{"id":"https://openalex.org/W3191235471","doi":"https://doi.org/10.1109/taes.2021.3103586","title":"Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications","display_name":"Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications","publication_year":2021,"publication_date":"2021-08-10","ids":{"openalex":"https://openalex.org/W3191235471","doi":"https://doi.org/10.1109/taes.2021.3103586","mag":"3191235471"},"language":"en","primary_location":{"id":"doi:10.1109/taes.2021.3103586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2021.3103586","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03380293","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0024-987X","affiliations":[{"raw_affiliation_string":"Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072887538","display_name":"Zhengzheng Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengzheng Fan","raw_affiliation_strings":["Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Liang Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Ding","raw_affiliation_strings":["Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081525426","display_name":"Jie Cui","orcid":"https://orcid.org/0000-0001-7258-3418"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Cui","raw_affiliation_strings":["Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-7258-3418","affiliations":[{"raw_affiliation_string":"Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-8695-4478","affiliations":[{"raw_affiliation_string":"Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062171476","display_name":"Qijun Wang","orcid":"https://orcid.org/0000-0003-0427-9697"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qijun Wang","raw_affiliation_strings":["Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0427-9697","affiliations":[{"raw_affiliation_string":"Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085444845","display_name":"Hao Zheng","orcid":"https://orcid.org/0000-0003-4966-4329"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Zheng","raw_affiliation_strings":["ChipMotion Microelectronics Co., Ltd, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ChipMotion Microelectronics Co., Ltd, Hefei, China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["University of Montpellier/CNRS, Montpellier, France","University of Montpellier&#x002F","CNRS, Montpellier, France"],"raw_orcid":"https://orcid.org/0000-0003-0722-8772","affiliations":[{"raw_affiliation_string":"University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]},{"raw_affiliation_string":"University of Montpellier&#x002F","institution_ids":["https://openalex.org/I19894307"]},{"raw_affiliation_string":"CNRS, Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Fukuoka, Japan"],"raw_orcid":"https://orcid.org/0000-0001-8305-604X","affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4091,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.89271261,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"58","issue":"1","first_page":"517","last_page":"529"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.8088627457618713},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7103191614151001},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.6580585837364197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6104276180267334},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5277726650238037},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.49719884991645813},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4741615355014801},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.46475401520729065},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.376188188791275},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.26255255937576294},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17038840055465698},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.12643614411354065}],"concepts":[{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.8088627457618713},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7103191614151001},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.6580585837364197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6104276180267334},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5277726650238037},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.49719884991645813},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4741615355014801},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.46475401520729065},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.376188188791275},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.26255255937576294},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17038840055465698},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.12643614411354065},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/taes.2021.3103586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2021.3103586","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-03380293v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03380293","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems, 