{"id":"https://openalex.org/W4313062894","doi":"https://doi.org/10.1109/ssd54932.2022.9955668","title":"Enhanced Photoresponse of Ultraviolet Photodetector via RF Sputtered ZnO/a-SiC Heterostructure","display_name":"Enhanced Photoresponse of Ultraviolet Photodetector via RF Sputtered ZnO/a-SiC Heterostructure","publication_year":2022,"publication_date":"2022-05-06","ids":{"openalex":"https://openalex.org/W4313062894","doi":"https://doi.org/10.1109/ssd54932.2022.9955668"},"language":"en","primary_location":{"id":"doi:10.1109/ssd54932.2022.9955668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd54932.2022.9955668","pdf_url":null,"source":{"id":"https://openalex.org/S4363607814","display_name":"2022 19th International Multi-Conference on Systems, Signals &amp; Devices (SSD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International Multi-Conference on Systems, Signals &amp; Devices (SSD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044226348","display_name":"F. Djeffal","orcid":"https://orcid.org/0000-0003-0742-5864"},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"F. Djeffal","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029535671","display_name":"H. Ferhati","orcid":null},"institutions":[{"id":"https://openalex.org/I3132180716","display_name":"Larbi Ben M'hidi University of Oum El Bouaghi","ror":"https://ror.org/0034tbg85","country_code":"DZ","type":"education","lineage":["https://openalex.org/I3132180716"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"H. Ferhati","raw_affiliation_strings":["ISTA University of Larbi Ben M&#x0027;hidi, Oum El Bouaghi,Oum El Bouaghi,Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ISTA University of Larbi Ben M&#x0027;hidi, Oum El Bouaghi,Oum El Bouaghi,Algeria","institution_ids":["https://openalex.org/I3132180716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043513290","display_name":"A. Benhaya","orcid":null},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"A. Benhaya","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085999771","display_name":"A. Bendjerad","orcid":null},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"A. Bendjerad","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.954,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.85959271,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1039","last_page":"1043"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.9045311212539673},{"id":"https://openalex.org/keywords/ultraviolet","display_name":"Ultraviolet","score":0.8085867166519165},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.7869884967803955},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7578057050704956},{"id":"https://openalex.org/keywords/heterojunction","display_name":"Heterojunction","score":0.7372346520423889},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.44965648651123047},{"id":"https://openalex.org/keywords/sputtering","display_name":"Sputtering","score":0.44519150257110596},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.18665063381195068},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.13889670372009277}],"concepts":[{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.9045311212539673},{"id":"https://openalex.org/C2776798109","wikidata":"https://www.wikidata.org/wiki/Q11391","display_name":"Ultraviolet","level":2,"score":0.8085867166519165},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7869884967803955},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7578057050704956},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.7372346520423889},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.44965648651123047},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.44519150257110596},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.18665063381195068},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13889670372009277}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ssd54932.2022.9955668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd54932.2022.9955668","pdf_url":null,"source":{"id":"https://openalex.org/S4363607814","display_name":"2022 19th International Multi-Conference on Systems, Signals &amp; Devices (SSD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International Multi-Conference on Systems, Signals &amp; Devices (SSD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1851209504","https://openalex.org/W2003898158","https://openalex.org/W2048774202","https://openalex.org/W2050533170","https://openalex.org/W2080174132","https://openalex.org/W2094234432","https://openalex.org/W2334431710","https://openalex.org/W2464563468","https://openalex.org/W2593521019","https://openalex.org/W2783373807","https://openalex.org/W2783910542","https://openalex.org/W2785557269","https://openalex.org/W2913794212","https://openalex.org/W2923065756","https://openalex.org/W2943709853","https://openalex.org/W2980849529","https://openalex.org/W2982745652","https://openalex.org/W2991100412","https://openalex.org/W2991442346","https://openalex.org/W2997404019","https://openalex.org/W3004156376","https://openalex.org/W3081351135","https://openalex.org/W3138090788","https://openalex.org/W6673875455"],"related_works":["https://openalex.org/W2783489294","https://openalex.org/W3101273433","https://openalex.org/W3092390055","https://openalex.org/W2018753630","https://openalex.org/W2028943127","https://openalex.org/W2250870481","https://openalex.org/W2026808500","https://openalex.org/W2068665704","https://openalex.org/W3011385383","https://openalex.org/W2290381580"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}
