{"id":"https://openalex.org/W4386078203","doi":"https://doi.org/10.1109/tbcas.2023.3307500","title":"Flexi-EIT: A Flexible and Reconfigurable Active Electrode Electrical Impedance Tomography System","display_name":"Flexi-EIT: A Flexible and Reconfigurable Active Electrode Electrical Impedance Tomography System","publication_year":2023,"publication_date":"2023-08-22","ids":{"openalex":"https://openalex.org/W4386078203","doi":"https://doi.org/10.1109/tbcas.2023.3307500","pmid":"https://pubmed.ncbi.nlm.nih.gov/37607145"},"language":"en","primary_location":{"id":"doi:10.1109/tbcas.2023.3307500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2023.3307500","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100407087","display_name":"Chao Wang","orcid":"https://orcid.org/0000-0003-0526-0250"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chao Wang","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022867604","display_name":"Wangzilu Lu","orcid":"https://orcid.org/0000-0003-0046-9004"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wangzilu Lu","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078462204","display_name":"Jiajie Huang","orcid":"https://orcid.org/0000-0003-4343-0425"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajie Huang","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101816048","display_name":"Qianyu Guo","orcid":"https://orcid.org/0000-0003-1560-1610"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qianyu Guo","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039030164","display_name":"Ting Zhou","orcid":"https://orcid.org/0000-0001-5887-3590"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ting Zhou","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045329560","display_name":"Jian Zhao","orcid":"https://orcid.org/0000-0003-2140-1236"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Zhao","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100764158","display_name":"Yongfu Li","orcid":"https://orcid.org/0000-0002-6322-8614"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongfu Li","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100407087"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":1.7383,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.84747066,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"18","issue":"1","first_page":"89","last_page":"99"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11700","display_name":"Hemodynamic Monitoring and Therapy","score":0.9632999897003174,"subfield":{"id":"https://openalex.org/subfields/2746","display_name":"Surgery"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.846972644329071},{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.5444047451019287},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49307772517204285},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48776131868362427},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4762808680534363},{"id":"https://openalex.org/keywords/wearable-computer","display_name":"Wearable computer","score":0.4713411033153534},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.4400351941585541},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42690807580947876},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42090290784835815},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3660159409046173},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3505017161369324},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3459929823875427},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2282409965991974},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10886701941490173}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.846972644329071},{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.5444047451019287},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49307772517204285},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48776131868362427},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4762808680534363},{"id":"https://openalex.org/C150594956","wikidata":"https://www.wikidata.org/wiki/Q1334829","display_name":"Wearable computer","level":2,"score":0.4713411033153534},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.4400351941585541},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42690807580947876},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42090290784835815},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3660159409046173},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3505017161369324},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3459929823875427},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2282409965991974},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10886701941490173},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012984","descriptor_name":"Software","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D012984","descriptor_name":"Software","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D012984","descriptor_name":"Software","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D012984","descriptor_name":"Software","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":2,"locations":[{"id":"doi:10.1109/tbcas.2023.3307500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2023.3307500","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},{"id":"pmid:37607145","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/37607145","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on