{"id":"https://openalex.org/W2118139894","doi":"https://doi.org/10.1109/ssd.2012.6197959","title":"Smart laser sensor with measurement uncertainties beyond the diffraction limit","display_name":"Smart laser sensor with measurement uncertainties beyond the diffraction limit","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W2118139894","doi":"https://doi.org/10.1109/ssd.2012.6197959","mag":"2118139894"},"language":"en","primary_location":{"id":"doi:10.1109/ssd.2012.6197959","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd.2012.6197959","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Multi-Conference on Systems, Sygnals & Devices","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065780800","display_name":"J\u00fcrgen Czarske","orcid":"https://orcid.org/0000-0001-7280-0523"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Jurgen Czarske","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Technical University of Dresden, Dresden, Germany","TU Dresden, Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Technical University of Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]},{"raw_affiliation_string":"TU Dresden, Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003456431","display_name":"J\u00f6rg K\u00f6nig","orcid":"https://orcid.org/0000-0002-7832-9223"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Konig","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Technical University of Dresden, Dresden, Germany","TU Dresden, Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Technical University of Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]},{"raw_affiliation_string":"TU Dresden, Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003631999","display_name":"Lars B\u00fcttner","orcid":"https://orcid.org/0000-0002-0114-9582"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Lars Buttner","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Technical University of Dresden, Dresden, Germany","TU Dresden, Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Technical University of Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]},{"raw_affiliation_string":"TU Dresden, Faculty of Electrical and Computer Engineering, Laboratory for Measurement and Testing Techniques, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5065780800"],"corresponding_institution_ids":["https://openalex.org/I78650965"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20115515,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diffraction","display_name":"Diffraction","score":0.7080895900726318},{"id":"https://openalex.org/keywords/doppler-effect","display_name":"Doppler effect","score":0.6040282845497131},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5211665630340576},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5114625692367554},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5090103149414062},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3952215015888214},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3821905255317688},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1870020031929016},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13425418734550476}],"concepts":[{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.7080895900726318},{"id":"https://openalex.org/C142757262","wikidata":"https://www.wikidata.org/wiki/Q76436","display_name":"Doppler effect","level":2,"score":0.6040282845497131},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5211665630340576},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5114625692367554},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5090103149414062},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3952215015888214},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3821905255317688},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1870020031929016},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13425418734550476},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ssd.2012.6197959","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssd.2012.6197959","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Multi-Conference on Systems, Sygnals & Devices","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1523480373","https://openalex.org/W1556152060","https://openalex.org/W1980326899","https://openalex.org/W1981514745","https://openalex.org/W1995112688","https://openalex.org/W2000737659","https://openalex.org/W2003151075","https://openalex.org/W2034527982","https://openalex.org/W2036937494","https://openalex.org/W2070052475","https://openalex.org/W2132539863","https://openalex.org/W3184693145","https://openalex.org/W4205952964","https://openalex.org/W4242189711"],"related_works":["https://openalex.org/W2183196443","https://openalex.org/W2034034955","https://openalex.org/W619018173","https://openalex.org/W2777682872","https://openalex.org/W2004869787","https://openalex.org/W2005589917","https://openalex.org/W2119533847","https://openalex.org/W2378757965","https://openalex.org/W1999004779","https://openalex.org/W2394145840"],"abstract_inverted_index":{"Optical":[0],"measurement":[1,25],"methods":[2],"exhibit":[3],"several":[4],"potential":[5],"advantages":[6],"such":[7],"as":[8],"non-intrusiveness,":[9],"high":[10],"sensitivity,":[11],"stability":[12],"and":[13,42,78,100,105,108],"selectivity.":[14],"On":[15],"the":[16,19,31,40,43,63,91],"other":[17],"hand":[18],"diffraction":[20,32,64],"of":[21,45,90,103],"light":[22],"limits":[23],"their":[24],"properties.":[26],"At":[27],"laser":[28,54,68],"Doppler":[29,55],"measurements":[30,61,102],"limit":[33],"results":[34],"in":[35],"a":[36,52],"complementarity":[37],"relation":[38],"between":[39],"velocity":[41,60,99],"distance":[44],"moving":[46],"scattering":[47],"objects.":[48,111],"In":[49],"this":[50],"contribution":[51],"novel":[53],"sensor":[56,69,72,93],"is":[57],"presented":[58],"providing":[59],"beyond":[62],"limit.":[65],"This":[66],"smart":[67,92],"employs":[70],"multi":[71],"data":[73],"fusion,":[74],"adaptive":[75],"signal":[76],"validation":[77],"digital":[79],"frequency":[80],"processing":[81],"close":[82],"to":[83],"Cram\u00e9r":[84],"Rao":[85],"lower":[86],"bound.":[87],"The":[88],"benefits":[89],"will":[94],"be":[95],"demonstrated":[96],"by":[97],"simultaneous":[98],"position":[101],"complex":[104],"microfluidic":[106],"flows,":[107],"high-speed":[109],"rotating":[110]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}