{"id":"https://openalex.org/W4283021910","doi":"https://doi.org/10.1109/tbcas.2022.3183856","title":"Super-Resolution Electrochemical Impedance Imaging With a 512 \u00d7 256 CMOS Sensor Array","display_name":"Super-Resolution Electrochemical Impedance Imaging With a 512 \u00d7 256 CMOS Sensor Array","publication_year":2022,"publication_date":"2022-06-16","ids":{"openalex":"https://openalex.org/W4283021910","doi":"https://doi.org/10.1109/tbcas.2022.3183856","pmid":"https://pubmed.ncbi.nlm.nih.gov/35709108"},"language":"en","primary_location":{"id":"doi:10.1109/tbcas.2022.3183856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2022.3183856","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065649006","display_name":"Kangping Hu","orcid":"https://orcid.org/0000-0002-8857-4687"},"institutions":[{"id":"https://openalex.org/I27804330","display_name":"Brown University","ror":"https://ror.org/05gq02987","country_code":"US","type":"education","lineage":["https://openalex.org/I27804330"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kangping Hu","raw_affiliation_strings":["School of Engineering Brown University, Providence, RI, USA"],"affiliations":[{"raw_affiliation_string":"School of Engineering Brown University, Providence, RI, USA","institution_ids":["https://openalex.org/I27804330"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103203033","display_name":"Jason Ho","orcid":"https://orcid.org/0000-0002-5482-2953"},"institutions":[{"id":"https://openalex.org/I27804330","display_name":"Brown University","ror":"https://ror.org/05gq02987","country_code":"US","type":"education","lineage":["https://openalex.org/I27804330"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jason Ho","raw_affiliation_strings":["School of Engineering Brown University, Providence, RI, USA"],"affiliations":[{"raw_affiliation_string":"School of Engineering Brown University, Providence, RI, USA","institution_ids":["https://openalex.org/I27804330"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031233245","display_name":"Jacob K. Rosenstein","orcid":null},"institutions":[{"id":"https://openalex.org/I27804330","display_name":"Brown University","ror":"https://ror.org/05gq02987","country_code":"US","type":"education","lineage":["https://openalex.org/I27804330"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob K. Rosenstein","raw_affiliation_strings":["School of Engineering Brown University, Providence, RI, USA"],"affiliations":[{"raw_affiliation_string":"School of Engineering Brown University, Providence, RI, USA","institution_ids":["https://openalex.org/I27804330"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5065649006"],"corresponding_institution_ids":["https://openalex.org/I27804330"],"apc_list":null,"apc_paid":null,"fwci":2.7536,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.90780846,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"16","issue":"4","first_page":"502","last_page":"510"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.6333363056182861},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5935439467430115},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5915209054946899},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.54329514503479},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5328327417373657},{"id":"https://openalex.org/keywords/microscale-chemistry","display_name":"Microscale chemistry","score":0.521538496017456},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5020854473114014},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4935706853866577},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.48898065090179443},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.457379549741745},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3810492753982544},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35681405663490295},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.32208251953125},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2833247780799866},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24201977252960205},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2164091169834137},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15261605381965637},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14359718561172485}],"concepts":[{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.6333363056182861},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5935439467430115},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5915209054946899},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.54329514503479},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5328327417373657},{"id":"https://openalex.org/C179428855","wikidata":"https://www.wikidata.org/wiki/Q1069216","display_name":"Microscale