{"id":"https://openalex.org/W2781984636","doi":"https://doi.org/10.1109/tbcas.2017.2778288","title":"A 10 MHz Read-Out Chain for Electrical Impedance Tomography","display_name":"A 10 MHz Read-Out Chain for Electrical Impedance Tomography","publication_year":2018,"publication_date":"2018-01-04","ids":{"openalex":"https://openalex.org/W2781984636","doi":"https://doi.org/10.1109/tbcas.2017.2778288","mag":"2781984636","pmid":"https://pubmed.ncbi.nlm.nih.gov/29377810"},"language":"en","primary_location":{"id":"doi:10.1109/tbcas.2017.2778288","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2017.2778288","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087282725","display_name":"Mohammad Takhti","orcid":"https://orcid.org/0000-0002-8564-5240"},"institutions":[{"id":"https://openalex.org/I107672454","display_name":"Dartmouth College","ror":"https://ror.org/049s0rh22","country_code":"US","type":"education","lineage":["https://openalex.org/I107672454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Takhti","raw_affiliation_strings":["Thayer School of Engineering, Dartmouth College, Hanover, USA"],"raw_orcid":"https://orcid.org/0000-0002-8564-5240","affiliations":[{"raw_affiliation_string":"Thayer School of Engineering, Dartmouth College, Hanover, USA","institution_ids":["https://openalex.org/I107672454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034645549","display_name":"Yueh-Ching Teng","orcid":"https://orcid.org/0000-0002-9943-4604"},"institutions":[{"id":"https://openalex.org/I107672454","display_name":"Dartmouth College","ror":"https://ror.org/049s0rh22","country_code":"US","type":"education","lineage":["https://openalex.org/I107672454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yueh-Ching Teng","raw_affiliation_strings":["Thayer School of Engineering, Dartmouth College, Hanover, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thayer School of Engineering, Dartmouth College, Hanover, USA","institution_ids":["https://openalex.org/I107672454"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091505088","display_name":"Kofi Odame","orcid":"https://orcid.org/0000-0002-8519-2392"},"institutions":[{"id":"https://openalex.org/I107672454","display_name":"Dartmouth College","ror":"https://ror.org/049s0rh22","country_code":"US","type":"education","lineage":["https://openalex.org/I107672454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kofi Odame","raw_affiliation_strings":["Thayer School of Engineering, Dartmouth College, Hanover, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thayer School of Engineering, Dartmouth College, Hanover, USA","institution_ids":["https://openalex.org/I107672454"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I107672454"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":1.6993,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.83828336,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"12","issue":"1","first_page":"222","last_page":"230"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9463000297546387,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9417999982833862,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7008086442947388},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6606234312057495},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5086344480514526},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.46796923875808716},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4495835602283478},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4195578396320343},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.36763250827789307},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33920979499816895},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24335381388664246},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22137385606765747}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7008086442947388},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6606234312057495},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5086344480514526},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.46796923875808716},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4495835602283478},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4195578396320343},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36763250827789307},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33920979499816895},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24335381388664246},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22137385606765747}],"mesh":[{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D006801","descriptor_name":"Humans","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true}],"locations_count":2,"locations":[{"id":"doi:10.1109/tbcas.2017.2778288","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2017.2778288","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},{"id":"pmid:29377810","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/29377810","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on biomedical circuits and systems","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4087038975","display_name":null,"funder_award_id":"IIS-1418497","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"}],"funders":[{"id":"https://openalex.org/F4320335353","display_name":"National Science Foundation of Sri Lanka","ror":"https://ror.org/010xaa060"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1536945048","https://openalex.org/W1976631627","https://openalex.org/W1978238763","https://openalex.org/W1981230256","https://openalex.org/W2005681075","https://openalex.org/W2014519391","https://openalex.org/W2022981781","https://openalex.org/W2031845609","https://openalex.org/W2053779241","https://openalex.org/W2055571910","https://openalex.org/W2058871194","https://openalex.org/W2069472142","https://openalex.org/W2082949320","https://openalex.org/W2087004833","https://openalex.org/W2088350283","https://openalex.org/W2090254314","https://openalex.org/W2124929650","https://openalex.org/W2126305878","https://openalex.org/W2128485160","https://openalex.org/W2129374966","https://openalex.org/W2137627159","https://openalex.org/W2147181724","https://openalex.org/W2154847008","https://openalex.org/W2185216795","https://openalex.org/W2296435828","https://openalex.org/W2325094267","https://openalex.org/W2550772329","https://openalex.org/W2567465430","https://openalex.org/W2794970330","https://openalex.org/W4232543063","https://openalex.org/W4237254706","https://openalex.org/W4246195999","https://openalex.org/W4300993850","https://openalex.org/W6701338232","https://openalex.org/W6750216345"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2944246511","https://openalex.org/W2215273690","https://openalex.org/W2553917976","https://openalex.org/W2060278704","https://openalex.org/W2526896022"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,29,92],"design":[4],"and":[5,72,78,119],"implementation":[6],"of":[7,28,50,96,107,126],"a":[8,47,53,63,81],"read-out":[9,44,60,88,114],"chain":[10,89],"for":[11,38,55],"electrical":[12],"impedance":[13],"tomography":[14],"(EIT)":[15],"imaging.":[16],"The":[17,58,86,112],"EIT":[18],"imaging":[19],"approach":[20],"can":[21],"be":[22],"incorporated":[23],"to":[24,99],"take":[25],"spectral":[26],"images":[27],"tissue":[30],"under":[31],"study,":[32],"offering":[33],"an":[34,68,73,103],"affordable,":[35],"portable":[36],"device":[37],"home":[39],"health":[40],"monitoring.":[41],"A":[42],"fast":[43],"channel":[45,61,115],"covering":[46],"wide":[48,93],"range":[49,95],"frequencies":[51],"is":[52,76],"must":[54],"such":[56],"applications.":[57],"proposed":[59,87],"comprising":[62],"programmable":[64],"gain":[65],"instrumentation":[66],"amplifier,":[67],"analog-to-digital":[69],"converter":[70],"(ADC),":[71],"ADC":[74],"driver":[75],"designed":[77],"fabricated":[79],"in":[80],"0.18":[82],"m":[83],"CMOS":[84],"technology.":[85],"operates":[90],"over":[91],"frequency":[94,125],"100":[97],"Hz":[98],"10":[100],"MHz,":[101],"with":[102],"average":[104],"signal-to-noise":[105],"ratio":[106],"more":[108],"than":[109],"60":[110],"dB.":[111],"entire":[113],"consumes":[116],"between":[117],"6.9":[118],"21.8":[120],"mW,":[121],"depending":[122],"on":[123],"its":[124],"operation.":[127]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}