{"id":"https://openalex.org/W2912094241","doi":"https://doi.org/10.1109/socc.2018.8618569","title":"A 81nW Error Amplifier Design for Ultra Low Leakage Retention Mode Operation of 4Mb SRAM Array in 40nm LSTP Technology","display_name":"A 81nW Error Amplifier Design for Ultra Low Leakage Retention Mode Operation of 4Mb SRAM Array in 40nm LSTP Technology","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2912094241","doi":"https://doi.org/10.1109/socc.2018.8618569","mag":"2912094241"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2018.8618569","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2018.8618569","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 31st IEEE International System-on-Chip Conference (SOCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037324292","display_name":"Ankush Mamgain","orcid":null},"institutions":[{"id":"https://openalex.org/I119939252","display_name":"Indraprastha Institute of Information Technology Delhi","ror":"https://ror.org/03vfp4g33","country_code":"IN","type":"education","lineage":["https://openalex.org/I119939252"]},{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ankush Mamgain","raw_affiliation_strings":["Department of Electronics and Communication, IIIT-Delhi, New Delhi, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication, IIIT-Delhi, New Delhi, India","institution_ids":["https://openalex.org/I119939252","https://openalex.org/I68891433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063583051","display_name":"Anuj Grover","orcid":"https://orcid.org/0000-0002-6057-4984"},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anuj Grover","raw_affiliation_strings":["ST Microelectronics India Pvt. Ltd., Greater Noida, UP, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Microelectronics India Pvt. Ltd., Greater Noida, UP, India","institution_ids":["https://openalex.org/I4210094169"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3896,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56900283,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"203","last_page":"208"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8219300508499146},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.7649890184402466},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6848986744880676},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.5699412226676941},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5458597540855408},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5157504081726074},{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.5052476525306702},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4895568788051605},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4147162139415741},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3965979814529419},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.39278483390808105},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3260381817817688},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2549170255661011},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.19805464148521423},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10332626104354858},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08012914657592773}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8219300508499146},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.7649890184402466},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6848986744880676},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.5699412226676941},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5458597540855408},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5157504081726074},{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.5052476525306702},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4895568788051605},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4147162139415741},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3965979814529419},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.39278483390808105},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3260381817817688},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2549170255661011},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.19805464148521423},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10332626104354858},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08012914657592773},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2018.8618569","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2018.8618569","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 31st IEEE International System-on-Chip Conference (SOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1899658488","https://openalex.org/W1990823448","https://openalex.org/W1998359033","https://openalex.org/W2099569060","https://openalex.org/W2099911327","https://openalex.org/W2109458212","https://openalex.org/W2125263803","https://openalex.org/W3144413718","https://openalex.org/W6676534250"],"related_works":["https://openalex.org/W2297319780","https://openalex.org/W2178217057","https://openalex.org/W1972800815","https://openalex.org/W2023834321","https://openalex.org/W1785301911","https://openalex.org/W2548830639","https://openalex.org/W2159770326","https://openalex.org/W4252086734","https://openalex.org/W4295791092","https://openalex.org/W2128563080"],"abstract_inverted_index":{"In":[0,32],"advanced":[1],"technology":[2],"nodes,":[3],"static":[4,26],"power":[5,9,27,41,57,79],"consumption":[6,28],"dominates":[7],"system":[8],"in":[10],"applications":[11],"that":[12],"do":[13],"not":[14],"operate":[15],"at":[16,72],"high":[17],"frequency.":[18],"SRAM":[19,50],"leakage":[20,47,56,78],"is":[21],"a":[22,30,37],"major":[23],"component":[24],"of":[25,29,48],"SOC.":[31],"this":[33],"paper,":[34],"we":[35],"propose":[36],"81nW":[38],"ultra":[39],"low":[40],"error":[42],"amplifier":[43],"to":[44],"control":[45],"retention":[46,63,70,85],"4Mb":[49],"array.":[51],"The":[52],"overall":[53],"memory":[54],"subsystem":[55],"reduces":[58,80],"by":[59,81],"50%":[60],"from":[61,67,83,88],"no":[62,84],"case":[64],"and":[65],"33%":[66],"the":[68,95],"conventional":[69,89],"solution":[71],"TT":[73],"(25\u00b0C).":[74],"At":[75],"FNSP":[76],"(140\u00b0C)":[77],"75%":[82],"&":[86],"69%":[87],"solution.":[90],"Monte":[91],"Carlo":[92],"analysis":[93],"shows":[94],"3\u03c3":[96],"variations":[97],"are":[98],"within":[99],"guard":[100],"band":[101],"limits.":[102]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}