{"id":"https://openalex.org/W2927859296","doi":"https://doi.org/10.1109/taes.2019.2906049","title":"Mitigation of Secondary Arcing in Spacecraft Electronic Equipment","display_name":"Mitigation of Secondary Arcing in Spacecraft Electronic Equipment","publication_year":2019,"publication_date":"2019-03-27","ids":{"openalex":"https://openalex.org/W2927859296","doi":"https://doi.org/10.1109/taes.2019.2906049","mag":"2927859296"},"language":"en","primary_location":{"id":"doi:10.1109/taes.2019.2906049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2019.2906049","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054992070","display_name":"A. V. Batrakov","orcid":"https://orcid.org/0000-0003-3002-4276"},"institutions":[{"id":"https://openalex.org/I4210160292","display_name":"Institute of High Current Electronics","ror":"https://ror.org/055fe2s59","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210160292"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"Alexander V. Batrakov","raw_affiliation_strings":["Institute of High Current Electronics SB RAS, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of High Current Electronics SB RAS, Tomsk, Russia","institution_ids":["https://openalex.org/I4210160292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029379350","display_name":"Sergey B. Suntsov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134701","display_name":"Academician M.F. Reshetnev Information Satellite Systems (Russia)","ror":"https://ror.org/03xdgrg08","country_code":"RU","type":"company","lineage":["https://openalex.org/I4210134701"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Sergey B. Suntsov","raw_affiliation_strings":["JSC Academician M. F. Reshetnev Information Satellite Systems, Krasnoyarsk, Russia"],"affiliations":[{"raw_affiliation_string":"JSC Academician M. F. Reshetnev Information Satellite Systems, Krasnoyarsk, Russia","institution_ids":["https://openalex.org/I4210134701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083790750","display_name":"S. A. Popov","orcid":"https://orcid.org/0000-0001-7670-1776"},"institutions":[{"id":"https://openalex.org/I4210160292","display_name":"Institute of High Current Electronics","ror":"https://ror.org/055fe2s59","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210160292"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Sergey A. Popov","raw_affiliation_strings":["Institute of High Current Electronics SB RAS, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of High Current Electronics SB RAS, Tomsk, Russia","institution_ids":["https://openalex.org/I4210160292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046580506","display_name":"A. V. Schneider","orcid":"https://orcid.org/0000-0003-0114-1713"},"institutions":[{"id":"https://openalex.org/I4210160292","display_name":"Institute of High Current Electronics","ror":"https://ror.org/055fe2s59","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210160292"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Anton V. Schneider","raw_affiliation_strings":["Institute of High Current Electronics SB RAS, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of High Current Electronics SB RAS, Tomsk, Russia","institution_ids":["https://openalex.org/I4210160292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083979701","display_name":"E. L. Dubrovskaya","orcid":"https://orcid.org/0000-0001-6495-7838"},"institutions":[{"id":"https://openalex.org/I4210160292","display_name":"Institute of High Current Electronics","ror":"https://ror.org/055fe2s59","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210160292"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Elena L. Dubrovskaya","raw_affiliation_strings":["Institute of High Current Electronics SB RAS, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of High Current Electronics SB RAS, Tomsk, Russia","institution_ids":["https://openalex.org/I4210160292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022303911","display_name":"Alexander V. Seloustev","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134701","display_name":"Academician M.F. Reshetnev Information Satellite Systems (Russia)","ror":"https://ror.org/03xdgrg08","country_code":"RU","type":"company","lineage":["https://openalex.org/I4210134701"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alexander V. Seloustev","raw_affiliation_strings":["JSC Academician M. F. Reshetnev Information Satellite Systems, Krasnoyarsk, Russia"],"affiliations":[{"raw_affiliation_string":"JSC Academician M. F. Reshetnev Information Satellite Systems, Krasnoyarsk, Russia","institution_ids":["https://openalex.org/I4210134701"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012361241","display_name":"Alexander A. Hvalko","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134701","display_name":"Academician M.F. Reshetnev Information Satellite Systems (Russia)","ror":"https://ror.org/03xdgrg08","country_code":"RU","type":"company","lineage":["https://openalex.org/I4210134701"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Alexander A. Hvalko","raw_affiliation_strings":["JSC Academician M. F. Reshetnev Information Satellite Systems, Krasnoyarsk, Russia"],"affiliations":[{"raw_affiliation_string":"JSC Academician M. F. Reshetnev Information Satellite