{"id":"https://openalex.org/W2896880393","doi":"https://doi.org/10.1109/ssci.2018.8628810","title":"A Stacked Autoencoder Neural Network based Automated Feature Extraction Method for Anomaly detection in On-line Condition Monitoring","display_name":"A Stacked Autoencoder Neural Network based Automated Feature Extraction Method for Anomaly detection in On-line Condition Monitoring","publication_year":2018,"publication_date":"2018-11-01","ids":{"openalex":"https://openalex.org/W2896880393","doi":"https://doi.org/10.1109/ssci.2018.8628810","mag":"2896880393"},"language":"en","primary_location":{"id":"doi:10.1109/ssci.2018.8628810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssci.2018.8628810","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Symposium Series on Computational Intelligence (SSCI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://dr.ntu.edu.sg/bitstream/10356/106103/1/A%20Stacked%20Autoencoder%20Neural%20Network%20based%20Automated%20Feature%20Extraction%20Method%20for%20Anomaly%20detection%20in%20On-line%20Condition%20Monitoring%205.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082017465","display_name":"Mohendra Roy","orcid":"https://orcid.org/0000-0001-5815-3294"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Mohendra Roy","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040579466","display_name":"Sumon Kumar Bose","orcid":"https://orcid.org/0000-0002-7583-972X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Sumon Kumar Bose","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018201663","display_name":"Bapi Kar","orcid":"https://orcid.org/0000-0001-9140-0816"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bapi Kar","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060345086","display_name":"P. K. Gopalakrishnan","orcid":"https://orcid.org/0000-0001-6597-6141"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Pradeep Kumar Gopalakrishnan","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002380437","display_name":"Arindam Basu","orcid":"https://orcid.org/0000-0003-1035-8770"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Arindam Basu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082017465"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":3.3108,"has_fulltext":true,"cited_by_count":39,"citation_normalized_percentile":{"value":0.92822283,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1501","last_page":"1507"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.8581030368804932},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.7155070900917053},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.7137646675109863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6793403625488281},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6382920742034912},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5903366804122925},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5777424573898315},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4979119300842285},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4491163194179535},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.43879202008247375},{"id":"https://openalex.org/keywords/anomaly","display_name":"Anomaly (physics)","score":0.4252026677131653},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3568105697631836},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1520516574382782},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07190835475921631}],"concepts":[{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.8581030368804932},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.7155070900917053},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.7137646675109863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6793403625488281},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6382920742034912},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5903366804122925},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5777424573898315},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4979119300842285},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4491163194179535},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.43879202008247375},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.4252026677131653},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3568105697631836},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1520516574382782},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07190835475921631},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ssci.2018.8628810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ssci.2018.8628810","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Symposium Series on Computational Intelligence (SSCI)","raw_type":"proceedings-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/106103","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/49567","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/106103/1/A%20Stacked%20Autoencoder%20Neural%20Network%20based%20Automated%20Feature%20Extraction%20Method%20for%20Anomaly%20detection%20in%20On-line%20Condition%20Monitoring%205.