{"id":"https://openalex.org/W2077614318","doi":"https://doi.org/10.1109/tc.1976.1674656","title":"A Highly Efficient Redundancy Scheme: Self-Purging Redundancy","display_name":"A Highly Efficient Redundancy Scheme: Self-Purging Redundancy","publication_year":1976,"publication_date":"1976-06-01","ids":{"openalex":"https://openalex.org/W2077614318","doi":"https://doi.org/10.1109/tc.1976.1674656","mag":"2077614318"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1976.1674656","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674656","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081586326","display_name":"Losq","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110242","display_name":"Digital Science (United States)","ror":"https://ror.org/020h4b682","country_code":"US","type":"company","lineage":["https://openalex.org/I4210110242","https://openalex.org/I4210112888","https://openalex.org/I4210118830"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Losq","raw_affiliation_strings":["Digital Systems Laboratory, Department of Electrical Engineering and Department of Computer Science, Stanford University","Digital Systems Laboratory, Department of Electrical Engineering and Department of Computer Science, Stanford University#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital Systems Laboratory, Department of Electrical Engineering and Department of Computer Science, Stanford University","institution_ids":["https://openalex.org/I4210110242","https://openalex.org/I97018004"]},{"raw_affiliation_string":"Digital Systems Laboratory, Department of Electrical Engineering and Department of Computer Science, Stanford University#TAB#","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081586326"],"corresponding_institution_ids":["https://openalex.org/I4210110242","https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":14.9569,"has_fulltext":false,"cited_by_count":82,"citation_normalized_percentile":{"value":0.98739919,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"C-25","issue":"6","first_page":"569","last_page":"578"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8869410157203674},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5999864935874939},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.579171895980835},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5283618569374084},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4846358895301819},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39539268612861633},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.1971077024936676},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12383571267127991}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8869410157203674},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5999864935874939},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.579171895980835},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5283618569374084},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4846358895301819},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39539268612861633},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.1971077024936676},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12383571267127991},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1976.1674656","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674656","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W305046100","https://openalex.org/W607232712","https://openalex.org/W1602154700","https://openalex.org/W1976551601","https://openalex.org/W1979665261","https://openalex.org/W2014001805","https://openalex.org/W2025548038","https://openalex.org/W2049084634","https://openalex.org/W2059275019","https://openalex.org/W2083306695","https://openalex.org/W2090575660","https://openalex.org/W2092187580","https://openalex.org/W2115870780","https://openalex.org/W2120185818","https://openalex.org/W2126258474","https://openalex.org/W2133085584","https://openalex.org/W2169944656","https://openalex.org/W2173426812","https://openalex.org/W2496493191","https://openalex.org/W2497735908","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2067279514"],"abstract_inverted_index":{"The":[0,87,127,185,215],"goals":[1],"of":[2,25,67,79,89,111,129,133,137,192,202,217],"this":[3,31,227],"paper":[4],"are":[5,60,92,122,154,160],"to":[6,16,20,29,124,209],"present":[7],"an":[8],"efficient":[9],"redundancy":[10,35,38],"scheme":[11,32,39,44],"for":[12,57,170,199],"highly":[13],"reliable":[14],"systems,":[15,165],"give":[17],"a":[18,43,47,109,197],"method":[19],"compute":[21],"the":[22,53,68,102,117,130,134,182,189,200,218],"exact":[23,82],"reliability":[24,83,91,100,175,183,190],"such":[26],"systems":[27,59,107,159,194],"and":[28,50,71,151,156,179],"compare":[30],"with":[33,162],"other":[34,163],"schemes.":[36],"This":[37],"is":[40,64,74,101,143],"self-purging":[41,58,106,193],"redundancy,":[42],"that":[45,51,205],"uses":[46],"threshold":[48],"voter":[49],"purges":[52],"failed":[54,69],"modules.":[55],"Switches":[56],"extremely":[61],"simple:":[62],"there":[63],"no":[65],"replacement":[66],"modules":[70],"module":[72],"purging":[73],"quite":[75],"simply":[76],"implemented.":[77],"Because":[78],"switch":[80,90,99,152,213],"simplicity,":[81,177],"calculations":[84],"re":[85],"possible.":[86],"effects":[88],"quantitatively":[93],"examined.":[94],"For":[95],"short":[96],"mission":[97,148],"times,":[98],"most":[103],"important":[104],"factor:":[105],"have":[108,206],"probability":[110],"failure":[112],"several":[113,203],"times":[114],"larger":[115],"than":[116],"figure":[118],"obtained":[119],"when":[120],"switches":[121],"assumed":[123],"be":[125,224],"perfect.":[126],"influence":[128],"relative":[131,172],"frequency":[132],"diverse":[135],"types":[136],"failures":[138],"(permanent,":[139],"intermittent,":[140],"stuck-at,":[141],"multiple,...)":[142],"also":[144],"investigated.":[145],"Reliability":[146],"functions,":[147],"time":[149],"improvements,":[150],"efficiency":[153],"computed":[155],"displayed.":[157],"Self-purging":[158],"compared":[161],"redundant":[164],"like":[166],"hybrid":[167],"or":[168],"NMR,":[169],"their":[171],"merits":[173],"in":[174,181,188,226],"gain,":[176],"cost,":[178],"confidence":[180,187],"estimation.":[184],"high":[186],"evaluation":[191],"makes":[195],"them":[196],"standard":[198],"validation":[201],"models":[204,219],"been":[207],"proposed":[208],"take":[210],"into":[211],"account":[212],"reliability.":[214],"accuracy":[216],"using":[220],"coverage":[221],"factors":[222],"can":[223],"evaluated":[225],"way.":[228]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}