{"id":"https://openalex.org/W2624952720","doi":"https://doi.org/10.1109/taes.2017.2711718","title":"Active Polarimetric Measurements for Identification and Characterization of Space Debris","display_name":"Active Polarimetric Measurements for Identification and Characterization of Space Debris","publication_year":2017,"publication_date":"2017-06-13","ids":{"openalex":"https://openalex.org/W2624952720","doi":"https://doi.org/10.1109/taes.2017.2711718","mag":"2624952720"},"language":"en","primary_location":{"id":"doi:10.1109/taes.2017.2711718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2017.2711718","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/1721.1/114745","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050701391","display_name":"Michael C. Pasqual","orcid":"https://orcid.org/0000-0002-1862-6031"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael C. Pasqual","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":"https://orcid.org/0000-0002-1862-6031","affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113923056","display_name":"Kerri Cahoy","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kerri L. Cahoy","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":null,"apc_paid":null,"fwci":0.2548,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.53851585,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"53","issue":"6","first_page":"2706","last_page":"2717"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10406","display_name":"Planetary Science and Exploration","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11854","display_name":"Laser-induced spectroscopy and plasma","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polarimetry","display_name":"Polarimetry","score":0.9366634488105774},{"id":"https://openalex.org/keywords/polarimeter","display_name":"Polarimeter","score":0.763462245464325},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.699557363986969},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6192914247512817},{"id":"https://openalex.org/keywords/bistatic-radar","display_name":"Bistatic radar","score":0.583905816078186},{"id":"https://openalex.org/keywords/spacecraft","display_name":"Spacecraft","score":0.5436522364616394},{"id":"https://openalex.org/keywords/mueller-calculus","display_name":"Mueller calculus","score":0.5298640131950378},{"id":"https://openalex.org/keywords/space-debris","display_name":"Space debris","score":0.5110357999801636},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.42579081654548645},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4239242374897003},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3244073987007141},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.3023231029510498},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.2956323027610779},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28784680366516113},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.22986596822738647},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.19673773646354675},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.18301016092300415},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13617151975631714},{"id":"https://openalex.org/keywords/astronomy","display_name":"Astronomy","score":0.13519978523254395}],"concepts":[{"id":"https://openalex.org/C28493345","wikidata":"https://www.wikidata.org/wiki/Q899381","display_name":"Polarimetry","level":3,"score":0.9366634488105774},{"id":"https://openalex.org/C77530849","wikidata":"https://www.wikidata.org/wiki/Q693545","display_name":"Polarimeter","level":4,"score":0.763462245464325},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.699557363986969},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6192914247512817},{"id":"https://openalex.org/C100102862","wikidata":"https://www.wikidata.org/wiki/Q2625855","display_name":"Bistatic radar","level":4,"score":0.583905816078186},{"id":"https://openalex.org/C29829512","wikidata":"https://www.wikidata.org/wiki/Q40218","display_name":"Spacecraft","level":2,"score":0.5436522364616394},{"id":"https://openalex.org/C36928386","wikidata":"https://www.wikidata.org/wiki/Q1064220","display_name":"Mueller calculus","level":4,"score":0.5298640131950378},{"id":"https://openalex.org/C18949120","wikidata":"https://www.wikidata.org/wiki/Q275450","display_name":"Space