Systems, Krasnoyarsk, Russia","institution_ids":["https://openalex.org/I4210134701"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5054992070"],"corresponding_institution_ids":["https://openalex.org/I4210160292"],"apc_list":null,"apc_paid":null,"fwci":0.3577,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59342053,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"55","issue":"3","first_page":"1573","last_page":"1576"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12699","display_name":"Electromagnetic Launch and Propulsion Technology","score":0.9811999797821045,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electric-arc","display_name":"Electric arc","score":0.80022132396698},{"id":"https://openalex.org/keywords/spacecraft","display_name":"Spacecraft","score":0.6839181780815125},{"id":"https://openalex.org/keywords/plasma","display_name":"Plasma","score":0.6252236366271973},{"id":"https://openalex.org/keywords/spacecraft-charging","display_name":"Spacecraft charging","score":0.5625128149986267},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5526643991470337},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.5252085328102112},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4845508635044098},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4495866298675537},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.40643537044525146},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.2939647436141968},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2412550449371338},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.23795253038406372},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1729370653629303},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.11323869228363037}],"concepts":[{"id":"https://openalex.org/C114375839","wikidata":"https://www.wikidata.org/wiki/Q207456","display_name":"Electric arc","level":3,"score":0.80022132396698},{"id":"https://openalex.org/C29829512","wikidata":"https://www.wikidata.org/wiki/Q40218","display_name":"Spacecraft","level":2,"score":0.6839181780815125},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.6252236366271973},{"id":"https://openalex.org/C2776463981","wikidata":"https://www.wikidata.org/wiki/Q7572666","display_name":"Spacecraft charging","level":3,"score":0.5625128149986267},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5526643991470337},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.5252085328102112},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4845508635044098},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4495866298675537},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40643537044525146},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.2939647436141968},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2412550449371338},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.23795253038406372},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1729370653629303},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.11323869228363037},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/taes.2019.2906049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2019.2906049","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1212046498","display_name":null,"funder_award_id":"18-48-700029-p_a","funder_id":"https://openalex.org/F4320321079","funder_display_name":"Russian Foundation for Basic Research"}],"funders":[{"id":"https://openalex.org/F4320321079","display_name":"Russian Foundation for Basic Research","ror":"https://ror.org/02mh1ke95"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W411548222","https://openalex.org/W1480160699","https://openalex.org/W1601847560","https://openalex.org/W2034752292","https://openalex.org/W2036143674","https://openalex.org/W2048861789","https://openalex.org/W2139572482","https://openalex.org/W2155549441","https://openalex.org/W2493880907","https://openalex.org/W2563744661","https://openalex.org/W4233587653"],"related_works":["https://openalex.org/W4384162131","https://openalex.org/W4207051791","https://openalex.org/W2734424875","https://openalex.org/W808042145","https://openalex.org/W3173684615","https://openalex.org/W4248260302","https://openalex.org/W1487784162","https://openalex.org/W1563522559","https://openalex.org/W801624745","https://openalex.org/W2057424080"],"abstract_inverted_index":{"Here":[0],"we":[1],"present":[2],"experimental":[3],"data":[4],"that":[5],"demonstrate":[6],"the":[7,65],"possibility":[8],"to":[9,21,52],"detect":[10],"defects":[11,32,60],"in":[12,33,71],"protective":[13],"dielectrics":[14],"covering":[15],"printed":[16],"circuit":[17],"boards":[18],"(PCBs)":[19],"and":[20,42,63],"prevent":[22],"secondary":[23],"arcing":[24],"after":[25],"primary":[26],"arc":[27],"events.":[28],"The":[29],"detection":[30],"of":[31,44],"a":[34,72],"PCB":[35,66],"is":[36],"based":[37],"on":[38],"its":[39,68],"plasma":[40,73],"scanning":[41],"measurements":[43],"plasma-to-PCB":[45],"electron":[46],"currents":[47],"through":[48],"defects,":[49],"allowing":[50],"one":[51],"identify":[53],"even":[54],"their":[55],"hidden":[56],"forms.":[57],"Once":[58],"all":[59],"are":[61],"detected":[62],"healed,":[64],"shows":[67],"proper":[69],"operation":[70],"environment.":[74]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}