{"id":"https://openalex.org/W2132098696","doi":"https://doi.org/10.1109/tc.1976.1674598","title":"Fault-Tolerant Systems","display_name":"Fault-Tolerant Systems","publication_year":1976,"publication_date":"1976-12-01","ids":{"openalex":"https://openalex.org/W2132098696","doi":"https://doi.org/10.1109/tc.1976.1674598","mag":"2132098696"},"language":"en","primary_location":{"id":"doi:10.1109/tc.1976.1674598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674598","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5098635581","display_name":"Aviziens","orcid":null},"institutions":[{"id":"https://openalex.org/I2803209242","display_name":"University of California System","ror":"https://ror.org/00pjdza24","country_code":"US","type":"education","lineage":["https://openalex.org/I2803209242"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Aviziens","raw_affiliation_strings":["Department of Computer Science, University of California","Department of Computer Science University of California"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of California","institution_ids":[]},{"raw_affiliation_string":"Department of Computer Science University of California","institution_ids":["https://openalex.org/I2803209242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5098635581"],"corresponding_institution_ids":["https://openalex.org/I2803209242"],"apc_list":null,"apc_paid":null,"fwci":7.9439,"has_fulltext":false,"cited_by_count":189,"citation_normalized_percentile":{"value":0.97637795,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"C-25","issue":"12","first_page":"1304","last_page":"1312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9713000059127808,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.963699996471405,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7804911136627197},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7747894525527954},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7222640514373779},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.6591701507568359},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5777538418769836},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4441049098968506},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43965595960617065},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4261331558227539},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.34826475381851196},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.32180479168891907},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3197767734527588},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18106627464294434},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13576480746269226},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.11541882157325745},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08253911137580872}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7804911136627197},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7747894525527954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7222640514373779},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.6591701507568359},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5777538418769836},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4441049098968506},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43965595960617065},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4261331558227539},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.34826475381851196},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.32180479168891907},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3197767734527588},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18106627464294434},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13576480746269226},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.11541882157325745},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08253911137580872},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tc.1976.1674598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tc.1976.1674598","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","0016-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1825320825","https://openalex.org/W1980109288","https://openalex.org/W1983839005","https://openalex.org/W1993951971","https://openalex.org/W1998730330","https://openalex.org/W2017272490","https://openalex.org/W2019342577","https://openalex.org/W2046655661","https://openalex.org/W2051332127","https://openalex.org/W2052815272","https://openalex.org/W2067294183","https://openalex.org/W2068220049","https://openalex.org/W2090278075","https://openalex.org/W2092187580","https://openalex.org/W2098630559","https://openalex.org/W2118143270","https://openalex.org/W2119009318","https://openalex.org/W2124695704","https://openalex.org/W2127015369","https://openalex.org/W2133201251","https://openalex.org/W2170708288","https://openalex.org/W2331898814","https://openalex.org/W2592626502","https://openalex.org/W2611176464","https://openalex.org/W3035757797"],"related_works":["https://openalex.org/W2089451342","https://openalex.org/W1987948407","https://openalex.org/W2048385336","https://openalex.org/W2145227850","https://openalex.org/W4254627859","https://openalex.org/W2736389602","https://openalex.org/W2015492859","https://openalex.org/W2382691761","https://openalex.org/W2179999788","https://openalex.org/W1828556342"],"abstract_inverted_index":{"Basic":[0],"concepts,":[1],"motivation,":[2],"and":[3,22,28],"techniques":[4],"of":[5,25,34],"fault":[6,16],"tolerance":[7],"are":[8],"discussed":[9],"in":[10],"this":[11],"paper.":[12],"The":[13],"topics":[14],"include":[15],"classification,":[17],"redundancy":[18],"techniques,":[19],"reliability":[20],"modeling":[21],"prediction,":[23],"examples":[24],"fault-tolerant":[26],"computers,":[27],"some":[29],"approaches":[30],"to":[31],"the":[32],"problem":[33],"tolerating":[35],"design":[36],"faults.":[37]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":13},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}