{"id":"https://openalex.org/W2052790103","doi":"https://doi.org/10.1109/ssd.2014.6808796","title":"The use of digital image processing for IC reverse engineering","display_name":"The use of digital image processing for IC reverse engineering","publication_year":2014,"publication_date":"2014-02-01","ids":{"openalex":"https://openalex.org/W2052790103","doi":"https://doi.org/10.1109/ssd.2014.6808796","mag":"2052790103"},"language":"en","primary_location":{"id":"doi:10.1109/ssd.2014.6808796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd.2014.6808796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 11th International Multi-Conference on Systems, Signals & Devices (SSD14)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047391624","display_name":"Ra\u00fal Quijada","orcid":"https://orcid.org/0009-0006-8570-6118"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Raul Quijada","raw_affiliation_strings":["Signal Theory and Communications Department, Barcelona Tech","Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Signal Theory and Communications Department, Barcelona Tech","institution_ids":[]},{"raw_affiliation_string":"Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052219472","display_name":"Arnau Ravent\u00f3s","orcid":null},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Arnau Raventos","raw_affiliation_strings":["Signal Theory and Communications Department, Barcelona Tech","Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Signal Theory and Communications Department, Barcelona Tech","institution_ids":[]},{"raw_affiliation_string":"Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079163879","display_name":"Francesc Tarr\u00e9s","orcid":"https://orcid.org/0000-0003-0920-4782"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francesc Tarres","raw_affiliation_strings":["Signal Theory and Communications Department, Barcelona Tech","Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Signal Theory and Communications Department, Barcelona Tech","institution_ids":[]},{"raw_affiliation_string":"Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Roger Dura","orcid":null},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Roger Dura","raw_affiliation_strings":["Reverse Engineering Group, CSIC","IMB, Reverse Eng. Group, CNM, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Reverse Engineering Group, CSIC","institution_ids":["https://openalex.org/I134820265"]},{"raw_affiliation_string":"IMB, Reverse Eng. Group, CNM, Spain","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077461338","display_name":"S. Hidalgo","orcid":"https://orcid.org/0000-0002-8070-3499"},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Salvador Hidalgo","raw_affiliation_strings":["Reverse Engineering Group, CSIC","IMB, Reverse Eng. Group, CNM, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Reverse Engineering Group, CSIC","institution_ids":["https://openalex.org/I134820265"]},{"raw_affiliation_string":"IMB, Reverse Eng. Group, CNM, Spain","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8728,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.87205785,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-stitching","display_name":"Image stitching","score":0.7188612222671509},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7117282152175903},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.586642861366272},{"id":"https://openalex.org/keywords/digital-image-processing","display_name":"Digital image processing","score":0.577136754989624},{"id":"https://openalex.org/keywords/scale-invariant-feature-transform","display_name":"Scale-invariant feature transform","score":0.5648733377456665},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5473222732543945},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4948555827140808},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.48182955384254456},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.47802862524986267},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4573901891708374},{"id":"https://openalex.org/keywords/reverse-engineering","display_name":"Reverse engineering","score":0.43194031715393066},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4289966821670532},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4066157341003418},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35924187302589417},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3310168981552124},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.19827163219451904},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17488962411880493}],"concepts":[{"id":"https://openalex.org/C29081049","wikidata":"https://www.wikidata.org/wiki/Q1364242","display_name":"Image stitching","level":2,"score":0.7188612222671509},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7117282152175903},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.586642861366272},{"id":"https://openalex.org/C104317675","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Digital image processing","level":4,"score":0.577136754989624},{"id":"https://openalex.org/C61265191","wikidata":"https://www.wikidata.org/wiki/Q767770","display_name":"Scale-invariant feature transform","level":3,"score":0.5648733377456665},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5473222732543945},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4948555827140808},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.48182955384254456},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47802862524986267},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4573901891708374},{"id":"https://openalex.org/C207850805","wikidata":"https://www.wikidata.org/wiki/Q269608","display_name":"Reverse engineering","level":2,"score":0.43194031715393066},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4289966821670532},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4066157341003418},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35924187302589417},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3310168981552124},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.19827163219451904},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17488962411880493},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ssd.2014.6808796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd.2014.6808796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 11th International Multi-Conference on Systems, Signals & Devices (SSD14)","raw_type":"proceedings-article"},{"id":"pmh:oai:upcommons.upc.edu:2117/25136","is_oa":false,"landing_page_url":"http://hdl.handle.net/2117/25136","pdf_url":null,"source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference report"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1677409904","https://openalex.org/W2140904634","https://openalex.org/W2151103935","https://openalex.org/W6637400245"],"related_works":["https://openalex.org/W2091466534","https://openalex.org/W3134240150","https://openalex.org/W3156165453","https://openalex.org/W2042500775","https://openalex.org/W172825421","https://openalex.org/W1965745851","https://openalex.org/W2076160147","https://openalex.org/W2388389322","https://openalex.org/W2344562887","https://openalex.org/W2369802839"],"abstract_inverted_index":{"IC":[0],"Reverse":[1],"engineering":[2],"is":[3,59,79,82,108],"the":[4,73,104,112,115,123],"process":[5,42],"to":[6,11,122],"analyze":[7],"an":[8,101],"integrated":[9],"circuit":[10],"obtain":[12],"information":[13],"about":[14],"its":[15],"design,":[16],"materials,":[17],"logic":[18,38,137],"circuitry,":[19],"functionality,":[20],"performance":[21],"and":[22,37,53,77,95,107,136],"other":[23],"relevant":[24],"features.":[25],"The":[26,98],"increasingly":[27],"complexity":[28],"of":[29,35,103,114],"microchips":[30],"using":[31,45],"a":[32,62,70],"greater":[33],"number":[34],"layers":[36],"gates":[39],"makes":[40],"this":[41,68],"unaffordable":[43],"when":[44],"traditional":[46],"methods":[47],"that":[48,119],"rely":[49],"on":[50,111],"human":[51],"inspection":[52],"analysis.":[54],"Therefore,":[55],"digital":[56],"image":[57,116,128],"processing":[58,117],"presented":[60],"as":[61,127],"fruitful":[63],"field":[64],"for":[65,72],"automation.":[66],"In":[67],"paper":[69,99],"system":[71,106],"circuitry":[74],"extraction,":[75],"analysis":[76],"presentation":[78],"described.":[80],"It":[81],"divided":[83],"in":[84],"three":[85],"blocks:":[86],"2D":[87],"Image":[88],"Tiling,":[89],"Logic":[90],"Gates":[91],"Localization":[92],"&":[93,140],"Recognition":[94],"Microchip":[96],"Navigator.":[97],"presents":[100],"overview":[102],"complete":[105],"mainly":[109],"based":[110],"description":[113],"algorithms":[118],"are":[120],"applied":[121],"different":[124],"blocks":[125],"such":[126],"stitching,":[129],"customized":[130],"Scale":[131],"Invariant":[132],"Feature":[133],"Transform":[134],"(SIFT)":[135],"gate":[138],"localization":[139],"recognition.":[141]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}