{"id":"https://openalex.org/W1975083509","doi":"https://doi.org/10.1109/ssd.2012.6198071","title":"Modeling of the resistance between metal electrodes and metallic SWNT","display_name":"Modeling of the resistance between metal electrodes and metallic SWNT","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W1975083509","doi":"https://doi.org/10.1109/ssd.2012.6198071","mag":"1975083509"},"language":"en","primary_location":{"id":"doi:10.1109/ssd.2012.6198071","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd.2012.6198071","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Multi-Conference on Systems, Sygnals & Devices","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006400037","display_name":"Ammar Al\u2010Hamry","orcid":"https://orcid.org/0000-0003-0952-3134"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Ammar Al-Hamry","raw_affiliation_strings":["Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042878042","display_name":"Abderrahmane Benchirouf","orcid":"https://orcid.org/0000-0002-8418-2598"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Benchirouf","raw_affiliation_strings":["Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047320615","display_name":"Nghia Dinh","orcid":"https://orcid.org/0000-0003-4871-7476"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"N. Dinh","raw_affiliation_strings":["Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068676566","display_name":"Olfa Kanoun","orcid":"https://orcid.org/0000-0002-7166-1266"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"O. Kanoun","raw_affiliation_strings":["Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz University of Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]},{"raw_affiliation_string":"Chemnitz University of Technology, Electrical Engineering and Information Technology, Chair of Measurement and Sensor Technology, Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006400037"],"corresponding_institution_ids":["https://openalex.org/I2610724"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04782081,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11272","display_name":"Nanowire Synthesis and Applications","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8287125825881958},{"id":"https://openalex.org/keywords/ohmic-contact","display_name":"Ohmic contact","score":0.8152666687965393},{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.7814677953720093},{"id":"https://openalex.org/keywords/contact-resistance","display_name":"Contact resistance","score":0.7530678510665894},{"id":"https://openalex.org/keywords/schottky-barrier","display_name":"Schottky barrier","score":0.6499360799789429},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.5613369345664978},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.5521256327629089},{"id":"https://openalex.org/keywords/work-function","display_name":"Work function","score":0.5371909737586975},{"id":"https://openalex.org/keywords/van-der-waals-force","display_name":"van der Waals force","score":0.514509916305542},{"id":"https://openalex.org/keywords/electrical-contacts","display_name":"Electrical contacts","score":0.4785768985748291},{"id":"https://openalex.org/keywords/metal","display_name":"Metal","score":0.4770735502243042},{"id":"https://openalex.org/keywords/nanotube","display_name":"Nanotube","score":0.435048371553421},{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.4230020046234131},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.38761359453201294},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.3312268555164337},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.32071828842163086},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.316652774810791},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.3097611665725708},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.0731261670589447},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.07289639115333557}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8287125825881958},{"id":"https://openalex.org/C138230450","wikidata":"https://www.wikidata.org/wiki/Q2016597","display_name":"Ohmic contact","level":3,"score":0.8152666687965393},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.7814677953720093},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.7530678510665894},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.6499360799789429},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.5613369345664978},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5521256327629089},{"id":"https://openalex.org/C115235246","wikidata":"https://www.wikidata.org/wiki/Q783800","display_name":"Work function","level":3,"score":0.5371909737586975},{"id":"https://openalex.org/C126061179","wikidata":"https://www.wikidata.org/wiki/Q189627","display_name":"van der Waals