{"id":"https://openalex.org/W2075617494","doi":"https://doi.org/10.1109/tbcas.2012.2192273","title":"Noise Analysis and Performance Comparison of Low Current Measurement Systems for Biomedical Applications","display_name":"Noise Analysis and Performance Comparison of Low Current Measurement Systems for Biomedical Applications","publication_year":2013,"publication_date":"2013-02-01","ids":{"openalex":"https://openalex.org/W2075617494","doi":"https://doi.org/10.1109/tbcas.2012.2192273","mag":"2075617494","pmid":"https://pubmed.ncbi.nlm.nih.gov/23853279"},"language":"en","primary_location":{"id":"doi:10.1109/tbcas.2012.2192273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2012.2192273","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100763112","display_name":"Dong\u2010Soo Kim","orcid":"https://orcid.org/0000-0001-7684-841X"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dongsoo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, New Haven, CT 06520, USA. dongsoo@gmail.com","Aptina Imaging, San Jose, CA, USA","Department of Electrical Engineering, Yale University, New Haven, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven, CT 06520, USA. dongsoo@gmail.com","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Aptina Imaging, San Jose, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven, CT, USA","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110481877","display_name":"Barbara L. Goldstein","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Goldstein","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, New Haven, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven, CT, USA","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065735444","display_name":"Wei Tang","orcid":"https://orcid.org/0000-0003-1925-0782"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wei Tang","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, New Haven, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven, CT, USA","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109165393","display_name":"F.J. Sigworth","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. J. Sigworth","raw_affiliation_strings":["Department of Biomedical Engineering, Yale University, New Haven, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biomedical Engineering, Yale University, New Haven, CT, USA","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056573998","display_name":"Eugenio Culurciello","orcid":"https://orcid.org/0000-0002-9918-3956"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Culurciello","raw_affiliation_strings":["Department of Biomedical Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biomedical Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100763112"],"corresponding_institution_ids":["https://openalex.org/I32971472"],"apc_list":null,"apc_paid":null,"fwci":6.7679,"has_fulltext":false,"cited_by_count":103,"citation_normalized_percentile":{"value":0.97325996,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"7","issue":"1","first_page":"52","last_page":"62"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6775069236755371},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6207549571990967},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5393926501274109},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5342098474502563},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5054504871368408},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4828979969024658},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4787675440311432},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.47486352920532227},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46461522579193115},{"id":"https://openalex.org/keywords/instrumentation-amplifier","display_name":"Instrumentation amplifier","score":0.45388728380203247},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4220942258834839},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.42206281423568726},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.40280017256736755},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.3624042272567749},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3433178663253784},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11423662304878235},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10727187991142273}],"concepts":[{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6775069236755371},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6207549571990967},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5393926501274109},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5342098474502563},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5054504871368408},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4828979969024658},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4787675440311432},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.47486352920532227},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46461522579193115},{"id":"https://openalex.org/C89123640","wikidata":"https://www.wikidata.org/wiki/Q1523756","display_name":"Instrumentation