{"id":"https://openalex.org/W1720335563","doi":"https://doi.org/10.1109/tc.1976.1674655","title":"Implementation of an Experimental Fault-Tolerant Memory System","display_name":"Implementation of an Experimental Fault-Tolerant Memory System","publication_year":1976,"publication_date":"1976-06-01","ids":{"openalex":"https://openalex.org/W1720335563","doi":"https://doi.org/10.1109/tc.1976.1674655","mag":"1720335563"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1976.1674655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674655","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111384459","display_name":"Carter","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carter","raw_affiliation_strings":["IBM Thomas J. Watson Research Center","IBM Thomas J. watson Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J. watson Research Center","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062128720","display_name":"McCarthy","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"McCarthy","raw_affiliation_strings":["IBM, Corporation, Huntsville, AL, USA","[IBM, Corporation, Huntsville, AL, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, Corporation, Huntsville, AL, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"[IBM, Corporation, Huntsville, AL, USA]","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.3794,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.98507052,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"C-25","issue":"6","first_page":"557","last_page":"568"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8179436922073364},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.678109884262085},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6415585875511169},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.6178443431854248},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5594258904457092},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4871244430541992},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48166096210479736},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4527008533477783},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.44862112402915955},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.44328245520591736},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.44204625487327576},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42375096678733826},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4234755039215088},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.42040160298347473},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.36676162481307983},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.355032742023468},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3294582962989807},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.25203371047973633},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1346198320388794},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13146692514419556},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.12441834807395935},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.0892682671546936}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8179436922073364},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.678109884262085},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6415585875511169},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6178443431854248},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5594258904457092},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4871244430541992},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48166096210479736},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4527008533477783},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.44862112402915955},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.44328245520591736},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.44204625487327576},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42375096678733826},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4234755039215088},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.42040160298347473},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.36676162481307983},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.355032742023468},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3294582962989807},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.25203371047973633},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1346198320388794},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13146692514419556},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.12441834807395935},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0892682671546936},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1976.1674655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674655","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.6800000071525574,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1602154700","https://openalex.org/W1720335563","https://openalex.org/W1976727409","https://openalex.org/W2011233763","https://openalex.org/W2021708499","https://openalex.org/W2028531327","https://openalex.org/W2064759901","https://openalex.org/W2079866295","https://openalex.org/W2088760722","https://openalex.org/W2108041125","https://openalex.org/W2182112064","https://openalex.org/W2247583754","https://openalex.org/W3175670150","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W1595866819","https://openalex.org/W2146400304","https://openalex.org/W2359378376","https://openalex.org/W2085688425","https://openalex.org/W2086328257","https://openalex.org/W1525871769","https://openalex.org/W2024608029","https://openalex.org/W3002937678","https://openalex.org/W2040421909","https://openalex.org/W1720335563"],"abstract_inverted_index":{"The":[0,53,66],"experimental":[1],"fault-tolerant":[2],"memory":[3],"system":[4],"described":[5,85],"in":[6],"this":[7],"paper":[8],"has":[9],"been":[10],"designed":[11],"to":[12,19,30,46,103],"enable":[13,108],"the":[14,21,28,37,48],"modular":[15],"addition":[16],"of":[17,27,50,63],"spares,":[18],"validate":[20],"theoretical":[22],"fault-secure":[23],"and":[24,40,45,56,106],"self-testing":[25],"properties":[26],"translator/corrector,":[29],"provide":[31],"a":[32,71],"basis":[33],"for":[34,43,89],"experiments":[35],"using":[36],"new":[38],"testing":[39],"correction":[41],"processes":[42],"recovery,":[44],"determine":[47],"practicality":[49],"such":[51],"systems.":[52],"hardware":[54],"design":[55],"implementation":[57],"are":[58,83,99],"described,":[59],"together":[60],"with":[61],"methods":[62],"fault":[64],"insertion.":[65],"hardware/":[67],"software":[68],"interface,":[69],"including":[70],"restricted":[72],"single":[73,96],"error":[74,76,97],"correction/double":[75],"detection":[77],"(SEC/DED)":[78],"code,":[79],"is":[80],"specified.":[81],"Procedures":[82],"carefully":[84],"which,":[86],"1)":[87],"test":[88],"specified":[90],"physical":[91],"faults,":[92,105],"2)":[93],"ensure":[94],"that":[95],"corrections":[98],"not":[100],"miscorrections":[101],"due":[102],"triple":[104],"3)":[107],"recovery":[109],"from":[110],"double":[111],"errors.":[112]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}