chemistry","level":2,"score":0.521538496017456},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5020854473114014},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4935706853866577},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.48898065090179443},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.457379549741745},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3810492753982544},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35681405663490295},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.32208251953125},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2833247780799866},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24201977252960205},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2164091169834137},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15261605381965637},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14359718561172485},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C145420912","wikidata":"https://www.wikidata.org/wiki/Q853077","display_name":"Mathematics education","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003952","descriptor_name":"Diagnostic Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003952","descriptor_name":"Diagnostic Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003952","descriptor_name":"Diagnostic Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D055096","descriptor_name":"Optical Devices","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D055096","descriptor_name":"Optical Devices","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D055096","descriptor_name":"Optical Devices","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true}],"locations_count":2,"locations":[{"id":"doi:10.1109/tbcas.2022.3183856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2022.3183856","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},{"id":"pmid:35709108","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/35709108","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on biomedical circuits and systems","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8993007406","display_name":null,"funder_award_id":"2027108","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"}],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320335353","display_name":"National Science Foundation of Sri Lanka","ror":"https://ror.org/010xaa060"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1554924447","https://openalex.org/W1829229878","https://openalex.org/W1997122674","https://openalex.org/W2004752130","https://openalex.org/W2007873071","https://openalex.org/W2021771745","https://openalex.org/W2035414577","https://openalex.org/W2052131898","https://openalex.org/W2067042811","https://openalex.org/W2067670773","https://openalex.org/W2068089524","https://openalex.org/W2093562058","https://openalex.org/W2171502945","https://openalex.org/W2181103586","https://openalex.org/W2738359935","https://openalex.org/W2767261845","https://openalex.org/W2804812090","https://openalex.org/W2883731840","https://openalex.org/W2892649115","https://openalex.org/W2895105428","https://openalex.org/W2900495324","https://openalex.org/W2994111560","https://openalex.org/W2994390622","https://openalex.org/W3013529009","https://openalex.org/W3127796121","https://openalex.org/W3157446350","https://openalex.org/W4200559416","https://openalex.org/W4221004791","https://openalex.org/W4241283749","https://openalex.org/W4280543240"],"related_works":["https://openalex.org/W1966119149","https://openalex.org/W2099015120","https://openalex.org/W2466718138","https://openalex.org/W2347245756","https://openalex.org/W2351312630","https://openalex.org/W2028671992","https://openalex.org/W3139631222","https://openalex.org/W2367429071","https://openalex.org/W2020270528","https://openalex.org/W2183250885"],"abstract_inverted_index":{"Super-resolution":[0],"imaging":[1,38],"is":[2,25,60,80],"a":[3,17,43,69,104],"family":[4],"of":[5,90,131],"techniques":[6],"in":[7,62],"which":[8],"multiple":[9],"lower-resolution":[10],"images":[11,96,148],"can":[12,32,97],"be":[13,34,99],"merged":[14],"to":[15,28,82,102,113,144],"produce":[16,145],"single":[18,136],"image":[19,125],"at":[20],"higher":[21],"resolution.":[22,151],"While":[23],"super-resolution":[24,52,105,124],"often":[26],"applied":[27],"optical":[29],"systems,":[30],"it":[31],"also":[33],"used":[35],"with":[36,68,149],"other":[37],"modalities.":[39],"Here":[40],"we":[41],"demonstrate":[42],"512":[44],"\u00d7":[45,72],"256":[46],"CMOS":[47,66],"sensor":[48,78],"array":[49,79],"for":[50,123],"micro-scale":[51],"electrochemical":[53],"impedance":[54,95,106,147],"spectroscopy":[55],"(SR-EIS)":[56],"imaging.":[57],"The":[58,77],"system":[59],"implemented":[61],"standard":[63],"180":[64],"nm":[65],"technology":[67],"10":[70,73],"\u03bcm":[71,74],"pixel":[75,91],"size.":[76],"designed":[81],"measure":[83],"the":[84,115,141],"mutual":[85],"capacitance":[86],"between":[87],"programmable":[88],"sets":[89],"pairs.":[92],"Multiple":[93],"spatially-resolved":[94],"then":[98],"computationally":[100],"combined":[101],"generate":[103],"image.":[107],"We":[108,127],"use":[109],"finite-element":[110],"electrostatic":[111],"simulations":[112],"support":[114],"proposed":[116],"measurement":[117],"approach":[118],"and":[119],"discuss":[120],"straightforward":[121],"algorithms":[122],"reconstruction.":[126],"present":[128],"experimental":[129],"measurements":[130],"sub-cellular":[132],"permittivity":[133],"distribution":[134],"within":[135],"green":[137],"algae":[138],"cells,":[139],"showing":[140],"sensor's":[142],"capability":[143],"microscale":[146],"sub-pixel":[150]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3}],"updated_date":"2026-04-03T22:45:19.894376","created_date":"2025-10-10T00:00:00"}