{"id":"https://openalex.org/W2128461556","doi":"https://doi.org/10.1109/tbcas.2012.2199114","title":"Biocompatible, High Precision, Wideband, Improved Howland Current Source With Lead-Lag Compensation","display_name":"Biocompatible, High Precision, Wideband, Improved Howland Current Source With Lead-Lag Compensation","publication_year":2012,"publication_date":"2012-06-20","ids":{"openalex":"https://openalex.org/W2128461556","doi":"https://doi.org/10.1109/tbcas.2012.2199114","mag":"2128461556","pmid":"https://pubmed.ncbi.nlm.nih.gov/23853280"},"language":"en","primary_location":{"id":"doi:10.1109/tbcas.2012.2199114","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2012.2199114","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103554099","display_name":"Aaron S. Tucker","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aaron S. Tucker","raw_affiliation_strings":["J. Crayton Pruitt Family Department of Biomedical Engineering, University of Florida, Gainesville, FL 32611, USA. aarontucker@ufl.edu","J. Crayton Pruitt Family Dept. of Biomed. Eng., Univ. of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"J. Crayton Pruitt Family Department of Biomedical Engineering, University of Florida, Gainesville, FL 32611, USA. aarontucker@ufl.edu","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"J. Crayton Pruitt Family Dept. of Biomed. Eng., Univ. of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082201975","display_name":"R.M. Fox","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert M. Fox","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","Dept. of Electr. & Comput. Eng., University of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053658175","display_name":"Rosalind Sadleir","orcid":"https://orcid.org/0000-0001-9789-2129"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rosalind J. Sadleir","raw_affiliation_strings":["Department of Biomedical Engineering, University of Florida, Gainesville, FL, USA","J. Crayton Pruitt Family Dept. of Biomed. Eng., Univ. of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biomedical Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"J. Crayton Pruitt Family Dept. of Biomed. Eng., Univ. of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":5.2463,"has_fulltext":false,"cited_by_count":125,"citation_normalized_percentile":{"value":0.95953549,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"7","issue":"1","first_page":"63","last_page":"70"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10429","display_name":"EEG and Brain-Computer Interfaces","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2805","display_name":"Cognitive Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.7160035967826843},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.6362200379371643},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6298399567604065},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.6048159003257751},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.5481702089309692},{"id":"https://openalex.org/keywords/frequency-compensation","display_name":"Frequency compensation","score":0.537352442741394},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.529171884059906},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5226202607154846},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.522057056427002},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46873554587364197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4545128345489502},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.4464973211288452},{"id":"https://openalex.org/keywords/input-impedance","display_name":"Input impedance","score":0.42458975315093994},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.37828773260116577},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3578631281852722},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2392500638961792},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1350398063659668}],"concepts":[{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.7160035967826843},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.6362200379371643},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6298399567604065},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.6048159003257751},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.5481702089309692},{"id":"https://openalex.org/C131782439","wikidata":"https://www.wikidata.org/wiki/Q1455581","display_name":"Frequency compensation","level":4,"score":0.537352442741394},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.529171884059906},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5226202607154846},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.522057056427002},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46873554587364197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4545128345489502},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.4464973211288452},{"id":"https://openalex.org/C26262908","wikidata":"https://www.wikidata.org/wiki/Q1307489","display_name":"Input impedance","level":3,"score":0.42458975315093994},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.37828773260116577},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3578631281852722},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2392500638961792},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1350398063659668},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true}],"locations_count":2,"locations":[{"id":"doi:10.1109/tbcas.2012.2199114","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2012.2199114","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},{"id":"pmid:23853280","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23853280","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on biomedical circuits and systems","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6499999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1979512319","https://openalex.org/W2009534827","https://openalex.org/W2040324389","https://openalex.org/W2048564825","https://openalex.org/W2051656128","https://openalex.org/W2058355111","https://openalex.org/W2059644152","https://openalex.org/W2059847118","https://openalex.org/W2069937194","https://openalex.org/W2080518986","https://openalex.org/W2089418022","https://openalex.org/W2111986275","https://openalex.org/W2116467980","https://openalex.org/W2126305878","https://openalex.org/W2127519209","https://openalex.org/W2135285744","https://openalex.org/W2151411838","https://openalex.org/W2161418754","https://openalex.org/W2165444531","https://openalex.org/W2897807752","https://openalex.org/W3147616483"],"related_works":["https://openalex.org/W3210784113","https://openalex.org/W2058355111","https://openalex.org/W2979500949","https://openalex.org/W2495256802","https://openalex.org/W2537138046","https://openalex.org/W2318544294","https://openalex.org/W1506355656","https://openalex.org/W1985007418","https://openalex.org/W2128461556","https://openalex.org/W120185086"],"abstract_inverted_index":{"The":[0],"Howland":[1,32],"current":[2,23,46,83,104],"pump":[3],"is":[4,33],"a":[5,34,60,64,94],"popular":[6],"bioelectrical":[7],"circuit,":[8],"useful":[9],"for":[10,73,86,123],"delivering":[11],"precise":[12],"electrical":[13],"currents.":[14],"In":[15],"applications":[16],"requiring":[17],"high":[18,78],"precision":[19,42,62,122],"delivery":[20],"of":[21,30,37,43,111,143],"alternating":[22],"to":[24,58,99,115],"biological":[25],"loads,":[26],"the":[27,31,41,44,48,53,131,135,141],"output":[28,80,109,136],"impedance":[29,110],"critical":[35],"figure":[36],"merit":[38],"that":[39],"limits":[40],"delivered":[45],"when":[47],"load":[49],"changes.":[50],"We":[51,67,127],"explain":[52],"minimum":[54],"operational":[55],"amplifier":[56],"requirements":[57],"meet":[59],"target":[61],"over":[63],"wide":[65],"bandwidth.":[66],"also":[68],"discuss":[69],"effective":[70],"compensation":[71],"strategies":[72],"achieving":[74],"stability":[75],"without":[76],"sacrificing":[77],"frequency":[79],"impedance.":[81],"A":[82],"source":[84,105],"suitable":[85],"Electrical":[87],"Impedance":[88],"Tomography":[89],"(EIT)":[90],"was":[91],"simulated":[92],"using":[93],"SPICE":[95],"model,":[96],"and":[97,138],"built":[98],"verify":[100],"stable":[101,108],"operation.":[102],"This":[103],"design":[106],"had":[107],"3.3":[112],"M\u03a9":[113],"up":[114],"200":[116],"kHz,":[117],"which":[118],"provides":[119],"80":[120],"dB":[121],"our":[124],"EIT":[125],"application.":[126],"conclude":[128],"by":[129],"noting":[130],"difficulty":[132],"in":[133],"measuring":[134],"impedance,":[137],"advise":[139],"verifying":[140],"plausibility":[142],"measurements":[144],"against":[145],"theoretical":[146],"limitations.":[147]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":14},{"year":2018,"cited_by_count":15},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":9},{"year":2013,"cited_by_count":6}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}