debris","level":3,"score":0.5110357999801636},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.42579081654548645},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4239242374897003},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3244073987007141},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.3023231029510498},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.2956323027610779},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28784680366516113},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.22986596822738647},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.19673773646354675},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.18301016092300415},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13617151975631714},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.13519978523254395},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/taes.2017.2711718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/taes.2017.2711718","pdf_url":null,"source":{"id":"https://openalex.org/S193624734","display_name":"IEEE Transactions on Aerospace and Electronic Systems","issn_l":"0018-9251","issn":["0018-9251","1557-9603","2371-9877"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Aerospace and Electronic Systems","raw_type":"journal-article"},{"id":"pmh:oai:dspace.mit.edu:1721.1/114745","is_oa":true,"landing_page_url":"http://hdl.handle.net/1721.1/114745","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},{"id":"pmh:oai:dspace.mit.edu:1721.1/134455","is_oa":true,"landing_page_url":"https://hdl.handle.net/1721.1/134455","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Prof. Cahoy via Barbara Williams","raw_type":"Article"}],"best_oa_location":{"id":"pmh:oai:dspace.mit.edu:1721.1/114745","is_oa":true,"landing_page_url":"http://hdl.handle.net/1721.1/114745","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W7206514","https://openalex.org/W72678703","https://openalex.org/W166984578","https://openalex.org/W177750428","https://openalex.org/W650099020","https://openalex.org/W1496847388","https://openalex.org/W1521560745","https://openalex.org/W1658202271","https://openalex.org/W1790249414","https://openalex.org/W1978242915","https://openalex.org/W1984192823","https://openalex.org/W1992211584","https://openalex.org/W2001499087","https://openalex.org/W2002759090","https://openalex.org/W2006872897","https://openalex.org/W2009736429","https://openalex.org/W2020686016","https://openalex.org/W2037914589","https://openalex.org/W2041287270","https://openalex.org/W2045682702","https://openalex.org/W2077341500","https://openalex.org/W2083176111","https://openalex.org/W2098893304","https://openalex.org/W2108532975","https://openalex.org/W2133785712","https://openalex.org/W2138573625","https://openalex.org/W2138753096","https://openalex.org/W2146085718","https://openalex.org/W2151714913","https://openalex.org/W2165198307","https://openalex.org/W2168499395","https://openalex.org/W2526090840","https://openalex.org/W2609375600","https://openalex.org/W2622892212","https://openalex.org/W2736868655","https://openalex.org/W3011650628","https://openalex.org/W3021389077","https://openalex.org/W3022995300","https://openalex.org/W3036855204","https://openalex.org/W3087247848","https://openalex.org/W4238973449","https://openalex.org/W4299675538","https://openalex.org/W6600298027","https://openalex.org/W6607142416","https://openalex.org/W6638382648","https://openalex.org/W6652794950","https://openalex.org/W6681722654","https://openalex.org/W6727566710","https://openalex.org/W6739301642","https://openalex.org/W6774166336","https://openalex.org/W6779649258"],"related_works":["https://openalex.org/W2090561596","https://openalex.org/W1980713191","https://openalex.org/W2323822400","https://openalex.org/W3009108294","https://openalex.org/W2049198205","https://openalex.org/W2901001809","https://openalex.org/W2070346233","https://openalex.org/W2803904866","https://openalex.org/W2016750940","https://openalex.org/W1987041484"],"abstract_inverted_index":{"A":[0],"bench-top":[1],"polarimeter":[2],"(\u03bb":[3],"=":[4],"1064":[5],"nm)":[6],"is":[7],"used":[8],"to":[9],"measure":[10],"the":[11,43,62],"polarimetric":[12,32],"bidirectional":[13],"reflectance":[14],"distribution":[15],"function":[16,41],"of":[17,34,42,67],"several":[18],"common":[19],"spacecraft":[20],"materials":[21],"in":[22],"both":[23],"bistatic":[24],"and":[25,31,45,65],"monostatic":[26],"geometries.":[27],"The":[28,48],"Mueller":[29],"matrix":[30],"properties":[33],"each":[35],"material":[36],"were":[37],"estimated":[38],"as":[39],"a":[40],"illumination":[44],"viewing":[46],"angles.":[47],"findings":[49],"expand":[50],"upon":[51],"previous":[52],"research":[53],"suggesting":[54],"that":[55],"active":[56],"polarimetry":[57],"may":[58],"be":[59],"useful":[60],"for":[61],"remote":[63],"characterization":[64],"identification":[66],"space":[68],"debris.":[69]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}