{"id":"https://openalex.org/W7160331777","doi":"https://doi.org/10.1109/tase.2026.3690624","title":"Interactive Residual Domain Adaptation Networks for Partial Transfer Industrial Fault Diagnosis","display_name":"Interactive Residual Domain Adaptation Networks for Partial Transfer Industrial Fault Diagnosis","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7160331777","doi":"https://doi.org/10.1109/tase.2026.3690624"},"language":null,"primary_location":{"id":"doi:10.1109/tase.2026.3690624","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tase.2026.3690624","pdf_url":null,"source":{"id":"https://openalex.org/S34881539","display_name":"IEEE Transactions on Automation Science and Engineering","issn_l":"1545-5955","issn":["1545-5955","1558-3783"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Automation Science and Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002762307","display_name":"Gecheng Chen","orcid":"https://orcid.org/0000-0002-4466-6416"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gecheng Chen","raw_affiliation_strings":["School of Artificial Intelligence, Shenzhen University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-4466-6416","affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023403859","display_name":"Zheng Luo","orcid":"https://orcid.org/0000-0001-9666-8184"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Zheng Luo","raw_affiliation_strings":["Faculty of Engineering, The University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, The University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135348263","display_name":"Zeyu Yang","orcid":"https://orcid.org/0000-0003-0253-9053"},"institutions":[{"id":"https://openalex.org/I3018263800","display_name":"Huzhou University","ror":"https://ror.org/04mvpxy20","country_code":"CN","type":"education","lineage":["https://openalex.org/I3018263800"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zeyu Yang","raw_affiliation_strings":["Zhejiang Key Laboratory of Industrial Solid Waste Thermal Hydrolysis Technology and Intelligent Equipment, Huzhou Key Laboratory of Intelligent Sensing and Optimal Control for Industrial Systems, School of Engineering, Huzhou University, Huzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-0253-9053","affiliations":[{"raw_affiliation_string":"Zhejiang Key Laboratory of Industrial Solid Waste Thermal Hydrolysis Technology and Intelligent Equipment, Huzhou Key Laboratory of Intelligent Sensing and Optimal Control for Industrial Systems, School of Engineering, Huzhou University, Huzhou, China","institution_ids":["https://openalex.org/I3018263800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135407709","display_name":"Kai Wang","orcid":"https://orcid.org/0000-0003-1396-9825"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Wang","raw_affiliation_strings":["School of Automation, Central South University, Changsha, Hunan, China"],"raw_orcid":"https://orcid.org/0000-0003-1396-9825","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, Hunan, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135402892","display_name":"Xinkai Chen","orcid":"https://orcid.org/0009-0005-8751-2176"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinkai Chen","raw_affiliation_strings":["School of Artificial Intelligence, Shenzhen University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0009-0005-8751-2176","affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082128805","display_name":"J W Li","orcid":null},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianqiang Li","raw_affiliation_strings":["School of Artificial Intelligence, Shenzhen University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-2208-962X","affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060564734","display_name":"Chengwen Luo","orcid":"https://orcid.org/0000-0003-0293-0781"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengwen Luo","raw_affiliation_strings":["School of Artificial Intelligence, Shenzhen University, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0003-0293-0781","affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence, Shenzhen University, Shenzhen, China","institution_ids":["https://openalex.org/I180726961"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.50447133,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"23","issue":null,"first_page":"9670","last_page":"9682"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.6959999799728394,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.6959999799728394,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.05429999902844429,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.03759999945759773,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.5913000106811523},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.5103999972343445},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4702000021934509},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4336000084877014},{"id":"https://openalex.org/keywords/transfer","display_name":"Transfer (computing)","score":0.39640000462532043},{"id":"https://openalex.org/keywords/transfer-function","display_name":"Transfer