{"id":"https://openalex.org/W4392449482","doi":"https://doi.org/10.1109/taes.2024.3373379","title":"Scattering Attribute Embedded Network for Few-Shot SAR ATR","display_name":"Scattering Attribute Embedded Network for Few-Shot SAR ATR","publication_year":2024,"publication_date":"2024-03-05","ids":{"openalex":"https://openalex.org/W4392449482","doi":"https://doi.org/10.1109/taes.2024.3373379"},"language":"en","primary_location":{"id":"doi:10.1109/taes.2024.3373379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2024.3373379","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011078617","display_name":"Jiang Qin","orcid":"https://orcid.org/0000-0002-6949-6556"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiang Qin","raw_affiliation_strings":["Department of Information Engineering, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000588825","display_name":"Bin Zou","orcid":"https://orcid.org/0000-0001-6135-3174"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Zou","raw_affiliation_strings":["Department of Information Engineering, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100405135","display_name":"Yifan Chen","orcid":"https://orcid.org/0000-0002-1550-1663"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifan Chen","raw_affiliation_strings":["Department of Information Engineering, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100631651","display_name":"Haolin Li","orcid":"https://orcid.org/0000-0003-1728-6714"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haolin Li","raw_affiliation_strings":["Department of Information Engineering, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052182532","display_name":"Lamei Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lamei Zhang","raw_affiliation_strings":["Department of Information Engineering, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5011078617"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":24.7857,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.99375286,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"60","issue":"4","first_page":"4182","last_page":"4197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9387000203132629,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10271","display_name":"Seismic Imaging and Inversion Techniques","score":0.9088000059127808,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.5889394283294678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5389981269836426},{"id":"https://openalex.org/keywords/shot","display_name":"Shot (pellet)","score":0.5060002207756042},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.5047584772109985},{"id":"https://openalex.org/keywords/one-shot","display_name":"One shot","score":0.4696081578731537},{"id":"https://openalex.org/keywords/radar-cross-section","display_name":"Radar cross-section","score":0.42485353350639343},{"id":"https://openalex.org/keywords/automatic-target-recognition","display_name":"Automatic target recognition","score":0.41463011503219604},{"id":"https://openalex.org/keywords/inverse-synthetic-aperture-radar","display_name":"Inverse synthetic aperture radar","score":0.4114260673522949},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.395796537399292},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.39241597056388855},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34084421396255493},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.32219642400741577},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31780946254730225},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.273460328578949},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2596014142036438},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2545980215072632},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2522037923336029},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13127076625823975},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10685482621192932}],"concepts":[{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.5889394283294678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5389981269836426},{"id":"https://openalex.org/C2778344882","wikidata":"https://www.wikidata.org/wiki/Q278938","display_name":"Shot (pellet)","level":2,"score":0.5060002207756042},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5047584772109985},{"id":"https://openalex.org/C2992734406","wikidata":"https://www.wikidata.org/wiki/Q413267","display_name":"One shot","level":2,"score":0.4696081578731537},{"id":"https://openalex.org/C101457746","wikidata":"https://www.wikidata.org/wiki/Q560430","display_name":"Radar cross-section","level":3,"score":0.42485353350639343},{"id":"https://openalex.org/C117623542","wikidata":"https://www.wikidata.org/wiki/Q621974","display_name":"Automatic target recognition","level":3,"score":0.41463011503219604},{"id":"https://openalex.org/C109094680","wikidata":"https://www.wikidata.org/wiki/Q6060432","display_name":"Inverse synthetic aperture