{"id":"https://openalex.org/W2440767284","doi":"https://doi.org/10.1109/syscon.2016.7490557","title":"Applying formal verification to early assessment of FPGA-based aerospace applications: Methodology and experience","display_name":"Applying formal verification to early assessment of FPGA-based aerospace applications: Methodology and experience","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2440767284","doi":"https://doi.org/10.1109/syscon.2016.7490557","mag":"2440767284"},"language":"en","primary_location":{"id":"doi:10.1109/syscon.2016.7490557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/syscon.2016.7490557","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Annual IEEE Systems Conference (SysCon)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069684684","display_name":"Khaza Anuarul Hoque","orcid":"https://orcid.org/0000-0002-1625-6479"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Khaza Anuarul Hoque","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Concordia University, Montreal, QC, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Concordia University, Montreal, QC, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032928854","display_name":"Otmane A\u0131\u0308t Mohamed","orcid":"https://orcid.org/0000-0003-1378-1443"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Otmane Ait Mohamed","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Concordia University, Montreal, QC, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Concordia University, Montreal, QC, Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038488044","display_name":"Yvon Savaria","orcid":"https://orcid.org/0000-0002-3404-9959"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yvon Savaria","raw_affiliation_strings":["Department of Electrical Engineering, Polytechnique Montr\u00e9al, Montreal, QC, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Polytechnique Montr\u00e9al, Montreal, QC, Canada","institution_ids":["https://openalex.org/I45683168"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5069684684"],"corresponding_institution_ids":["https://openalex.org/I60158472"],"apc_list":null,"apc_paid":null,"fwci":0.1864,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56776302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.764767050743103},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.6711738109588623},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6582379341125488},{"id":"https://openalex.org/keywords/model-checking","display_name":"Model checking","score":0.6448670029640198},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5411140322685242},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5033170580863953},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.49730876088142395},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4933847486972809},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.46152323484420776},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.4540896415710449},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4505961835384369},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.44234901666641235},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3639724850654602},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.1848251223564148},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16438814997673035},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09342721104621887},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.0904654860496521},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08929687738418579}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.764767050743103},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.6711738109588623},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6582379341125488},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.6448670029640198},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5411140322685242},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5033170580863953},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.49730876088142395},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4933847486972809},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.46152323484420776},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.4540896415710449},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4505961835384369},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.44234901666641235},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3639724850654602},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.1848251223564148},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16438814997673035},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09342721104621887},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0904654860496521},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08929687738418579},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/syscon.2016.7490557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/syscon.2016.7490557","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Annual IEEE Systems Conference (SysCon)","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.polymtl.ca:35635","is_oa":false,"landing_page_url":"https://publications.polymtl.ca/35635/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401013","display_name":"PolyPublie (\u00c9cole Polytechnique de Montr\u00e9al)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45683168","host_organization_name":"Polytechnique Montr\u00e9al","host_organization_lineage":["https://openalex.org/I45683168"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Communication de conf\u00e9rence"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W42313609","https://openalex.org/W49500906","https://openalex.org/W1430091258","https://openalex.org/W1498432697","https://openalex.org/W1514324734","https://openalex.org/W1707430307","https://openalex.org/W1862398452","https://openalex.org/W1966486329","https://openalex.org/W2009335638","https://openalex.org/W2036426733","https://openalex.org/W2038219610","https://openalex.org/W2065353631","https://openalex.org/W2086340664","https://openalex.org/W2093842169","https://openalex.org/W2099760530","https://openalex.org/W2117189826","https://openalex.org/W2135743241","https://openalex.org/W2164038583","https://openalex.org/W2171125685","https://openalex.org/W2422026687","https://openalex.org/W4252446866","https://openalex.org/W4299326032","https://openalex.org/W6602009546"],"related_works":["https://openalex.org/W2037121848","https://openalex.org/W2006962382","https://openalex.org/W2149716943","https://openalex.org/W4312733571","https://openalex.org/W113732979","https://openalex.org/W4315606162","https://openalex.org/W2340807904","https://openalex.org/W2333948626","https://openalex.org/W1547517160","https://openalex.org/W1483297389"],"abstract_inverted_index":{"SRAM-based":[0],"Field":[1],"Programmable":[2],"Gate":[3],"Arrays":[4],"(FP-GAs)":[5],"have":[6],"been":[7],"used":[8],"in":[9,36,43,127],"the":[10,63,79,93,116,121,132,142,147,160,178],"aerospace":[11],"application":[12,60],"for":[13],"more":[14,68],"than":[15],"a":[16,19,67,84,109,151,153],"decade.":[17],"Unfortunately,":[18],"significant":[20],"disadvantage":[21],"of":[22,98,150],"these":[23],"devices":[24],"is":[25,108,119,123,157],"their":[26],"sensitivity":[27],"to":[28,65,91,101,131],"radiation":[29],"effects":[30],"that":[31,120,136],"can":[32],"cause":[33],"bit":[34],"flips":[35],"memory":[37],"elements":[38],"and":[39,70,95,115,169],"ionisation":[40],"induced":[41],"faults":[42],"semiconductors,":[44],"commonly":[45],"known":[46,111],"as":[47,78],"Single":[48],"Event":[49],"Upsets":[50],"(SEUs).":[51],"An":[52],"early":[53],"dependability":[54,94,168],"analysis":[55,122],"on":[56,87],"SRAM":[57],"FPGA-based":[58],"safety-critical":[59],"will":[61],"enable":[62],"designers":[64],"develop":[66],"reliable":[69],"robust":[71],"design":[72,75,103],"complying":[73],"with":[74,138],"requirements,":[76],"such":[77,99],"DO-254":[80],"standard.":[81],"We":[82],"propose":[83],"methodology":[85],"based":[86],"probabilistic":[88],"model":[89,106,156,180],"checking,":[90],"analyze":[92],"performability":[96,170],"properties":[97,172],"designs":[100],"guide":[102],"decisions.":[104],"Probabilistic":[105],"checking":[107],"well":[110],"formal":[112],"verification":[113],"technique,":[114],"main":[117],"advantage":[118],"exhaustive,":[124],"which":[125],"results":[126],"numerically":[128],"exact":[129],"answers":[130],"temporal":[133],"logic":[134],"queries":[135],"contrast":[137],"discrete-event":[139],"simulations.":[140],"In":[141],"proposed":[143],"methodology,":[144],"starting":[145],"from":[146,159],"high-level":[148],"description":[149],"system,":[152],"Markov":[154],"(reward)":[155],"constructed":[158],"extracted":[161],"Control":[162],"Data":[163],"Flow":[164],"Graph":[165],"(CDFG).":[166],"Various":[167],"related":[171],"are":[173],"then":[174],"verified":[175],"automatically":[176],"using":[177],"PRISM":[179],"checker":[181],"tool.":[182]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}