{"id":"https://openalex.org/W2432869758","doi":"https://doi.org/10.1109/syscon.2016.7490656","title":"Reliability block diagram extensions for non-parametric probabilistic analysis","display_name":"Reliability block diagram extensions for non-parametric probabilistic analysis","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2432869758","doi":"https://doi.org/10.1109/syscon.2016.7490656","mag":"2432869758"},"language":"en","primary_location":{"id":"doi:10.1109/syscon.2016.7490656","is_oa":false,"landing_page_url":"https://doi.org/10.1109/syscon.2016.7490656","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Annual IEEE Systems Conference (SysCon)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009321145","display_name":"Philip Davis","orcid":null},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Philip C. Davis","raw_affiliation_strings":["Darwin Deason Institute for Cyber Security, Southern Methodist University, Dallas, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Darwin Deason Institute for Cyber Security, Southern Methodist University, Dallas, Texas, USA","institution_ids":["https://openalex.org/I178169726"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082009815","display_name":"Mitchell A. Thornton","orcid":"https://orcid.org/0000-0003-3559-9511"},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mitchell A. Thornton","raw_affiliation_strings":["Darwin Deason Institute for Cyber Security, Southern Methodist University, Dallas, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Darwin Deason Institute for Cyber Security, Southern Methodist University, Dallas, Texas, USA","institution_ids":["https://openalex.org/I178169726"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089924197","display_name":"Theodore W. Manikas","orcid":"https://orcid.org/0000-0001-8331-9815"},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Theodore W. Manikas","raw_affiliation_strings":["Darwin Deason Institute for Cyber Security, Southern Methodist University, Dallas, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Darwin Deason Institute for Cyber Security, Southern Methodist University, Dallas, Texas, USA","institution_ids":["https://openalex.org/I178169726"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5009321145"],"corresponding_institution_ids":["https://openalex.org/I178169726"],"apc_list":null,"apc_paid":null,"fwci":0.2721,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68084016,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-block-diagram","display_name":"Reliability block diagram","score":0.8399403095245361},{"id":"https://openalex.org/keywords/block-diagram","display_name":"Block diagram","score":0.6768234968185425},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6384591460227966},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6206676363945007},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6095027923583984},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5649480819702148},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.5594921708106995},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.5127621293067932},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5026476383209229},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.4766060709953308},{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.4672752618789673},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4509139657020569},{"id":"https://openalex.org/keywords/hazard","display_name":"Hazard","score":0.44836825132369995},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4478524327278137},{"id":"https://openalex.org/keywords/diagram","display_name":"Diagram","score":0.42562994360923767},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.4185926914215088},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36232268810272217},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2904765009880066},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15985971689224243},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10485929250717163}],"concepts":[{"id":"https://openalex.org/C18074226","wikidata":"https://www.wikidata.org/wiki/Q7310986","display_name":"Reliability block diagram","level":3,"score":0.8399403095245361},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.6768234968185425},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6384591460227966},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6206676363945007},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6095027923583984},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5649480819702148},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.5594921708106995},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5127621293067932},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5026476383209229},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4766060709953308},{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.4672752618789673},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4509139657020569},{"id":"https://openalex.org/C49261128","wikidata":"https://www.wikidata.org/wiki/Q1132455","display_name":"Hazard","level":2,"score":0.44836825132369995},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4478524327278137},{"id":"https://openalex.org/C186399060","wikidata":"https://www.wikidata.org/wiki/Q959962","display_name":"Diagram","level":2,"score":0.42562994360923767},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.4185926914215088},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36232268810272217},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2904765009880066},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15985971689224243},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10485929250717163},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/syscon.2016.7490656","is_oa":false,"landing_page_url":"https://doi.org/10.1109/syscon.2016.7490656","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Annual IEEE Systems Conference (SysCon)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W141121412","https://openalex.org/W1549071886","https://openalex.org/W1587964717","https://openalex.org/W1995574603","https://openalex.org/W2028342528","https://openalex.org/W2051159673","https://openalex.org/W2069313594","https://openalex.org/W2108122578","https://openalex.org/W2112949599","https://openalex.org/W2151010725","https://openalex.org/W2167888825","https://openalex.org/W3151875292","https://openalex.org/W3216272643"],"related_works":["https://openalex.org/W162387073","https://openalex.org/W2576400083","https://openalex.org/W2023383111","https://openalex.org/W172268995","https://openalex.org/W2161661719","https://openalex.org/W2086782250","https://openalex.org/W2042729523","https://openalex.org/W2522039072","https://openalex.org/W2811170636","https://openalex.org/W4234738102"],"abstract_inverted_index":{"Multi-Valued":[0],"Reliability":[1],"Block":[2],"Diagrams":[3],"(MVRBD)":[4],"are":[5,41],"introduced":[6],"as":[7],"a":[8,44,57,73],"generalization":[9],"of":[10,25,69,80,104,112,116,136,140,155],"classical":[11],"reliability":[12,74,89],"block":[13,75],"diagrams":[14],"(RBD)":[15],"commonly":[16],"used":[17],"in":[18,72,152],"system":[19,65,86,138],"analysis.":[20],"MVRBD":[21,40,121,147],"offer":[22],"the":[23,101,120,146,153,156],"advantage":[24],"allowing":[26],"systems":[27],"and":[28,88],"subsystem":[29],"components":[30],"to":[31,60,100,130],"be":[32,61,92,131,143],"modeled":[33,71],"with":[34,53],"arbitrary":[35,134],"hazard":[36,97],"failure":[37,87],"rate":[38,98],"relationships.":[39],"based":[42],"upon":[43],"multiple-valued":[45],"discrete":[46],"switching":[47],"algebra":[48],"that":[49,66,85],"is":[50,67,84],"functionally":[51],"complete":[52],"constants":[54],"thereby":[55],"affording":[56],"corresponding":[58],"model":[59,83,122,148],"formulated":[62],"for":[63,124],"any":[64,113],"capable":[68],"being":[70],"diagram":[76],"form.":[77],"The":[78,110],"utility":[79],"this":[81],"new":[82],"analysis":[90],"can":[91],"performed":[93],"without":[94,149],"restricting":[95],"component":[96],"relationships":[99],"binary":[102],"case":[103],"either":[105],"\"failure\"":[106],"or":[107],"\"fully":[108],"operational.\"":[109],"incorporation":[111],"desired":[114],"number":[115,135],"\"degraded\"":[117,141],"states":[118,139],"into":[119,145],"allows":[123],"non-parametric":[125],"probability":[126],"mass":[127],"functions":[128],"(pmf)":[129],"used.":[132],"Any":[133],"intermediate":[137],"may":[142],"incorporated":[144],"significant":[150],"increase":[151],"complexity":[154],"analyses":[157],"methodologies.":[158]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}