{"id":"https://openalex.org/W1781869773","doi":"https://doi.org/10.1109/tc.1980.1675605","title":"Diagnosis Without Repair for Hybrid Fault Situations","display_name":"Diagnosis Without Repair for Hybrid Fault Situations","publication_year":1980,"publication_date":"1980-06-01","ids":{"openalex":"https://openalex.org/W1781869773","doi":"https://doi.org/10.1109/tc.1980.1675605","mag":"1781869773"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1980.1675605","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1980.1675605","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041359442","display_name":"Mallela","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Mallela","raw_affiliation_strings":["Western Electric Engineering Research Center"],"affiliations":[{"raw_affiliation_string":"Western Electric Engineering Research Center","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006943494","display_name":"Masson","orcid":null},"institutions":[{"id":"https://openalex.org/I145311948","display_name":"Johns Hopkins University","ror":"https://ror.org/00za53h95","country_code":"US","type":"education","lineage":["https://openalex.org/I145311948"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Masson","raw_affiliation_strings":["Western Electric Engineering Research Center","[Department of Electrical Engineering, Johns Hopkins University, Baltimore, MD, USA]"],"affiliations":[{"raw_affiliation_string":"Western Electric Engineering Research Center","institution_ids":[]},{"raw_affiliation_string":"[Department of Electrical Engineering, Johns Hopkins University, Baltimore, MD, USA]","institution_ids":["https://openalex.org/I145311948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5041359442"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.1314,"has_fulltext":false,"cited_by_count":63,"citation_normalized_percentile":{"value":0.9469526,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"C-29","issue":"6","first_page":"461","last_page":"470"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.772614598274231},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6378797292709351},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.6249265670776367},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.583204984664917},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5688441395759583},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5193408727645874},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.444868803024292},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.44288238883018494},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4425353407859802},{"id":"https://openalex.org/keywords/bounded-function","display_name":"Bounded function","score":0.4417720139026642},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3789069652557373},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3329794406890869},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19195866584777832},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.185943603515625},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15614020824432373},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.07385003566741943},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06537574529647827},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06424880027770996}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.772614598274231},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6378797292709351},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.6249265670776367},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.583204984664917},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5688441395759583},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5193408727645874},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.444868803024292},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.44288238883018494},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4425353407859802},{"id":"https://openalex.org/C34388435","wikidata":"https://www.wikidata.org/wiki/Q2267362","display_name":"Bounded function","level":2,"score":0.4417720139026642},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3789069652557373},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3329794406890869},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19195866584777832},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.185943603515625},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15614020824432373},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.07385003566741943},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06537574529647827},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06424880027770996},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1980.1675605","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1980.1675605","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W237395844","https://openalex.org/W1699514597","https://openalex.org/W1708264324","https://openalex.org/W1749135149","https://openalex.org/W1913852920","https://openalex.org/W1964080231","https://openalex.org/W1975564985","https://openalex.org/W2020218525","https://openalex.org/W2022563123","https://openalex.org/W2037529689","https://openalex.org/W2056210095","https://openalex.org/W2073271665","https://openalex.org/W2077459347","https://openalex.org/W2084525043","https://openalex.org/W2110251422","https://openalex.org/W2115602674","https://openalex.org/W2139758682","https://openalex.org/W2150233937","https://openalex.org/W4285719527","https://openalex.org/W6609141521"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3148663848","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W2278517150","https://openalex.org/W4256030018","https://openalex.org/W3150960233","https://openalex.org/W2061946964","https://openalex.org/W2147400189","https://openalex.org/W2474604829"],"abstract_inverted_index":{"For":[0],"a":[1,71,108,114,163,216],"new":[2,68],"class":[3],"of":[4,17,29,61,70,102,107,144,165],"fault":[5,9,14,53,73,82,88,123,136,173,209],"situations":[6,54],"called":[7],"hybrid":[8,72,122,172,208],"situations,":[10],"we":[11],"consider":[12],"the":[13,45,50,79,85,103,133,142,159,184,207],"diagnosing":[15,115,128,146],"capabilities":[16],"systems":[18],"which":[19,90,117,211],"for":[20,113,171,189,215],"testing/monitoring":[21],"purposes":[22],"can":[23,212],"be":[24,151,213],"viewed":[25],"as":[26,57,76,121,181],"being":[27],"composed":[28],"independent":[30],"units.":[31,51,66,168],"The":[32,169],"classical":[33],"Preparata,":[34],"Metze,":[35],"and":[36,63,84,141,191],"Chien":[37],"model":[38,110],"(PMC":[39],"model)":[40],"is":[41,111,118,130,148,161,177],"used":[42,204],"to":[43,120,150,179,205],"specify":[44],"various":[46],"testing":[47],"assignments":[48],"among":[49,201],"Hybrid":[52],"are":[55,199],"described":[56],"explicitly":[58],"bounded":[59],"combinations":[60],"permanently":[62],"intermittently":[64,166],"faulty":[65,167],"This":[67,127],"concept":[69],"situation":[74],"includes":[75],"special":[77,187],"cases":[78,183,210],"all":[80],"permanent":[81,135,190],"case":[83,89],"unrestricted":[86,192],"intermittent":[87,193],"have":[91],"both":[92],"been":[93],"previously":[94,185],"considered":[95],"with":[96,132],"PMC":[97,109,218],"models.":[98],"A":[99],"general":[100],"characterization":[101,170],"so-called":[104],"connection":[105],"assignment":[106],"established":[112],"capability":[116,129,147],"referred":[119],"diagnosability":[124,137,174,194],"without":[125,138,175,195],"repair.":[126,196],"compatible":[131],"well-known":[134],"repair":[139,176],"concept,":[140],"quality":[143],"this":[145],"shown":[149],"correct,":[152],"but":[153],"sometimes":[154],"an":[155],"incomplete":[156],"diagnosis":[157],"where":[158],"incompleteness":[160],"solely":[162],"consequence":[164],"seen":[178],"encompass":[180],"extreme":[182],"known":[186],"characterizations":[188],"Fundamental":[197],"interrelationships":[198],"determined":[200],"parameter":[202],"bounds":[203],"describe":[206],"diagnosed":[214],"given":[217],"model.":[219]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}