{"id":"https://openalex.org/W4404057309","doi":"https://doi.org/10.1109/socc62300.2024.10737778","title":"Ring oscillator based clock generation for a radiation-hardened optically reconfigurable gate array VLSI","display_name":"Ring oscillator based clock generation for a radiation-hardened optically reconfigurable gate array VLSI","publication_year":2024,"publication_date":"2024-09-16","ids":{"openalex":"https://openalex.org/W4404057309","doi":"https://doi.org/10.1109/socc62300.2024.10737778"},"language":"en","primary_location":{"id":"doi:10.1109/socc62300.2024.10737778","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/socc62300.2024.10737778","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 37th International System-on-Chip Conference (SOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114522244","display_name":"Shintaro Takatsuki","orcid":null},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shintaro Takatsuki","raw_affiliation_strings":["Okayama University 3–1–1, Tushima–naka, Kita–ku,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700\u20138530"],"affiliations":[{"raw_affiliation_string":"Okayama University 3–1–1, Tushima–naka, Kita–ku,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700\u20138530","institution_ids":["https://openalex.org/I163770644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113590716","display_name":"Minoru Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Minoru Watanabe","raw_affiliation_strings":["Okayama University 3–1–1, Tushima–naka, Kita–ku,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700\u20138530"],"affiliations":[{"raw_affiliation_string":"Okayama University 3–1–1, Tushima–naka, Kita–ku,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700\u20138530","institution_ids":["https://openalex.org/I163770644"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102326922","display_name":"Nobuya Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuya Watanabe","raw_affiliation_strings":["Okayama University 3–1–1, Tushima–naka, Kita–ku,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700\u20138530"],"affiliations":[{"raw_affiliation_string":"Okayama University 3–1–1, Tushima–naka, Kita–ku,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700\u20138530","institution_ids":["https://openalex.org/I163770644"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5114522244"],"corresponding_institution_ids":["https://openalex.org/I163770644"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17679797,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.728528618812561},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.6744964122772217},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6167135834693909},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.5840765833854675},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5352723002433777},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4549640119075775},{"id":"https://openalex.org/keywords/gate-array","display_name":"Gate array","score":0.4492175579071045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42507702112197876},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33983319997787476},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.28129011392593384},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.22445660829544067},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2138899862766266},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.11323952674865723},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.08837011456489563}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.728528618812561},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.6744964122772217},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6167135834693909},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.5840765833854675},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5352723002433777},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4549640119075775},{"id":"https://openalex.org/C114237110","wikidata":"https://www.wikidata.org/wiki/Q114901","display_name":"Gate array","level":3,"score":0.4492175579071045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42507702112197876},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33983319997787476},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.28129011392593384},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22445660829544067},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2138899862766266},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.11323952674865723},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08837011456489563},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc62300.2024.10737778","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/socc62300.2024.10737778","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 37th International System-on-Chip Conference (SOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8399999737739563}],"awards":[],"funders":[{"id":"https://openalex.org/F4320308244","display_name":"Giant","ror":"https://ror.org/00mc4x834"},{"id":"https://openalex.org/F4320321408","display_name":"Ministry of Education","ror":"https://ror.org/01p262204"},{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1980344006","https://openalex.org/W2767108248","https://openalex.org/W2895588716","https://openalex.org/W3028989297","https://openalex.org/W3108130890","https://openalex.org/W4387473943","https://openalex.org/W4388667062"],"related_works":["https://openalex.org/W4396942000","https://openalex.org/W4399458808","https://openalex.org/W2367348190","https://openalex.org/W2014165129","https://openalex.org/W594316872","https://openalex.org/W2292110992","https://openalex.org/W2831860248","https://openalex.org/W2367794224","https://openalex.org/W2072850836","https://openalex.org/W3195700791"],"abstract_inverted_index":{"Currently":[0],"available":[1],"radiation-hardened":[2,29,47,68,115],"very":[3],"large":[4],"scale":[5],"integrated":[6],"circuits":[7,95],"(VLSIs)":[8],"are":[9,96,103],"extremely":[10],"vulnerable":[11],"to":[12],"radiation.":[13],"Assuming":[14],"nuclear":[15],"power":[16],"plant":[17],"maintenance":[18],"and":[19,39,146],"decommissioning":[20],"situations":[21],"as":[22,102],"examples,":[23],"the":[24,37,120],"radiation":[25,63,101,110,121],"tolerance":[26,64,122],"of":[27,36,46,123],"current":[28,66,104],"VLSIs":[30],"is":[31,58],"insufficient":[32],"in":[33],"terms":[34],"both":[35],"total-ionizing-dose":[38,55],"soft-error":[40],"tolerances.":[41],"Therefore,":[42],"we":[43],"continued":[44],"development":[45],"optically":[48,73,116,141],"reconfigurable":[49,74,117,142],"gate":[50,75,118,143],"arrays":[51],"with":[52],"1":[53],"Grad":[54],"tolerance,":[56],"which":[57],"about":[59],"1000":[60],"times":[61],"higher":[62,109],"than":[65],"typical":[67],"VLSIs.":[69,105],"However,":[70],"even":[71],"for":[72],"arrays,":[76],"any":[77],"digital":[78],"circuit":[79],"must":[80,127],"function":[81],"based":[82,136],"on":[83,139],"a":[84,89,108,114,124],"clock":[85,125,137],"signal":[86],"generated":[87],"by":[88,100],"crystal":[90,93],"oscillator.":[91],"Nevertheless,":[92],"oscillator":[94,135],"irreparably":[97],"damaged":[98],"easily":[99],"To":[106],"realize":[107],"tolerant":[111],"system":[112],"using":[113],"array,":[119],"source":[126],"be":[128],"increased.":[129],"This":[130],"paper":[131],"presents":[132],"dependable":[133],"ring":[134],"generation":[138],"an":[140],"array":[144],"VLSI":[145],"its":[147],"related":[148],"experimentally":[149],"obtained":[150],"results.":[151]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}