{"id":"https://openalex.org/W7082644041","doi":"https://doi.org/10.1109/taes.2025.3612904","title":"QtNURAV: A Robust Latch Design With Quintuple Node Upset Recovery and Algorithm Based Verifications for Aerospace Applications","display_name":"QtNURAV: A Robust Latch Design With Quintuple Node Upset Recovery and Algorithm Based Verifications for Aerospace Applications","publication_year":2025,"publication_date":"2025-09-22","ids":{"openalex":"https://openalex.org/W7082644041","doi":"https://doi.org/10.1109/taes.2025.3612904"},"language":"en","primary_location":{"id":"doi:10.1109/taes.2025.3612904","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2025.3612904","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-05372881/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0024-987X","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jing Li","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Han Bao","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Han Bao","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Tianming Ni","orcid":"https://orcid.org/0000-0001-6272-8660"},"institutions":[{"id":"https://openalex.org/I70908550","display_name":"Anhui Polytechnic University","ror":"https://ror.org/041sj0284","country_code":"CN","type":"education","lineage":["https://openalex.org/I70908550"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianming Ni","raw_affiliation_strings":["School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China"],"raw_orcid":"https://orcid.org/0000-0001-6272-8660","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China","institution_ids":["https://openalex.org/I70908550"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-8695-4478","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Bin Liang","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liang","raw_affiliation_strings":["School of Computer Science and Technology, National University of Defense Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["LIRMM Lab, University of Montpellier/CNRS, Montpellier, France"],"raw_orcid":"https://orcid.org/0000-0003-0722-8772","affiliations":[{"raw_affiliation_string":"LIRMM Lab, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":null,"display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Department of Computer Science and Networks, Kyushu Institute of Technology, Fukuoka, Japan"],"raw_orcid":"https://orcid.org/0000-0001-8305-604X","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Networks, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.396,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.88624653,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"61","issue":"6","first_page":"18543","last_page":"18554"},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T12157","display_name":"Geochemistry and Geologic Mapping","score":0.6589999794960022,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12157","display_name":"Geochemistry and Geologic Mapping","score":0.6589999794960022,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13067","display_name":"Geological Modeling and Analysis","score":0.026599999517202377,"subfield":{"id":"https://openalex.org/subfields/1906","display_name":"Geochemistry and Petrology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14311","display_name":"Electrical and Electromagnetic Research","score":0.019700000062584877,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.8472999930381775},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6850000023841858},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5688999891281128},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.515999972820282},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.49070000648498535},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.44620001316070557},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4404999911785126},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43869999051094055},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3977999985218048}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.8472999930381775},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6850000023841858},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5688999891281128},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5666999816894531},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.536899983882904},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.515999972820282},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.49070000648498535},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.44620001316070557},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4404999911785126},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43869999051094055},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3977999985218048},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.3862000107765198},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.37860000133514404},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3718000054359436},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.3617999851703644},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.34060001373291016},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.32499998807907104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3240000009536743},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3197000026702881},{"id":"https://openalex.org/C106516650","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm design","level":2,"score":0.30489999055862427},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.304500013589859},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.2987000048160553},{"id":"https://openalex.org/C2776391166","wikidata":"https://www.wikidata.org/wiki/Q7236873","display_name":"Power\u2013delay product","level":4,"score":0.2824000120162964},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.26980000734329224},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.26249998807907104},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26179999113082886},{"id":"https://openalex.org/C90201813","wikidata":"https://www.wikidata.org/wiki/Q202957","display_name":"Schmitt trigger","level":3,"score":0.2565999925136566},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.251800000667572}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/taes.2025.3612904","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2025.3612904","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-05372881v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-05372881","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-05372881/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems, 2025, pp.1-12. ⟨10.1109/TAES.2025.3612904⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-05372881v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-05372881","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-05372881/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems, 2025, pp.1-12. ⟨10.1109/TAES.2025.3612904⟩","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2595105183","display_name":null,"funder_award_id":"62274052","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2747975400","display_name":null,"funder_award_id":"62027815","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7059867690","display_name":null,"funder_award_id":"62174001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7082644041.pdf","grobid_xml":"https://content.openalex.org/works/W7082644041.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"With":[0],"the":[1,9,32,129,134,146,170],"continuous":[2],"scaling":[3],"of":[4,34,45,137],"transistor":[5],"feature":[6],"sizes":[7],"to":[8,18,30,89,121,163],"deep":[10],"nano-scale,":[11],"modern":[12],"circuits":[13],"have":[14],"become":[15],"increasingly":[16],"sensitive":[17],"radiation-induced":[19],"soft":[20],"errors,":[21],"such":[22],"as":[23],"multiple":[24,42],"node":[25,54,60],"upset":[26,55],"(MNU).":[27],"Especially,":[28],"due":[29],"charge-sharing,":[31],"striking":[33],"one":[35],"high-energy":[36],"radiative":[37],"particle":[38],"can":[39,149],"simultaneously":[40],"impact":[41],"adjacent":[43],"nodes":[44],"a":[46,84],"highly":[47],"integrated":[48],"circuit":[49],"causing":[50],"MNU,":[51],"e.g.,":[52],"quintuple":[53],"(QtNU)":[56],"and":[57,70,155,159,177,182,189],"even":[58],"more":[59],"upsets.":[61],"Existing":[62],"MNU-hardened":[63],"latch":[64,105,148,173],"designs":[65],"cannot":[66],"provide":[67],"QtNU":[68,92,100,135,154,175],"recovery,":[69],"their":[71],"robustness":[72],"verification":[73,102,131],"heavily":[74],"depends":[75],"on":[76,142,191],"electronic-design-automation":[77],"tools.":[78],"In":[79],"this":[80],"paper,":[81],"we":[82],"present":[83],"robust":[85],"latch,":[86],"namely":[87],"QtNURAV,":[88],"protect":[90],"against":[91],"for":[93],"aerospace":[94],"applications,":[95],"along":[96],"with":[97],"an":[98],"algorithm-based":[99],"recovery":[101,136,176],"method.":[103],"The":[104,125],"mainly":[106],"employs":[107],"four":[108],"parallel":[109],"dual-interlocked":[110],"cells":[111],"(DICEs)":[112],"that":[113,145],"feed":[114],"each":[115],"other":[116],"through":[117],"eight":[118],"3-input":[119],"inverters":[120],"robustly":[122],"retain":[123],"values.":[124],"proposed":[126,171],"algorithm":[127],"simplifies":[128],"fault-tolerance":[130],"process,":[132],"demonstrating":[133],"QtNURAV.":[138],"Simulation":[139],"results":[140],"based":[141],"HSPICE":[143],"show":[144],"QtNURAV":[147,172],"self-recover":[150],"from":[151],"any":[152],"possible":[153],"has":[156],"low":[157],"delay":[158],"power":[160,181],"consumption.":[161],"Compared":[162],"existing":[164],"Quadruple":[165],"Node":[166],"Upset":[167],"hardened":[168],"latches,":[169],"provides":[174],"effectively":[178],"reduces":[179],"delay,":[180],"delay-power-area":[183],"comprehensive":[184],"product":[185],"by":[186],"33.3%,":[187],"30.1%,":[188],"53.3%":[190],"average,":[192],"respectively.":[193]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}