{"id":"https://openalex.org/W2025539168","doi":"https://doi.org/10.1109/soccon.2009.5398033","title":"Temperature behavior of combination selection based mismatch calibration with 65 nm CMOS technology","display_name":"Temperature behavior of combination selection based mismatch calibration with 65 nm CMOS technology","publication_year":2009,"publication_date":"2009-09-01","ids":{"openalex":"https://openalex.org/W2025539168","doi":"https://doi.org/10.1109/soccon.2009.5398033","mag":"2025539168"},"language":"en","primary_location":{"id":"doi:10.1109/soccon.2009.5398033","is_oa":false,"landing_page_url":"https://doi.org/10.1109/soccon.2009.5398033","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International SOC Conference (SOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010469494","display_name":"Joona Marku","orcid":null},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Joona Marku","raw_affiliation_strings":["Department of Information Technology, Microelectronics Laboratory, University of Turku, Turku, Finland","University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, Microelectronics Laboratory, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]},{"raw_affiliation_string":"University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088530873","display_name":"Jonne Poikonen","orcid":"https://orcid.org/0000-0002-5531-2453"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Jonne Poikonen","raw_affiliation_strings":["Department of Information Technology, Microelectronics Laboratory, University of Turku, Turku, Finland","University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, Microelectronics Laboratory, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]},{"raw_affiliation_string":"University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038944203","display_name":"A. Paasio","orcid":"https://orcid.org/0000-0003-2543-7391"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Ari Paasio","raw_affiliation_strings":["Department of Information Technology, Microelectronics Laboratory, University of Turku, Turku, Finland","University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, Microelectronics Laboratory, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]},{"raw_affiliation_string":"University of Turku, Department of Information Technology, Microelectronics Laboratory, FIN-20014, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11581344,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"311","last_page":"314"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.8037004470825195},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.745316743850708},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7289710640907288},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5380876064300537},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5033037066459656},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5006420612335205},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4977293312549591},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4931744933128357},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.49130311608314514},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.46025383472442627},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4376024007797241},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3004121780395508},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2599494755268097},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.25760236382484436},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17165499925613403},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11215752363204956},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10315188765525818},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10075801610946655},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08132565021514893}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8037004470825195},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.745316743850708},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7289710640907288},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5380876064300537},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5033037066459656},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5006420612335205},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4977293312549591},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4931744933128357},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.49130311608314514},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46025383472442627},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4376024007797241},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3004121780395508},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2599494755268097},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.25760236382484436},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17165499925613403},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11215752363204956},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10315188765525818},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10075801610946655},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08132565021514893},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/soccon.2009.5398033","is_oa":false,"landing_page_url":"https://doi.org/10.1109/soccon.2009.5398033","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International SOC Conference (SOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1564645516","https://openalex.org/W1977084925","https://openalex.org/W2067075541","https://openalex.org/W2087429211","https://openalex.org/W2140281076","https://openalex.org/W2150316637","https://openalex.org/W2151023076"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2379084545","https://openalex.org/W2937314749","https://openalex.org/W2507745370","https://openalex.org/W2889599805","https://openalex.org/W4318601828"],"abstract_inverted_index":{"The":[0,12,79],"temperature":[1,52,81,96],"behaviour":[2],"of":[3,14,40,51,98,116],"a":[4],"combination":[5,38,63],"selection":[6,39,64],"based":[7,36,65],"mismatch":[8,34,66,84],"calibration":[9,16,35,67],"is":[10,68],"discussed.":[11],"functionality":[13],"the":[15,45,49,57,95,111],"structure":[17],"has":[18],"already":[19],"been":[20],"presented.":[21],"Clear":[22],"benefits":[23],"in":[24,73,91,101,114,119],"implementation":[25],"area":[26],"and":[27,71,83],"accuracy":[28,47,90],"can":[29,105],"be":[30,54,107],"reached":[31],"when":[32],"using":[33],"on":[37],"fine-tuning":[41],"transistors.":[42],"However,":[43],"with":[44],"high":[46],"requirements,":[48],"effects":[50],"must":[53],"taken":[55],"into":[56],"account.":[58],"Temperature":[59],"compensation":[60],"circuitry":[61],"for":[62],"developed,":[69],"designed":[70],"simulated":[72],"digital":[74],"65":[75],"nm":[76],"CMOS":[77],"technology.":[78],"new":[80],"compensated":[82],"calibrated":[85],"current":[86,112],"source":[87,113],"achieves":[88],"99%":[89],"4\u00bf":[92],"confidence":[93],"over":[94],"range":[97,104],"40":[99],"degrees":[100,118],"centigrade.":[102,120],"This":[103],"still":[106],"extended":[108],"by":[109],"recalibrating":[110],"intervals":[115],"20":[117]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}