{"id":"https://openalex.org/W2064714576","doi":"https://doi.org/10.1109/socc.2012.6398395","title":"A wide tuning range QCCO based on CMOS active inductors","display_name":"A wide tuning range QCCO based on CMOS active inductors","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W2064714576","doi":"https://doi.org/10.1109/socc.2012.6398395","mag":"2064714576"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2012.6398395","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2012.6398395","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International SOC Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100433102","display_name":"Jun Zhang","orcid":"https://orcid.org/0000-0002-0644-9154"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Zhang","raw_affiliation_strings":["Research Institution of Electronic Science and Technology of UESTC, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institution of Electronic Science and Technology of UESTC, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031578846","display_name":"Huihua Liu","orcid":"https://orcid.org/0000-0002-9146-7620"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huihua Liu","raw_affiliation_strings":["Research Institution of Electronic Science and Technology of UESTC, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institution of Electronic Science and Technology of UESTC, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.12333553,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"4","issue":null,"first_page":"120","last_page":"124"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.9058876037597656},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.8613168001174927},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7250161170959473},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.6922735571861267},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5007116794586182},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4281883239746094},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38637402653694153},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26406246423721313},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1442827582359314}],"concepts":[{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.9058876037597656},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.8613168001174927},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7250161170959473},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.6922735571861267},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5007116794586182},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4281883239746094},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38637402653694153},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26406246423721313},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1442827582359314}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2012.6398395","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2012.6398395","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International SOC Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1573726872","https://openalex.org/W1688466978","https://openalex.org/W1987487921","https://openalex.org/W1999090085","https://openalex.org/W2017683284","https://openalex.org/W2047584215","https://openalex.org/W2103276620","https://openalex.org/W2103355337","https://openalex.org/W2113006075","https://openalex.org/W2117413393","https://openalex.org/W2125435956","https://openalex.org/W2127823455","https://openalex.org/W2159858159","https://openalex.org/W2160966443","https://openalex.org/W2487538370","https://openalex.org/W3215260922","https://openalex.org/W4300399882","https://openalex.org/W6675643343"],"related_works":["https://openalex.org/W2540832666","https://openalex.org/W4286579627","https://openalex.org/W1851259350","https://openalex.org/W272184114","https://openalex.org/W2117747481","https://openalex.org/W2394282069","https://openalex.org/W3189810088","https://openalex.org/W2971609434","https://openalex.org/W2141726610","https://openalex.org/W4281672152"],"abstract_inverted_index":{"In":[0],"this":[1,27,86],"paper,":[2],"a":[3,31,73,89],"quadrature":[4],"current-controlled":[5],"oscillator":[6],"(QCCO)":[7],"based":[8],"on":[9],"active":[10],"inductors":[11],"has":[12],"been":[13],"implemented":[14],"in":[15],"SMIC":[16],"0.13":[17],"um":[18],"1P8M":[19],"RF":[20],"CMOS":[21],"process.":[22],"Simulation":[23],"results":[24],"show":[25],"that":[26],"circuit":[28,87],"can":[29],"achieve":[30],"very":[32],"wide":[33],"tuning":[34,61],"range":[35],"of":[36,59,82],"85.7%":[37],"from":[38,49,72],"400":[39],"MHz":[40],"to":[41,52,79],"1":[42],"GHz":[43],"and":[44],"the":[45,56,60,80],"phase":[46],"noise":[47],"is":[48],"-97.3":[50],"dBc/Hz@1MHz":[51,54],"-91.5":[53],"between":[55],"two":[57],"ends":[58],"range.":[62],"The":[63],"QCCO":[64],"core":[65],"only":[66],"draws":[67],"approximately":[68],"3.5":[69],"mA":[70],"current":[71],"1.2":[74],"V":[75],"power":[76],"supply.":[77],"Due":[78],"absence":[81],"conventional":[83],"spiral":[84],"inductors,":[85],"occupies":[88],"much":[90],"smaller":[91],"areas.":[92]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}