{"id":"https://openalex.org/W2409678566","doi":"https://doi.org/10.1109/tbme.2016.2578646","title":"Efficient Simultaneous Reconstruction of Time-Varying Images and Electrode Contact Impedances in Electrical Impedance Tomography","display_name":"Efficient Simultaneous Reconstruction of Time-Varying Images and Electrode Contact Impedances in Electrical Impedance Tomography","publication_year":2016,"publication_date":"2016-06-08","ids":{"openalex":"https://openalex.org/W2409678566","doi":"https://doi.org/10.1109/tbme.2016.2578646","mag":"2409678566","pmid":"https://pubmed.ncbi.nlm.nih.gov/27295649"},"language":"en","primary_location":{"id":"doi:10.1109/tbme.2016.2578646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbme.2016.2578646","pdf_url":null,"source":{"id":"https://openalex.org/S5240358","display_name":"IEEE Transactions on Biomedical Engineering","issn_l":"0018-9294","issn":["0018-9294","1558-2531"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/5145793","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010512992","display_name":"Gregory Boverman","orcid":"https://orcid.org/0000-0002-7223-3714"},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Gregory Boverman","raw_affiliation_strings":["GE Global Research Center, Niskayuna, NY, USA"],"affiliations":[{"raw_affiliation_string":"GE Global Research Center, Niskayuna, NY, USA","institution_ids":["https://openalex.org/I4210134512"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017322317","display_name":"David Isaacson","orcid":null},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Isaacson","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020130465","display_name":"J.C. Newell","orcid":"https://orcid.org/0000-0002-3742-2640"},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jonathan C. Newell","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030451804","display_name":"G.J. Saulnier","orcid":"https://orcid.org/0000-0003-4205-670X"},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gary J. Saulnier","raw_affiliation_strings":["Rensselaer Polytechnic Institute"],"affiliations":[{"raw_affiliation_string":"Rensselaer Polytechnic Institute","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087776229","display_name":"Tzu\u2010Jen Kao","orcid":"https://orcid.org/0000-0001-5907-8409"},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tzu-Jen Kao","raw_affiliation_strings":["GE Global Research Center"],"affiliations":[{"raw_affiliation_string":"GE Global Research Center","institution_ids":["https://openalex.org/I4210134512"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048097429","display_name":"Bruce Amm","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bruce C. Amm","raw_affiliation_strings":["GE Global Research Center"],"affiliations":[{"raw_affiliation_string":"GE Global Research Center","institution_ids":["https://openalex.org/I4210134512"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100328102","display_name":"Xin Wang","orcid":"https://orcid.org/0000-0003-2686-466X"},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Wang","raw_affiliation_strings":["GE Global Research Center"],"affiliations":[{"raw_affiliation_string":"GE Global Research Center","institution_ids":["https://openalex.org/I4210134512"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014021535","display_name":"David Davenport","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David M. Davenport","raw_affiliation_strings":["GE Global Research Center"],"affiliations":[{"raw_affiliation_string":"GE Global Research Center","institution_ids":["https://openalex.org/I4210134512"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042188378","display_name":"David H. Chong","orcid":"https://orcid.org/0000-0002-2013-1935"},"institutions":[{"id":"https://openalex.org/I2799503643","display_name":"Columbia University Irving Medical Center","ror":"https://ror.org/01esghr10","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2799503643"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David H. Chong","raw_affiliation_strings":["Division of Pulmonary, Allergy, and Critical Care Medicine, Columbia University Medical Center"],"affiliations":[{"raw_affiliation_string":"Division of Pulmonary, Allergy, and Critical Care Medicine, Columbia University Medical Center","institution_ids":["https://openalex.org/I2799503643"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057433754","display_name":"Rakesh Sahni","orcid":null},"institutions":[{"id":"https://openalex.org/I1294429298","display_name":"Morgan Stanley Children's Hospital","ror":"https://ror.org/016m8pd54","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I1294429298","https://openalex.org/I1340179700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rakesh Sahni","raw_affiliation_strings":["Division of Neonatology, Morgan Stanley Childrens Hospital of New York Presbyterian"],"affiliations":[{"raw_affiliation_string":"Division of Neonatology, Morgan Stanley Childrens Hospital of New York Presbyterian","institution_ids":["https://openalex.org/I1294429298"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111979549","display_name":"Jeffrey Ashe","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeffrey M. Ashe","raw_affiliation_strings":["GE Global Research Center"],"affiliations":[{"raw_affiliation_string":"GE Global Research Center","institution_ids":["https://openalex.org/I4210134512"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5010512992"],"corresponding_institution_ids":["https://openalex.org/I4210134512"],"apc_list":null,"apc_paid":null,"fwci":2.4236,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.89559629,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"64","issue":"4","first_page":"795","last_page":"806"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12279","display_name":"Body Composition Measurement Techniques","score":0.9775999784469604,"subfield":{"id":"https://openalex.org/subfields/2737","display_name":"Physiology"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9708999991416931,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8884291648864746},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5910277366638184},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5776544809341431},{"id":"https://openalex.org/keywords/regularization","display_name":"Regularization (linguistics)","score":0.49841785430908203},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.48256340622901917},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.4651898443698883},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.45703139901161194},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.4396049678325653},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38646289706230164},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3758874535560608},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.32790008187294006},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.31566986441612244},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2906099557876587},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2725086510181427},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18551146984100342},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.16241911053657532},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.12042617797851562}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8884291648864746},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5910277366638184},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5776544809341431},{"id":"https://openalex.org/C2776135515","wikidata":"https://www.wikidata.org/wiki/Q17143721","display_name":"Regularization (linguistics)","level":2,"score":0.49841785430908203},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.48256340622901917},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.4651898443698883},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.45703139901161194},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.4396049678325653},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38646289706230164},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3758874535560608},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.32790008187294006},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.31566986441612244},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2906099557876587},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2725086510181427},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18551146984100342},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16241911053657532},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.12042617797851562},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D007090","descriptor_name":"Image Interpretation, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D007090","descriptor_name":"Image Interpretation, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D007090","descriptor_name":"Image Interpretation, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D010992","descriptor_name":"Plethysmography, Impedance","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D010992","descriptor_name":"Plethysmography, Impedance","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D010992","descriptor_name":"Plethysmography, Impedance","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D010992","descriptor_name":"Plethysmography, Impedance","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D010992","descriptor_name":"Plethysmography, Impedance","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D010992","descriptor_name":"Plethysmography, Impedance","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D012680","descriptor_name":"Sensitivity and Specificity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012680","descriptor_name":"Sensitivity and Specificity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012680","descriptor_name":"Sensitivity and Specificity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019544","descriptor_name":"Equipment Failure Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":3,"locations":[{"id":"doi:10.1109/tbme.2016.2578646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbme.2016.2578646","pdf_url":null,"source":{"id":"https://openalex.org/S5240358","display_name":"IEEE Transactions on Biomedical Engineering","issn_l":"0018-9294","issn":["0018-9294","1558-2531"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Engineering","raw_type":"journal-article"},{"id":"pmid:27295649","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/27295649","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on bio-medical engineering","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:5145793","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/5145793","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Biomed Eng","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:pubmedcentral.nih.gov:5145793","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/5145793","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Biomed Eng","raw_type":"Text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1377527118","display_name":null,"funder_award_id":"1R01HL109854","funder_id":"https://openalex.org/F4320332161","funder_display_name":"National Institutes of Health"}],"funders":[{"id":"https://openalex.org/F4320332161","display_name":"National Institutes of Health","ror":"https://ror.org/01cwqze88"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W613352991","https://openalex.org/W1880776999","https://openalex.org/W1971508657","https://openalex.org/W1976112850","https://openalex.org/W1977271127","https://openalex.org/W1986228287","https://openalex.org/W1990381576","https://openalex.org/W2002606334","https://openalex.org/W2010923301","https://openalex.org/W2031604650","https://openalex.org/W2031973565","https://openalex.org/W2045301133","https://openalex.org/W2049108997","https://openalex.org/W2049272598","https://openalex.org/W2051423737","https://openalex.org/W2052625285","https://openalex.org/W2053510218","https://openalex.org/W2072195141","https://openalex.org/W2085134468","https://openalex.org/W2104197600","https://openalex.org/W2128648870","https://openalex.org/W2140796340","https://openalex.org/W2150502135","https://openalex.org/W2156718197","https://openalex.org/W2158959733","https://openalex.org/W2163674403","https://openalex.org/W2169496192","https://openalex.org/W6682755970"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2902419700","https://openalex.org/W2537891456","https://openalex.org/W2553917976","https://openalex.org/W2000128178","https://openalex.org/W2093495347","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886"],"abstract_inverted_index":{"Results":[0],"are":[1],"shown":[2],"using":[3],"data":[4],"from":[5,10],"a":[6,11],"normal":[7],"subject":[8],"and":[9,35],"clinical":[12],"intensive":[13],"care":[14],"unit":[15],"patient,":[16],"both":[17],"acquired":[18],"with":[19],"the":[20],"GE":[21],"GENESIS":[22],"prototype":[23],"EIT":[24],"system,":[25],"demonstrating":[26],"significantly":[27],"reduced":[28],"boundary":[29],"artifacts":[30],"due":[31],"to":[32],"electrode":[33],"drift":[34],"motion":[36],"artifact.":[37]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}