{"id":"https://openalex.org/W4409473749","doi":"https://doi.org/10.1109/taes.2025.3560611","title":"A Diffusion Model Based Super-Resolution Imaging Method for Through-Wall Sensing","display_name":"A Diffusion Model Based Super-Resolution Imaging Method for Through-Wall Sensing","publication_year":2025,"publication_date":"2025-04-15","ids":{"openalex":"https://openalex.org/W4409473749","doi":"https://doi.org/10.1109/taes.2025.3560611"},"language":"en","primary_location":{"id":"doi:10.1109/taes.2025.3560611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2025.3560611","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038783934","display_name":"Xiaolu Zeng","orcid":"https://orcid.org/0000-0002-5772-8137"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaolu Zeng","raw_affiliation_strings":["Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100679786","display_name":"Zihan Chen","orcid":"https://orcid.org/0000-0001-6967-2639"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zihan Chen","raw_affiliation_strings":["Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Xiaopeng Yang","orcid":"https://orcid.org/0000-0003-0532-2386"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaopeng Yang","raw_affiliation_strings":["Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027654465","display_name":"Jiancheng Liao","orcid":"https://orcid.org/0009-0000-7426-5608"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiancheng Liao","raw_affiliation_strings":["Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016353080","display_name":"Junbo Gong","orcid":"https://orcid.org/0009-0001-5299-3206"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]},{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junbo Gong","raw_affiliation_strings":["Beijing Institute of Technology Chongqing Innovation Center, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Institute of Technology Chongqing Innovation Center, Chongqing, China","institution_ids":["https://openalex.org/I50632499","https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5038783934"],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08225375,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"61","issue":"4","first_page":"10215","last_page":"10228"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.960099995136261,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.960099995136261,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10271","display_name":"Seismic Imaging and Inversion Techniques","score":0.9132000207901001,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9121000170707703,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.5548480749130249},{"id":"https://openalex.org/keywords/diffusion","display_name":"Diffusion","score":0.5369870662689209},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.44163772463798523},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.43097952008247375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39534321427345276},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2628900706768036},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2372932732105255},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.22492295503616333},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2215932309627533}],"concepts":[{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.5548480749130249},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.5369870662689209},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.44163772463798523},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.43097952008247375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39534321427345276},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2628900706768036},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2372932732105255},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.22492295503616333},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2215932309627533},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/taes.2025.3560611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2025.3560611","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7936704361","display_name":null,"funder_award_id":"62301042","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W640945449","https://openalex.org/W1885185971","https://openalex.org/W1901129140","https://openalex.org/W2022665406","https://openalex.org/W2031832897","https://openalex.org/W2044011870","https://openalex.org/W2067042811","https://openalex.org/W2104677988","https://openalex.org/W2106613244","https://openalex.org/W2115548755","https://openalex.org/W2127721429","https://openalex.org/W2133665775","https://openalex.org/W2157190232","https://openalex.org/W2157745087","https://openalex.org/W2479943616","https://openalex.org/W2546077993","https://openalex.org/W2800517054","https://openalex.org/W2866634454","https://openalex.org/W2952773607","https://openalex.org/W2963372104","https://openalex.org/W2964101377","https://openalex.org/W2964277374","https://openalex.org/W3013529009","https://openalex.org/W3019686886","https://openalex.org/W3035708560","https://openalex.org/W3036442921","https://openalex.org/W3040726448","https://openalex.org/W3046095786","https://openalex.org/W3114790937","https://openalex.org/W3155072588","https://openalex.org/W3155840365","https://openalex.org/W3158844943","https://openalex.org/W3166943025","https://openalex.org/W3212923483","https://openalex.org/W4362696701","https://openalex.org/W4391468387","https://openalex.org/W4392903059","https://openalex.org/W4395096450","https://openalex.org/W6752910514","https://openalex.org/W6779823529","https://openalex.org/W6780593937","https://openalex.org/W6788990321","https://openalex.org/W6854988651"],"related_works":["https://openalex.org/W2362774332","https://openalex.org/W4249245269","https://openalex.org/W2765548132","https://openalex.org/W2025681766","https://openalex.org/W2369060955","https://openalex.org/W2542402767","https://openalex.org/W3023086044","https://openalex.org/W2294441925","https://openalex.org/W2142226356","https://openalex.org/W3210000161"],"abstract_inverted_index":{"Through-wall":[0],"sensing":[1],"(TWS)":[2],"systems":[3,35,198],"have":[4],"extensive":[5],"applications":[6],"in":[7,42,54,182,199],"civilian":[8],"as":[9,11,82],"well":[10],"military":[12],"fields":[13],"because":[14,75],"of":[15,78,140,178,190],"its":[16],"ability":[17],"to":[18,66,88,113,145],"detect":[19],"the":[20,43,55,71,76,100,117,123,137,147,154,162,168,176,179,185,191],"obscured":[21],"space":[22],"behind":[23],"obstacles.":[24],"To":[25],"harvest":[26],"good":[27],"penetrability":[28],"at":[29],"a":[30,50,59,68,94,110],"low":[31],"cost,":[32],"existing":[33,196],"TWS":[34,96,197],"often":[36],"use":[37],"sparse":[38],"array":[39],"configuration":[40],"operating":[41],"L/S":[44],"electromagnetic":[45],"wave":[46],"band,":[47],"which":[48,149,193],"poses":[49],"poor":[51],"spatial":[52],"resolution":[53,200],"radar":[56,73,125],"images.":[57,130],"As":[58],"result,":[60],"it":[61],"is":[62,150],"difficult":[63],"for":[64],"end-users":[65],"identify":[67],"target":[69],"from":[70,119,153],"through-wall":[72],"images":[74,126],"lack":[77],"geometry-related":[79],"information":[80,189],"such":[81],"outline,":[83],"shape,":[84],"etc.":[85],"In":[86],"response":[87],"this":[89,91],"challenge,":[90],"paper":[92],"proposes":[93],"high-resolution":[95,169],"imaging":[97],"method":[98,181],"by":[99,158],"conditional":[101],"denoising":[102],"diffusion":[103],"probabilistic":[104],"model":[105],"(DDPM).":[106],"First,":[107],"we":[108,165],"design":[109],"hybrid":[111],"encoder":[112],"extract":[114],"and":[115,127,142,160,172,187],"fuse":[116],"feature":[118],"multi-source":[120],"data":[121],"including":[122],"3D":[124],"2D":[128],"optical":[129],"The":[131],"extracted":[132],"features":[133],"are":[134],"fed":[135],"into":[136],"network":[138],"consisting":[139],"residual":[141],"self-attention":[143],"modules":[144],"predict/estimate":[146],"noise,":[148],"then":[151],"subtracted":[152],"current":[155],"image.":[156,170],"Finally,":[157],"estimating":[159],"subtracting":[161],"noise":[163],"iteratively,":[164],"can":[166],"obtain":[167],"Simulations":[171],"real-world":[173],"experiments":[174],"confirm":[175],"efficiency":[177],"proposed":[180],"successfully":[183],"reconstructing":[184],"outline":[186],"contour":[188],"target,":[192],"outperforms":[194],"most":[195],"aspect.":[201]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}