{"id":"https://openalex.org/W2034124249","doi":"https://doi.org/10.1109/tc.1980.1675567","title":"Generic Fault Characterizations for Table Look-Up Coverage Bounding","display_name":"Generic Fault Characterizations for Table Look-Up Coverage Bounding","publication_year":1980,"publication_date":"1980-04-01","ids":{"openalex":"https://openalex.org/W2034124249","doi":"https://doi.org/10.1109/tc.1980.1675567","mag":"2034124249"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1980.1675567","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1980.1675567","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110913337","display_name":"Agarwal","orcid":null},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Agarwal","raw_affiliation_strings":["Department of Electrical Engineering, McGill University, Montreal, QUE, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006943494","display_name":"Masson","orcid":null},"institutions":[{"id":"https://openalex.org/I145311948","display_name":"Johns Hopkins University","ror":"https://ror.org/00za53h95","country_code":"US","type":"education","lineage":["https://openalex.org/I145311948"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Masson","raw_affiliation_strings":["Department of Electrical Engineering, Johns Hopkins University, Baltimore, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Johns Hopkins University, Baltimore, MD, USA","institution_ids":["https://openalex.org/I145311948"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.2519,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.88225539,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"C-29","issue":"4","first_page":"288","last_page":"299"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bounding-overwatch","display_name":"Bounding overwatch","score":0.660775899887085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6221033334732056},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5639436841011047},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.524543821811676},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5045427083969116},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5037838816642761},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5003571510314941},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.4853874444961548},{"id":"https://openalex.org/keywords/upper-and-lower-bounds","display_name":"Upper and lower bounds","score":0.41978663206100464},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.31112921237945557},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.18709078431129456},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09908175468444824},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07966026663780212}],"concepts":[{"id":"https://openalex.org/C63584917","wikidata":"https://www.wikidata.org/wiki/Q333286","display_name":"Bounding overwatch","level":2,"score":0.660775899887085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6221033334732056},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5639436841011047},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.524543821811676},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5045427083969116},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5037838816642761},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5003571510314941},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.4853874444961548},{"id":"https://openalex.org/C77553402","wikidata":"https://www.wikidata.org/wiki/Q13222579","display_name":"Upper and lower bounds","level":2,"score":0.41978663206100464},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.31112921237945557},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.18709078431129456},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09908175468444824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07966026663780212},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1980.1675567","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1980.1675567","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W115590081","https://openalex.org/W1682465445","https://openalex.org/W1828805207","https://openalex.org/W1971930259","https://openalex.org/W1983575666","https://openalex.org/W1991051632","https://openalex.org/W1991643564","https://openalex.org/W1993225874","https://openalex.org/W2004437077","https://openalex.org/W2005053782","https://openalex.org/W2008521268","https://openalex.org/W2009750067","https://openalex.org/W2019751328","https://openalex.org/W2034265748","https://openalex.org/W2034570505","https://openalex.org/W2043111827","https://openalex.org/W2044827054","https://openalex.org/W2083152404","https://openalex.org/W2089334848","https://openalex.org/W2090113622","https://openalex.org/W2140824755","https://openalex.org/W2224733874","https://openalex.org/W2312856063","https://openalex.org/W6651354974"],"related_works":["https://openalex.org/W2132137594","https://openalex.org/W2069783012","https://openalex.org/W2085967955","https://openalex.org/W4256335355","https://openalex.org/W3098612666","https://openalex.org/W1499116563","https://openalex.org/W2138867060","https://openalex.org/W2023859141","https://openalex.org/W2182290077","https://openalex.org/W3207033120"],"abstract_inverted_index":{"Given":[0],"any":[1,7],"combinational,":[2],"internal":[3,125,148],"fan-out-free":[4,126,149],"network":[5,127,150],"and":[6,138],"complete":[8],"single":[9],"fault":[10,81,104],"detection":[11],"test":[12],"set":[13],"(SFDTS)":[14],"for":[15,72,123,146],"the":[16,23,27,39,47,74,79,119,142],"network,":[17],"we":[18],"consider":[19],"in":[20,38],"this":[21,112],"paper":[22],"problem":[24],"of":[25,43,49,60,84,89,131,135,156],"determining":[26],"minimal":[28],"extent":[29],"to":[30,53,69,97],"which":[31,56],"that":[32],"SFDTS":[33,86,122,145],"will":[34],"cover":[35],"multiple":[36,54,80,103,133,158],"faults":[37,55,62,134],"network.":[40],"The":[41],"basis":[42],"our":[44],"approach":[45,113],"is":[46],"development":[48],"a":[50,58,70,90],"generic":[51],"perspective":[52,67],"uses":[57],"representation":[59],"such":[61],"called":[63],"an":[64,85,124,147],"L-expression.":[65],"This":[66],"leads":[68],"technique":[71],"obtaining":[73],"greatest":[75],"lower":[76],"bound":[77],"on":[78],"coverage":[82],"capability":[83],"by":[87],"means":[88],"simple":[91],"table":[92],"look-up":[93],"process.":[94],"In":[95],"addition":[96],"generalizing":[98],"previously":[99],"known":[100],"results":[101,109],"regarding":[102],"coverage,":[105],"two":[106],"particularly":[107],"interesting":[108],"obtained":[110],"from":[111],"are":[114],"as":[115],"follows:":[116],"1)":[117],"On":[118,141],"average,":[120,143],"every":[121,144],"covers":[128,151],"92":[129],"percent":[130,155],"all":[132,157],"sizes":[136],"8":[137],"less.":[139],"2)":[140],"at":[152],"least":[153],"46.1":[154],"faults.":[159]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}