radar","level":4,"score":0.4114260673522949},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.395796537399292},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.39241597056388855},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34084421396255493},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.32219642400741577},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31780946254730225},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.273460328578949},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2596014142036438},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2545980215072632},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2522037923336029},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13127076625823975},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10685482621192932},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/taes.2024.3373379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2024.3373379","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7614744860","display_name":null,"funder_award_id":"62271172","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W1920104210","https://openalex.org/W1979341139","https://openalex.org/W2011738980","https://openalex.org/W2149918662","https://openalex.org/W2187089797","https://openalex.org/W2194321275","https://openalex.org/W2194775991","https://openalex.org/W2410591237","https://openalex.org/W2539355242","https://openalex.org/W2589263706","https://openalex.org/W2596473454","https://openalex.org/W2598634450","https://openalex.org/W2754361766","https://openalex.org/W2773828237","https://openalex.org/W2808684827","https://openalex.org/W2883279772","https://openalex.org/W2889149612","https://openalex.org/W2945014618","https://openalex.org/W2964105864","https://openalex.org/W3001606623","https://openalex.org/W3012255272","https://openalex.org/W3087020912","https://openalex.org/W3089555680","https://openalex.org/W3111138059","https://openalex.org/W3121583704","https://openalex.org/W3131740536","https://openalex.org/W3142349132","https://openalex.org/W3186735675","https://openalex.org/W3192142973","https://openalex.org/W3193740317","https://openalex.org/W3194531425","https://openalex.org/W3196874513","https://openalex.org/W3205196764","https://openalex.org/W3205249428","https://openalex.org/W3208926440","https://openalex.org/W4206750462","https://openalex.org/W4285065070","https://openalex.org/W4285288059","https://openalex.org/W4285310237","https://openalex.org/W4294646197","https://openalex.org/W4312935555","https://openalex.org/W4377261730","https://openalex.org/W4379983660","https://openalex.org/W4386065712","https://openalex.org/W6717697761","https://openalex.org/W6735531217","https://openalex.org/W6736057607","https://openalex.org/W6748555532","https://openalex.org/W6750254146","https://openalex.org/W6803279866"],"related_works":["https://openalex.org/W2497720472","https://openalex.org/W4292659306","https://openalex.org/W3044321615","https://openalex.org/W4294892107","https://openalex.org/W2806221744","https://openalex.org/W3041793138","https://openalex.org/W2326937258","https://openalex.org/W394267150","https://openalex.org/W2357748469","https://openalex.org/W2392917037"],"abstract_inverted_index":{"Restricted":[0],"by":[1,60],"the":[2,76,129,141],"deficient":[3],"training":[4,77],"samples,":[5,29],"deep":[6],"learning-based":[7],"automatic":[8],"target":[9,24,120,154],"recognition":[10,25,124,155],"(ATR)":[11],"methods":[12,149],"for":[13,50,178],"synthetic":[14],"aperture":[15],"radar":[16],"(SAR)":[17],"are":[18,105,126],"prone":[19],"to":[20,33,67,71,107,114],"performance":[21],"degradation":[22],"of":[23,64,85,132,152],"with":[26,79],"extremely":[27,82],"few":[28],"making":[30],"them":[31],"difficult":[32],"apply":[34],"in":[35,75,150,170],"practical":[36,179],"scenarios.":[37],"To":[38],"address":[39],"this":[40],"issue,":[41],"we":[42],"propose":[43],"a":[44,90,175],"scattering":[45,62],"attribute":[46,61,94],"embedded":[47,117],"network":[48],"(SANet)":[49],"few-shot":[51,118,123,147],"SAR":[52,65,119,153,171],"ATR.":[53],"SANet":[54,143,158],"embeds":[55],"inherent":[56],"physical":[57],"attributes":[58],"provided":[59],"centers":[63],"targets":[66,73],"enable":[68],"effective":[69],"generalization":[70,161],"novel-class":[72],"unseen":[74],"set":[78],"only":[80],"an":[81],"small":[83],"number":[84],"samples.":[86],"The":[87,136],"method":[88],"employs":[89],"two-stream":[91],"architecture,":[92],"comprising":[93],"induced":[95],"global":[96],"semantic":[97],"extraction":[98],"and":[99,111,162,168],"graph-based":[100],"structure":[101],"representation":[102],"learning,":[103],"which":[104,173],"optimized":[106],"enhance":[108],"intra-class":[109],"compactness":[110],"inter-class":[112],"discriminability":[113],"achieve":[115],"physics":[116],"recognition.":[121],"Several":[122],"experiments":[125],"conducted":[127],"using":[128],"MSTAR":[130],"dataset":[131],"different":[133,165],"depression":[134,166],"angles.":[135],"experimental":[137],"results":[138],"demonstrate":[139],"that":[140],"proposed":[142],"significantly":[144],"outperforms":[145],"state-of-the-art":[146],"learning":[148],"terms":[151],"accuracy.":[156],"Additionally,":[157],"exhibits":[159],"better":[160],"robustness":[163],"across":[164],"angles":[167],"occlusions":[169],"images,":[172],"shows":[174],"great":[176],"potential":[177],"applications.":[180]},"counts_by_year":[{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":6}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}