function","score":0.3686999976634979},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.3231000006198883},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.3181999921798706}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6089000105857849},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.5913000106811523},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.5103999972343445},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4702000021934509},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.43549999594688416},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4336000084877014},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.39640000462532043},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3790000081062317},{"id":"https://openalex.org/C81299745","wikidata":"https://www.wikidata.org/wiki/Q334269","display_name":"Transfer function","level":2,"score":0.3686999976634979},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35740000009536743},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.3231000006198883},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.3181999921798706},{"id":"https://openalex.org/C2776434776","wikidata":"https://www.wikidata.org/wiki/Q19246213","display_name":"Domain adaptation","level":3,"score":0.3151000142097473},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.31279999017715454},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3109999895095825},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.30660000443458557},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.2840000092983246},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.2833999991416931},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.2727000117301941},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.26570001244544983},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.2615000009536743},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.2574000060558319},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.2565999925136566},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.251800000667572}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tase.2026.3690624","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tase.2026.3690624","pdf_url":null,"source":{"id":"https://openalex.org/S34881539","display_name":"IEEE Transactions on Automation Science and Engineering","issn_l":"1545-5955","issn":["1545-5955","1558-3783"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Automation Science and Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2137300154","display_name":null,"funder_award_id":"62503337","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2834454934","display_name":null,"funder_award_id":"2023YFB4704900","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G3499623330","display_name":null,"funder_award_id":"62373378","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6499112581","display_name":null,"funder_award_id":"U25A20478","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6890799570","display_name":null,"funder_award_id":"62422312","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334059","display_name":"Research Computing Center, University of Chicago","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"The":[0],"partial":[1],"domain":[2,23,104,122,133],"adaptation":[3,24,53,123],"(PDA)":[4],"challenge":[5],"is":[6,117],"a":[7,87,107,120,141,162],"prevalent":[8],"issue":[9,66],"in":[10,50,60,174],"industrial":[11],"fault":[12],"diagnosis.":[13],"Current":[14],"PDA":[15,61,89,112],"approaches":[16],"primarily":[17],"rely":[18],"on":[19],"adversarial":[20,51],"learning":[21,148],"for":[22,102,110,166],"and":[25,134],"use":[26],"reweighting":[27,72],"strategies":[28,73],"to":[29,46,56,105,126,156],"exclude":[30],"source":[31],"samples":[32],"deemed":[33],"outliers.":[34],"However,":[35],"the":[36,67,111,128,136,151,168,180,184],"transferability":[37],"of":[38,131,153,183],"features":[39],"diminishes":[40],"from":[41,76],"general":[42],"feature":[43],"extraction":[44],"layers":[45,49],"higher":[47],"task-specific":[48],"learning-based":[52],"modules,":[54],"leading":[55],"significant":[57],"negative":[58],"transfer":[59],"settings.":[62],"We":[63,159],"term":[64],"this":[65,83],"adaptation-discrimination":[68],"paradox":[69],"(ADP).":[70],"Furthermore,":[71],"often":[74],"suffer":[75],"unreliable":[77],"pseudo-labels,":[78],"compromising":[79],"their":[80],"effectiveness.":[81],"In":[82],"work,":[84],"we":[85,139],"propose":[86],"novel":[88],"framework":[90],"called":[91],"Interactive":[92],"Residual":[93],"Domain":[94],"Adaptation":[95],"Networks":[96],"(IRDAN),":[97],"which":[98],"introduces":[99],"domain-wise":[100,115],"models":[101],"each":[103,132],"provide":[106],"new":[108],"perspective":[109],"challenge.":[113],"Each":[114],"model":[116],"equipped":[118],"with":[119],"residual":[121],"(RDA)":[124],"block":[125],"preserve":[127],"discriminative":[129],"structure":[130],"mitigate":[135],"ADP.":[137],"Additionally,":[138],"introduce":[140],"confident":[142],"information":[143],"flow":[144],"via":[145],"an":[146],"interactive":[147],"strategy,":[149],"training":[150],"modules":[152],"IRDAN":[154],"sequentially":[155],"avoid":[157],"cross-interference.":[158],"also":[160],"establish":[161],"reliable":[163],"stopping":[164],"criterion":[165],"selecting":[167],"best-performing":[169],"model,":[170],"ensuring":[171],"practical":[172],"usability":[173],"real-world":[175],"applications.":[176],"Experiments":[177],"have":[178],"demonstrated":[179],"superior":[181],"performance":[182],"proposed":[185],"IRDAN.":[186]},"counts_by_year":[],"updated_date":"2026-05-22T06:13:13.366637","created_date":"2026-05-06T00:00:00"}