force","level":3,"score":0.514509916305542},{"id":"https://openalex.org/C132235601","wikidata":"https://www.wikidata.org/wiki/Q394001","display_name":"Electrical contacts","level":2,"score":0.4785768985748291},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.4770735502243042},{"id":"https://openalex.org/C2777619693","wikidata":"https://www.wikidata.org/wiki/Q539430","display_name":"Nanotube","level":3,"score":0.435048371553421},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.4230020046234131},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.38761359453201294},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3312268555164337},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.32071828842163086},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.316652774810791},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.3097611665725708},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0731261670589447},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.07289639115333557},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C32909587","wikidata":"https://www.wikidata.org/wiki/Q11369","display_name":"Molecule","level":2,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ssd.2012.6198071","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd.2012.6198071","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Multi-Conference on Systems, Sygnals & Devices","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W96780632","https://openalex.org/W140421656","https://openalex.org/W209021020","https://openalex.org/W656433898","https://openalex.org/W1977104551","https://openalex.org/W1982131374","https://openalex.org/W1990188847","https://openalex.org/W1995762238","https://openalex.org/W2004878803","https://openalex.org/W2005107548","https://openalex.org/W2013008413","https://openalex.org/W2022383002","https://openalex.org/W2031766713","https://openalex.org/W2036306277","https://openalex.org/W2038087740","https://openalex.org/W2039053452","https://openalex.org/W2041986849","https://openalex.org/W2043399112","https://openalex.org/W2052206477","https://openalex.org/W2053125511","https://openalex.org/W2064888682","https://openalex.org/W2069935892","https://openalex.org/W2074814433","https://openalex.org/W2089220841","https://openalex.org/W2091767459","https://openalex.org/W2095485375","https://openalex.org/W2098874598","https://openalex.org/W2101565514","https://openalex.org/W2103908119","https://openalex.org/W2104445191","https://openalex.org/W2109170448","https://openalex.org/W2123273628","https://openalex.org/W2129686521","https://openalex.org/W2135518576","https://openalex.org/W3098598643","https://openalex.org/W3100055540","https://openalex.org/W3147705510","https://openalex.org/W3174506030"],"related_works":["https://openalex.org/W1975027344","https://openalex.org/W2017076333","https://openalex.org/W2051353231","https://openalex.org/W1970115051","https://openalex.org/W2095133813","https://openalex.org/W1977156920","https://openalex.org/W4376610516","https://openalex.org/W1965890915","https://openalex.org/W3015744687","https://openalex.org/W2318011136"],"abstract_inverted_index":{"Contact":[0],"effects":[1],"of":[2,27,56,67,70,85,110,118,152],"carbon":[3,157],"nanotubes":[4,158],"(CNT)":[5],"to":[6,60,93,145],"metallic":[7,40,86],"electrodes":[8],"have":[9],"a":[10,51,79],"big":[11],"impact":[12],"on":[13],"the":[14,57,61,65,73,95,100,108,138,147],"electronic":[15],"transport":[16],"in":[17,91,124],"CNT-based":[18],"structures.":[19],"In":[20],"general":[21],"there":[22],"are":[23],"two":[24],"expected":[25],"types":[26],"contacts,":[28],"Schottky":[29],"type":[30],"with":[31,37],"semiconducting":[32,38],"tubes":[33],"and":[34,39,98,113,126,132],"ohmic":[35],"contact":[36,54,101,148],"tubes.":[41],"However":[42],"not":[43],"always":[44],"perfect":[45],"contacts":[46,84],"come,":[47],"it":[48],"is":[49],"rather":[50],"tunneling":[52],"barrier":[53],"because":[55],"weak":[58],"coupling":[59],"metal":[62],"electrode":[63],"or":[64,155],"formation":[66],"thin":[68],"layer":[69],"oxides":[71],"at":[72,137],"interface,":[74],"for":[75,82,150],"example.":[76],"We":[77],"propose":[78],"simple":[80],"model":[81,104,141],"non-ideal":[83],"single":[87],"walled":[88],"nanotube":[89],"(SWNT)":[90],"order":[92],"calculate":[94,146],"overall":[96],"resistance":[97,149],"hence":[99],"resistance.":[102],"The":[103,140],"takes":[105],"into":[106],"account":[107],"findings":[109],"both":[111],"experiments":[112],"theories":[114],"such":[115],"as":[116],"effect":[117],"work":[119],"function,":[120],"electron":[121],"phonon":[122],"scattering":[123],"low":[125],"high":[127],"bias":[128],"voltage,":[129],"image":[130],"potential":[131],"van":[133],"der":[134],"Waals":[135],"distance":[136],"interface.":[139],"can":[142],"be":[143],"developed":[144],"strips":[151],"several":[153],"SWNTs":[154],"multiwalled":[156],"MWNTs.":[159]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}