2022, 58 (1), pp.517-529. ⟨10.1109/TAES.2021.3103586⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-03380293v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03380293","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems, 2022, 58 (1), pp.517-529. ⟨10.1109/TAES.2021.3103586⟩","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.699999988079071,"display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G3909525237","display_name":null,"funder_award_id":"61974001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6260214469","display_name":null,"funder_award_id":"61874156","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8938356812","display_name":"5G\u8f66\u8f7d\u7f51\u73af\u5883\u4e0b\u57fa\u4e8e\u8fb9\u7f18\u8ba1\u7b97\u7684\u9ad8\u6548\u9690\u79c1\u4fdd\u62a4\u673a\u5236\u7814\u7a76","funder_award_id":"61872001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1011947702","https://openalex.org/W1968121555","https://openalex.org/W1969390180","https://openalex.org/W1990960030","https://openalex.org/W2023659251","https://openalex.org/W2030501553","https://openalex.org/W2038925416","https://openalex.org/W2048087107","https://openalex.org/W2050431855","https://openalex.org/W2148327955","https://openalex.org/W2277435279","https://openalex.org/W2293212301","https://openalex.org/W2587844224","https://openalex.org/W2613938152","https://openalex.org/W2650594027","https://openalex.org/W2757143835","https://openalex.org/W2769731910","https://openalex.org/W2891093713","https://openalex.org/W2894057114","https://openalex.org/W2897553417","https://openalex.org/W2901644239","https://openalex.org/W2908633424","https://openalex.org/W2923710620","https://openalex.org/W2939094974","https://openalex.org/W2941391777","https://openalex.org/W2944068428","https://openalex.org/W2945902746","https://openalex.org/W2954184824","https://openalex.org/W2954322948","https://openalex.org/W3007255157","https://openalex.org/W3092063857"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W2160088500","https://openalex.org/W3008821054","https://openalex.org/W2797678940","https://openalex.org/W2759696718","https://openalex.org/W2124354281","https://openalex.org/W2359816675","https://openalex.org/W2102538861","https://openalex.org/W4245453130"],"abstract_inverted_index":{"With":[0],"the":[1,56,97,103,147,153,165,183,187,210],"reduction":[2],"of":[3,71,93,134,152],"technology":[4],"nodes":[5],"now":[6],"reaching":[7],"2":[8],"nm,":[9],"circuits":[10],"become":[11],"increasingly":[12],"susceptible":[13],"to":[14,77,101,115,138],"external":[15],"perturbations.":[16],"Thereby,":[17],"soft":[18],"errors,":[19],"such":[20],"as":[21],"single-node-upset":[22],"(SNU),":[23],"single-event-transient":[24],"(SET),":[25],"double-node-upset":[26],"(DNU),":[27],"and":[28,64,73,83,105,156,173,178,193,200,205],"even":[29],"triple-node-upset":[30],"(TNU),":[31],"must":[32],"be":[33,113],"considered":[34],"for":[35,123],"safety-critical":[36],"applications.":[37],"This":[38],"article":[39,129],"first":[40],"presents":[41,131],"four":[42,72],"advanced":[43,47],"circuit":[44],"components":[45],"(i.e.,":[46],"voters),":[48],"that":[49,127,164],"have":[50],"very":[51],"small":[52],"overhead":[53],"compared":[54,181,208],"with":[55,142,182,209],"traditional":[57,184],"voters.":[58,107],"The":[59],"proposed":[60,109,154,166,188],"Advanced":[61,65],"Triple-Modular-Redundancy":[62],"(ATMR)":[63],"Quadruple-Modular-Redundancy":[66],"(AQMR)":[67],"voters":[68,110,120,155],"only":[69],"consist":[70],"six":[74],"inverters,":[75],"respectively,":[76,180,207],"provide":[78],"effective":[79],"tolerance":[80,149],"against":[81],"SNUs":[82],"DNUs.":[84],"To":[85],"further":[86],"filter":[87],"SETs,":[88],"a":[89,132],"Schmitt-trigger":[90],"(ST)":[91],"instead":[92],"an":[94],"inverter":[95],"at":[96],"output-level":[98],"is":[99],"used":[100,122],"construct":[102],"ATMR-ST":[104],"AQMR-ST":[106],"These":[108],"can":[111,169,196],"also":[112,130,162],"extended":[114],"tolerate":[116],"TNUs.":[117],"Next,":[118],"these":[119],"are":[121],"latch":[124,136,195],"hardening,":[125],"so":[126],"this":[128],"series":[133],"voter-based":[135,157],"designs,":[137],"ensure":[139],"high":[140],"reliability":[141],"cost-effectiveness.":[143],"Simulation":[144,160],"results":[145,161],"demonstrate":[146,163],"node-upset":[148],"and/or":[150],"SET-filterability":[151],"latches,":[158],"respectively.":[159],"ATMR":[167],"voter":[168],"reduce":[170,197],"delay,":[171,198],"power,":[172,199],"area":[174,201],"by":[175,202],"55.2,":[176],"32.8,":[177],"32.2%,":[179],"TMR":[185],"voter;":[186],"so-called":[189],"high-impedance":[190],"state-insensitive,":[191],"TNU-tolerant,":[192],"SET-filterable":[194],"78.9,":[203],"15.8,":[204],"28.6%,":[206],"state-of-the-art":[211],"TNU":[212],"hardened":[213],"latch.":[214]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":21},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}