{"id":"https://openalex.org/W1979949556","doi":"https://doi.org/10.1109/tc.1979.1675397","title":"Reliability Analysis of N-Modular Redundancy Systems with Intermittent and Permanent Faults","display_name":"Reliability Analysis of N-Modular Redundancy Systems with Intermittent and Permanent Faults","publication_year":1979,"publication_date":"1979-07-01","ids":{"openalex":"https://openalex.org/W1979949556","doi":"https://doi.org/10.1109/tc.1979.1675397","mag":"1979949556"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1979.1675397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1979.1675397","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057495789","display_name":"Koren","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]},{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]},{"id":"https://openalex.org/I4210116219","display_name":"Engineering Systems (United States)","ror":"https://ror.org/02qg60849","country_code":"US","type":"company","lineage":["https://openalex.org/I4210116219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koren","raw_affiliation_strings":["Department of Electrical Engineering Systems, University of Southern California, Los Angeles, CA, USA","Department of Electrical Engineering and Computer Science, University of California, Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering Systems, University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212","https://openalex.org/I4210116219"]},{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112284252","display_name":"Su","orcid":null},"institutions":[{"id":"https://openalex.org/I123946342","display_name":"Binghamton University","ror":"https://ror.org/008rmbt77","country_code":"US","type":"education","lineage":["https://openalex.org/I123946342"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Su","raw_affiliation_strings":["Department of Computer Science State, State University of New York, Binghamton, Binghamton, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science State, State University of New York, Binghamton, Binghamton, NY, USA","institution_ids":["https://openalex.org/I123946342"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.954,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.92375654,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"C-28","issue":"7","first_page":"514","last_page":"520"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7955236434936523},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7468633651733398},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.7070399522781372},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6629835367202759},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6610299944877625},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44492438435554504},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19744309782981873}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7955236434936523},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7468633651733398},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.7070399522781372},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6629835367202759},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6610299944877625},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44492438435554504},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19744309782981873},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1979.1675397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1979.1675397","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1958580948","https://openalex.org/W1974949612","https://openalex.org/W1980738663","https://openalex.org/W2132098696","https://openalex.org/W2151728199","https://openalex.org/W2173426812","https://openalex.org/W3027624856","https://openalex.org/W6665748459","https://openalex.org/W6777919797"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W3008821054","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955"],"abstract_inverted_index":{"It":[0],"is":[1],"well":[2],"known":[3],"that":[4],"static":[5],"redundancy":[6,40],"techniques":[7],"are":[8,43],"very":[9,27],"efficient":[10],"against":[11],"intermittent":[12,46,58,72],"(transient)":[13],"faults":[14,22,59],"which":[15,42],"constitute":[16],"a":[17,54],"large":[18],"portion":[19],"of":[20,38,67],"logic":[21],"in":[23,34,70],"digital":[24],"systems.":[25],"However,":[26],"little":[28],"theoretical":[29],"work":[30],"has":[31],"been":[32],"done":[33],"evaluating":[35],"the":[36,65],"reliability":[37,66],"modular":[39],"systems":[41,69],"subject":[44],"to":[45,63],"malfunction":[47],"occurrences.":[48],"In":[49],"this":[50],"paper":[51],"we":[52],"present":[53],"statistical":[55],"model":[56],"for":[57],"and":[60,73],"use":[61],"it":[62],"analyze":[64],"NMR":[68],"mixed":[71],"permanent":[74],"fault":[75],"environments.":[76]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}