{"id":"https://openalex.org/W2055013504","doi":"https://doi.org/10.1109/tc.1976.1674662","title":"A Logic System for Fault Test Generation","display_name":"A Logic System for Fault Test Generation","publication_year":1976,"publication_date":"1976-06-01","ids":{"openalex":"https://openalex.org/W2055013504","doi":"https://doi.org/10.1109/tc.1976.1674662","mag":"2055013504"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1976.1674662","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674662","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027295013","display_name":"Akers","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092162","display_name":"General Electric (Israel)","ror":"https://ror.org/00fymn751","country_code":"IL","type":"company","lineage":["https://openalex.org/I1332737386","https://openalex.org/I4210092162"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Akers","raw_affiliation_strings":["Electronics Laboratory, General Electric Company"],"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, General Electric Company","institution_ids":["https://openalex.org/I4210092162"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5027295013"],"corresponding_institution_ids":["https://openalex.org/I4210092162"],"apc_list":null,"apc_paid":null,"fwci":1.8949,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.8542705,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"C-25","issue":"6","first_page":"620","last_page":"630"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6704477071762085},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6255897879600525},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5342753529548645},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4596717953681946},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.45775875449180603},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4224920868873596},{"id":"https://openalex.org/keywords/element","display_name":"Element (criminal law)","score":0.4203639626502991},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41913869976997375},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4164441227912903},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.36635106801986694},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3118593692779541},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.19161760807037354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10328370332717896},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07981529831886292}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6704477071762085},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6255897879600525},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5342753529548645},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4596717953681946},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.45775875449180603},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4224920868873596},{"id":"https://openalex.org/C200288055","wikidata":"https://www.wikidata.org/wiki/Q2621792","display_name":"Element (criminal law)","level":2,"score":0.4203639626502991},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41913869976997375},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4164441227912903},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.36635106801986694},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3118593692779541},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.19161760807037354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10328370332717896},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07981529831886292},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1976.1674662","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674662","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1993817604","https://openalex.org/W2079866295"],"related_works":["https://openalex.org/W2117873690","https://openalex.org/W3141249762","https://openalex.org/W4256030018","https://openalex.org/W2137555930","https://openalex.org/W2147400189","https://openalex.org/W2568949342","https://openalex.org/W2340957901","https://openalex.org/W1555400249","https://openalex.org/W2157154381","https://openalex.org/W4253743993"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,19,28,83,119,147,159],"logic":[4,29,66,87],"system":[5,13],"specifically":[6],"designed":[7],"for":[8,43],"fault":[9],"test":[10,45,115],"generation.":[11],"The":[12,106],"allows":[14],"the":[15,25,44,74,80,89,93,96,113,128,137,144,154],"user":[16],"to":[17,71,126],"impose":[18],"set":[20,64],"of":[21,27,65,76,85,92,121,146],"initial":[22],"constraints":[23,78],"on":[24],"elements":[26,94],"network":[30,97],"by":[31],"indicating":[32],"those":[33],"values":[34,91],"which":[35],"an":[36],"element":[37],"may":[38,40,117],"(or":[39],"not)":[41],"assume":[42],"under":[46],"consideration.":[47],"He":[48],"can":[49],"be":[50],"as":[51,54,56],"vague":[52],"or":[53,111],"specific":[55],"he":[57],"wants":[58],"in":[59,95,158],"imposing":[60],"these":[61,77],"constraints.":[62],"A":[63],"tables":[67,107,155],"is":[68,124],"then":[69],"used":[70],"automatically":[72,156],"propagate":[73],"effects":[75],"throughout":[79],"network.":[81],"As":[82],"result":[84],"this":[86],"propagtion,":[88],"necessary":[90],"become":[98],"much":[99],"more":[100],"precisely":[101],"(if":[102],"not":[103,112],"completely)":[104],"defined.":[105],"also":[108],"indicate":[109],"whether":[110],"generated":[114],"(which":[116],"include":[118],"number":[120],"unspecified":[122],"values)":[123],"sufficient":[125],"detect":[127],"given":[129],"fault.":[130],"If":[131],"several":[132],"different":[133],"tests":[134],"will":[135],"suffice,":[136],"choices":[138],"remaining":[139],"are":[140],"clearly":[141],"indicated.":[142],"In":[143],"case":[145],"redundant":[148],"lead":[149],"(untestable":[150],"fault),":[151],"propagation":[152],"through":[153],"results":[157],"logical":[160],"inconsistency.":[161]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}