amplifier","level":5,"score":0.45388728380203247},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4220942258834839},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.42206281423568726},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.40280017256736755},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.3624042272567749},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3433178663253784},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11423662304878235},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10727187991142273},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[{"descriptor_ui":"D001698","descriptor_name":"Biomedical Engineering","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D001698","descriptor_name":"Biomedical Engineering","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D001698","descriptor_name":"Biomedical Engineering","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":false},{"descriptor_ui":"D001698","descriptor_name":"Biomedical Engineering","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D001698","descriptor_name":"Biomedical Engineering","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D001698","descriptor_name":"Biomedical Engineering","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D025802","descriptor_name":"Electric Capacitance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D025802","descriptor_name":"Electric Capacitance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D025802","descriptor_name":"Electric Capacitance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D059629","descriptor_name":"Signal-To-Noise Ratio","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D059629","descriptor_name":"Signal-To-Noise Ratio","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D059629","descriptor_name":"Signal-To-Noise Ratio","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true}],"locations_count":2,"locations":[{"id":"doi:10.1109/tbcas.2012.2192273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tbcas.2012.2192273","pdf_url":null,"source":{"id":"https://openalex.org/S80299757","display_name":"IEEE Transactions on Biomedical Circuits and Systems","issn_l":"1932-4545","issn":["1932-4545","1940-9990"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Biomedical Circuits and Systems","raw_type":"journal-article"},{"id":"pmid:23853279","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23853279","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on biomedical circuits and systems","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W118813204","https://openalex.org/W1491213155","https://openalex.org/W1566916904","https://openalex.org/W1975635963","https://openalex.org/W1980873505","https://openalex.org/W1989057441","https://openalex.org/W1997555547","https://openalex.org/W2009667219","https://openalex.org/W2025583382","https://openalex.org/W2032911902","https://openalex.org/W2046447268","https://openalex.org/W2052272843","https://openalex.org/W2073295255","https://openalex.org/W2077609143","https://openalex.org/W2089244477","https://openalex.org/W2093262630","https://openalex.org/W2093562058","https://openalex.org/W2102375473","https://openalex.org/W2105298634","https://openalex.org/W2106436636","https://openalex.org/W2113463561","https://openalex.org/W2115497568","https://openalex.org/W2116913626","https://openalex.org/W2117554472","https://openalex.org/W2119366300","https://openalex.org/W2120890726","https://openalex.org/W2128122444","https://openalex.org/W2131716718","https://openalex.org/W2133849398","https://openalex.org/W2148880959","https://openalex.org/W2153943025","https://openalex.org/W2155126634","https://openalex.org/W2169455211","https://openalex.org/W2475887778","https://openalex.org/W2534257307","https://openalex.org/W4236201062"],"related_works":["https://openalex.org/W3142313280","https://openalex.org/W2059048848","https://openalex.org/W975945850","https://openalex.org/W2557839727","https://openalex.org/W2969719637","https://openalex.org/W51629545","https://openalex.org/W2093650582","https://openalex.org/W2409756458","https://openalex.org/W2381412985","https://openalex.org/W2782580437"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"report":[4],"on":[5,56],"the":[6,57,61,65,74,80,100,107,114,124,137],"noise":[7,37,71],"analysis":[8,38,59],"of":[9,76,88,126],"low":[10,32,77,127],"current":[11,28,33,78,108,128],"measurement":[12,34,48,63,75],"systems":[13],"for":[14,31,39,73,131],"biomedical":[15,41,132],"applications":[16,42],"and":[17,27,45,60,106,134],"their":[18],"fundamental":[19],"limits.":[20],"We":[21],"analyzed":[22],"resistive":[23,101],"feedback,":[24],"capacitive":[25,66,83],"feedback":[26,67,84,102],"amplifier":[29],"circuits":[30],"systems.":[35],"Detailed":[36],"different":[40],"are":[43],"presented":[44],"matched":[46],"with":[47,141],"data":[49],"using":[50],"a":[51,94],"0.5-\u03bcm":[52],"fabrication":[53],"process.":[54],"Based":[55],"theoretical":[58],"corresponding":[62],"results,":[64],"system":[68,130],"provides":[69,103,110,119],"better":[70],"performance":[72,125,139],"than":[79],"others.":[81],"The":[82],"circuit":[85],"is":[86],"capable":[87],"measuring":[89,129],"750":[90],"fA":[91],"RMS":[92],"at":[93,113],"10":[95],"kHz":[96],"sampling":[97],"rate,":[98],"whereas":[99],"4":[104],"pA":[105,112],"conveyor":[109],"600":[111],"same":[115],"bandwidth.":[116],"This":[117],"paper":[118],"design":[120],"guidelines":[121],"to":[122,135],"maximize":[123],"instrumentation":[133],"provide":[136],"best":[138],"available":[140],"CMOS":[142],"technologies.":[143]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":5}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}