biomedical circuits and systems","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W1972186793","https://openalex.org/W1985115778","https://openalex.org/W1986908433","https://openalex.org/W1987041243","https://openalex.org/W1998025986","https://openalex.org/W2002606334","https://openalex.org/W2014359522","https://openalex.org/W2016024243","https://openalex.org/W2017937412","https://openalex.org/W2064643909","https://openalex.org/W2097353049","https://openalex.org/W2110236180","https://openalex.org/W2112890043","https://openalex.org/W2113761410","https://openalex.org/W2128461556","https://openalex.org/W2523273009","https://openalex.org/W2761309853","https://openalex.org/W2804612897","https://openalex.org/W2806678947","https://openalex.org/W2883322655","https://openalex.org/W2896989731","https://openalex.org/W2900424154","https://openalex.org/W2900481735","https://openalex.org/W2953959093","https://openalex.org/W2958068914","https://openalex.org/W2971518519","https://openalex.org/W3016446888","https://openalex.org/W3025051614","https://openalex.org/W3025108401","https://openalex.org/W3035232708","https://openalex.org/W3097609090","https://openalex.org/W3198632954","https://openalex.org/W4200217483","https://openalex.org/W4224821752","https://openalex.org/W4225108107","https://openalex.org/W4225261496","https://openalex.org/W4226000679","https://openalex.org/W4289536748","https://openalex.org/W4289912260","https://openalex.org/W4289912343","https://openalex.org/W4310172143","https://openalex.org/W4312036187","https://openalex.org/W4312038353","https://openalex.org/W4317796729","https://openalex.org/W4366684177","https://openalex.org/W4381894830","https://openalex.org/W4384198176","https://openalex.org/W6628604793"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2944246511","https://openalex.org/W4285180073","https://openalex.org/W4235437594","https://openalex.org/W3097371773","https://openalex.org/W2362037466","https://openalex.org/W4282829188"],"abstract_inverted_index":{"Electrical":[0],"Impedance":[1],"Tomography":[2],"(EIT)":[3],"systems":[4],"have":[5],"shown":[6],"great":[7],"promise":[8],"in":[9,251],"many":[10],"fields":[11],"such":[12],"as":[13],"real-time":[14,117,237],"wearable":[15,77],"healthcare":[16],"imaging,":[17],"but":[18],"their":[19],"fixed":[20],"number":[21,63],"of":[22,64,109,192,223,254,262],"electrodes":[23],"and":[24,31,43,85,93,107,115,126,140,162,182,225,236,257,265],"placement":[25,87],"locations":[26],"limit":[27],"the":[28,71,105,110,112,116,184,190,193,197,213,246,259],"system's":[29],"flexibility":[30,92],"adaptability":[32],"for":[33,199],"further":[34],"advancement.":[35],"In":[36,144,174],"this":[37],"article,":[38],"we":[39,80],"propose":[40],"a":[41,61,129,208,252],"flexible":[42,72],"reconfigurable":[44,62],"EIT":[45,230,238],"system":[46,194,215,263],"(Flexi-EIT)":[47],"based":[48,76],"on":[49,128,207],"digital":[50],"active":[51],"electrode":[52,78],"(DAE)":[53],"architecture":[54],"to":[55,66,103,159,165,228,248],"address":[56],"these":[57],"limitations.":[58],"By":[59],"integrating":[60],"up":[65,158,164],"32":[67],"replaceable":[68],"DAEs":[69,224],"into":[70],"printed":[73,130],"circuit":[74,131],"(FPC)":[75],"belt,":[79],"can":[81,149,179,216],"enable":[82],"rapid,":[83],"reliable,":[84],"easy":[86],"while":[88,195],"maintaining":[89],"high":[90],"device":[91],"reliability.":[94],"We":[95],"also":[96],"explore":[97],"hardware-software":[98],"co-optimization":[99],"image":[100],"reconstruction":[101],"solutions":[102],"balance":[104,261],"size":[106],"accuracy":[108],"model,":[111],"power":[113],"consumption,":[114],"latency.":[118],"Each":[119],"DAE":[120],"is":[121],"designed":[122],"using":[123],"commercial":[124],"chips":[125],"fabricated":[127],"board":[132],"(PCB)":[133],"measuring":[134],"13.1":[135],"mm":[136,139],"\u00d7":[137],"24.4":[138],"weighing":[141],"2":[142],"grams.":[143],"current":[145,153],"excitation":[146],"mode,":[147,177],"it":[148,178],"provide":[150,229],"programmable":[151],"sinusoidal":[152],"signal":[154,202],"output":[155],"with":[156,220,240],"frequencies":[157],"100":[160],"kHz":[161],"amplitudes":[163],"1":[166],"mA":[167],"<sub>p-p</sub>":[168],"that":[169,212],"meets":[170],"IEC":[171],"60601-1":[172],"standard.":[173],"voltage":[175,187],"acquisition":[176],"pre-amplify,":[180],"filter,":[181],"digitize":[183],"external":[185],"response":[186],"signal,":[188],"improving":[189],"robustness":[191],"avoiding":[196],"need":[198],"subsequent":[200],"analog":[201],"processing":[203],"circuits.":[204],"Measured":[205],"results":[206],"mesh":[209],"phantom":[210],"demonstrate":[211],"Flexi-EIT":[214],"be":[217,249],"easily":[218],"configured":[219],"different":[221],"numbers":[222],"scan":[226],"patterns":[227],"measurement":[231],"frames":[232],"at":[233,241],"38":[234],"fps":[235],"images":[239],"least":[242],"5":[243],"fps,":[244],"showing":[245],"potential":[247],"deployed":[250],"variety":[253],"application":[255],"scenarios":[256],"providing":[258],"optimal":[260],"performance":[264],"hardware":[266],"resource":[267],"usage":[268],"solutions.":[269]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}