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference Paper"}],"best_oa_location":{"id":"pmh:oai:dr.ntu.edu.sg:10356/106103","is_oa":true,"landing_page_url":"http://hdl.handle.net/10220/49567","pdf_url":"https://dr.ntu.edu.sg/bitstream/10356/106103/1/A%20Stacked%20Autoencoder%20Neural%20Network%20based%20Automated%20Feature%20Extraction%20Method%20for%20Anomaly%20detection%20in%20On-line%20Condition%20Monitoring%205.pdf","source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference Paper"},"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320318804","display_name":"Delta Electronics","ror":"https://ror.org/04s3g5933"},{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2896880393.pdf","grobid_xml":"https://content.openalex.org/works/W2896880393.grobid-xml"},"referenced_works_count":43,"referenced_works":["https://openalex.org/W1509230839","https://openalex.org/W1522301498","https://openalex.org/W1568250761","https://openalex.org/W1822975400","https://openalex.org/W1922017469","https://openalex.org/W2050752817","https://openalex.org/W2057928499","https://openalex.org/W2071280205","https://openalex.org/W2100495367","https://openalex.org/W2103394661","https://openalex.org/W2111072639","https://openalex.org/W2136655611","https://openalex.org/W2147717514","https://openalex.org/W2158054309","https://openalex.org/W2163922914","https://openalex.org/W2167258025","https://openalex.org/W2248620004","https://openalex.org/W2296077894","https://openalex.org/W2318541911","https://openalex.org/W2346303648","https://openalex.org/W2466466279","https://openalex.org/W2466930957","https://openalex.org/W2535846472","https://openalex.org/W2564810971","https://openalex.org/W2567090851","https://openalex.org/W2575612002","https://openalex.org/W2603225712","https://openalex.org/W2611423883","https://openalex.org/W2734718015","https://openalex.org/W2759531725","https://openalex.org/W2766132841","https://openalex.org/W2782770778","https://openalex.org/W2788503157","https://openalex.org/W2792643794","https://openalex.org/W2962723982","https://openalex.org/W2963273475","https://openalex.org/W2964121744","https://openalex.org/W3207342693","https://openalex.org/W4292957088","https://openalex.org/W6631190155","https://openalex.org/W6736412012","https://openalex.org/W6749029207","https://openalex.org/W6841205758"],"related_works":["https://openalex.org/W3186512740","https://openalex.org/W3194885736","https://openalex.org/W4363671829","https://openalex.org/W2806741695","https://openalex.org/W4290647774","https://openalex.org/W3189286258","https://openalex.org/W3207797160","https://openalex.org/W3210364259","https://openalex.org/W4300558037","https://openalex.org/W2667207928"],"abstract_inverted_index":{"Condition":[0],"monitoring":[1,216],"is":[2,52,95,239,272],"one":[3],"of":[4,26,40,83,90,127,131,145,150,156,159,197,221,236,243,262,269,279,281],"the":[5,23,41,88,106,113,119,125,128,143,146,153,157,166,174,184,195,219,222,244,258,275],"routine":[6],"tasks":[7],"in":[8,33,47,105,173,194],"all":[9],"major":[10,24],"process":[11,28],"industries.":[12],"The":[13,234,249,266],"mechanical":[14],"parts":[15],"such":[16],"as":[17],"a":[18,27,37],"motor,":[19],"gear,":[20],"bearing":[21,259,264],"are":[22,72,85,116,133,138],"components":[25],"industry":[29],"and":[30,69,78,97,122,161,199,225],"any":[31,57],"fault":[32],"them":[34,84],"may":[35,45],"cause":[36],"total":[38],"shutdown":[39],"whole":[42],"process,":[43],"which":[44,94],"result":[46],"serious":[48],"losses.":[49],"Therefore":[50],"it":[51],"very":[53],"crucial":[54],"to":[55,183,241],"predict":[56],"approaching":[58],"defects":[59],"before":[60],"its":[61],"occurrence.":[62],"Several":[63],"methods":[64],"exist":[65],"for":[66,76,124,213,256,274],"this":[67,203,237,270],"purpose":[68],"many":[70],"research":[71],"being":[73],"carried":[74],"out":[75],"better":[77],"efficient":[79],"models.":[80],"However,":[81,170],"most":[82],"based":[86,108,141,176,217,284],"on":[87,142,218],"processing":[89],"raw":[91,120,147],"sensor":[92],"signals,":[93],"tedious":[96],"expensive.":[98],"Recently,":[99],"there":[100],"has":[101],"been":[102,192],"an":[103,181,208,226],"increase":[104],"feature":[107,167,177,210,246],"condition":[109,215],"monitoring,":[110],"where":[111,136],"only":[112],"useful":[114],"features":[115],"extracted":[117],"from":[118],"signals":[121],"interpreted":[123],"prediction":[126],"fault.":[129],"Most":[130],"these":[132,137],"handcrafted":[134,186],"features,":[135],"manually":[139],"obtained":[140],"nature":[144,158],"data.":[148],"This":[149,164],"course":[151],"requires":[152],"prior":[154],"knowledge":[155],"data":[160],"related":[162],"processes.":[163],"limits":[165],"extraction":[168,178,211,247],"process.":[169],"recent":[171],"development":[172],"autoencoder":[175,224],"method":[179,212,238,250,271],"provides":[180],"alternative":[182],"traditional":[185,223,245],"approaches;":[187],"however,":[188],"they":[189],"have":[190,206],"mostly":[191],"confined":[193],"area":[196],"image":[198],"audio":[200],"processing.":[201],"In":[202],"work,":[204],"we":[205],"developed":[207],"automated":[209],"on-line":[214,227],"stack":[220],"sequential":[228],"extreme":[229],"learning":[230],"machine":[231],"(OSELM)":[232],"network.":[233],"performance":[235],"comparable":[240],"that":[242],"approaches.":[248],"can":[251],"achieve":[252],"100%":[253],"detection":[254],"accuracy":[255],"determining":[257],"health":[260],"states":[261],"NASA":[263],"dataset.":[265],"simple":[267],"design":[268],"promising":[273],"easy":[276],"hardware":[277],"implementation":[278],"Internet":[280],"Things":[282],"(IoT)":[283],"prognostics":[285],"solutions.":[286]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}