.org/W2372794599","https://openalex.org/W2618712000","https://openalex.org/W2066922864","https://openalex.org/W2371965930"],"abstract_inverted_index":{"A":[0],"\u03c4diagnosable":[1],"system":[2,5,43,56],"is":[3,57,64],"a":[4],"in":[6],"which":[7],"all":[8],"faults":[9,22,63],"may":[10,35],"be":[11,36],"identified":[12],"from":[13],"the":[14,19,39,42,55,60],"test":[15],"results,":[16],"provided":[17],"that":[18,34],"number":[20,61],"of":[21,41,62],"does":[23],"not":[24],"exceed":[25],"\u03c4.":[26,67],"In":[27],"this":[28],"correspondence":[29],"we":[30],"present":[31],"an":[32],"algorithm":[33],"used":[37],"for":[38],"diagnosis":[40],"level":[44],"BGM":[45],"fault":[46],"model":[47],"proposed":[48],"by":[49],"Barsi,":[50],"Grandoni,":[51],"and":[52,59],"Maestrini,":[53],"whenever":[54],"\u03c4-diagnosable":[58],"at":[65],"most":[66]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}