{"id":"https://openalex.org/W2609933105","doi":"https://doi.org/10.1109/socc.2016.7905463","title":"Analytical noise model for avalanche ISFET sensor suitable for Next Generation Sequencing","display_name":"Analytical noise model for avalanche ISFET sensor suitable for Next Generation Sequencing","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2609933105","doi":"https://doi.org/10.1109/socc.2016.7905463","mag":"2609933105"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2016.7905463","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2016.7905463","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 29th IEEE International System-on-Chip Conference (SOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037695625","display_name":"Mohammad Mohiuddin Uzzal","orcid":null},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mohammad M Uzzal","raw_affiliation_strings":["Departrnent of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Departrnent of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018095974","display_name":"Payman Zarkesh-Ha","orcid":"https://orcid.org/0000-0002-0571-9212"},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Payman Zarkesh-Ha","raw_affiliation_strings":["Departrnent of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA","ElectroSeq, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Departrnent of Electrical and Computer Engineering, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]},{"raw_affiliation_string":"ElectroSeq, Albuquerque, NM, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012651953","display_name":"Paul Szauter","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Paul Szauter","raw_affiliation_strings":["ElectroSeq, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"ElectroSeq, Albuquerque, NM, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059056673","display_name":"Jeremy S. Edwards","orcid":"https://orcid.org/0000-0003-3694-3716"},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeremy Edwards","raw_affiliation_strings":["Chemistry and Chemical Biology, University of New Mexico, Albuquerque, NM, USA","ElectroSeq, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Chemistry and Chemical Biology, University of New Mexico, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I169521973"]},{"raw_affiliation_string":"ElectroSeq, Albuquerque, NM, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5037695625"],"corresponding_institution_ids":["https://openalex.org/I169521973"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22810011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":null,"first_page":"189","last_page":"193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14249","display_name":"Water Quality Monitoring and Analysis","score":0.9754999876022339,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isfet","display_name":"ISFET","score":0.9215751886367798},{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.6776048541069031},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6695007085800171},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6447610855102539},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6297647953033447},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.540388822555542},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4988842010498047},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4463624954223633},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4333884119987488},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41320449113845825},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3483913838863373},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3428061306476593},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13893038034439087},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.12414246797561646},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09059566259384155},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07661879062652588},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06696096062660217}],"concepts":[{"id":"https://openalex.org/C154275363","wikidata":"https://www.wikidata.org/wiki/Q904133","display_name":"ISFET","level":5,"score":0.9215751886367798},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.6776048541069031},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6695007085800171},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6447610855102539},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6297647953033447},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.540388822555542},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4988842010498047},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4463624954223633},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4333884119987488},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41320449113845825},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3483913838863373},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3428061306476593},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13893038034439087},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.12414246797561646},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09059566259384155},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07661879062652588},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06696096062660217},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2016.7905463","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2016.7905463","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 29th IEEE International System-on-Chip Conference (SOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1512457382","https://openalex.org/W1603679300","https://openalex.org/W1964838045","https://openalex.org/W1988929438","https://openalex.org/W2010680144","https://openalex.org/W2020567521","https://openalex.org/W2025917502","https://openalex.org/W2058839892","https://openalex.org/W2061127516","https://openalex.org/W2081678792","https://openalex.org/W2098876187","https://openalex.org/W2108464649","https://openalex.org/W2112149602","https://openalex.org/W2116796838","https://openalex.org/W2119399232","https://openalex.org/W2126777321","https://openalex.org/W2137358754","https://openalex.org/W2145193487","https://openalex.org/W2152267393","https://openalex.org/W2161495293","https://openalex.org/W2164748278","https://openalex.org/W2181413867","https://openalex.org/W2526006222","https://openalex.org/W2543105850","https://openalex.org/W3127481735","https://openalex.org/W4285719527","https://openalex.org/W6727715950"],"related_works":["https://openalex.org/W4226065539","https://openalex.org/W2063174160","https://openalex.org/W1997963871","https://openalex.org/W2333264988","https://openalex.org/W2083672075","https://openalex.org/W4250415373","https://openalex.org/W2022856681","https://openalex.org/W2031348296","https://openalex.org/W2307187547","https://openalex.org/W4289205462"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"the":[3,48,75,110,120],"noise":[4,62,94,104],"behavior":[5],"of":[6,91,119],"a":[7,34,84,89],"novel":[8],"Avalanche":[9],"Ion":[10],"Sensitive":[11],"Field":[12],"Effect":[13],"Transistor":[14],"(A-ISFET)":[15],"is":[16,20,51,67,113],"presented.":[17],"The":[18],"A-ISFET":[19,66,76,121],"an":[21,40,65,71,106],"ion":[22],"sensitive":[23],"field":[24],"effect":[25],"transistor":[26],"that":[27],"can":[28],"inherently":[29],"deliver":[30],"high":[31],"sensitivity":[32,118],"through":[33],"multiplication":[35,111],"factor,":[36],"M,":[37],"similar":[38],"to":[39,80,115],"avalanche":[41],"photodiode,":[42],"where":[43],"they":[44],"are":[45],"used":[46],"when":[47],"input":[49],"signal":[50],"very":[52],"weak.":[53],"A":[54],"physical":[55],"model":[56,73],"for":[57,74,109],"both":[58],"intrinsic":[59],"and":[60,96,99],"extrinsic":[61],"mechanisms":[63],"in":[64],"derived.":[68],"We":[69],"developed":[70],"analytical":[72],"signal-to-noise":[77],"ratio":[78],"(SNR)":[79],"maximize":[81,116],"SNR":[82,117],"at":[83],"specific":[85],"operating":[86],"point,":[87],"as":[88],"function":[90],"current":[92],"components,":[93],"sources":[95],"overall":[97],"structure":[98],"operation.":[100],"Based":[101],"on":[102],"our":[103],"model,":[105],"optimum":[107],"value":[108],"gain":[112],"found":[114],"sensor.":[122]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}