{"id":"https://openalex.org/W2139508528","doi":"https://doi.org/10.1109/socc.2011.6085092","title":"PVT variations aware optimal sleep vector determination of dual VT domino OR circuits","display_name":"PVT variations aware optimal sleep vector determination of dual VT domino OR circuits","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2139508528","doi":"https://doi.org/10.1109/socc.2011.6085092","mag":"2139508528"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2011.6085092","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2011.6085092","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International SOC Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069728349","display_name":"Na Gong","orcid":"https://orcid.org/0000-0002-3297-7436"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Na Gong","raw_affiliation_strings":["University at Buffalo, State University of New York, Buffalo, NY, USA","University at Buffalo, State University of New York , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University at Buffalo, State University of New York, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"University at Buffalo, State University of New York , USA","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043189989","display_name":"Jinhui Wang","orcid":"https://orcid.org/0000-0003-4731-8481"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhui Wang","raw_affiliation_strings":["VLSI and System Laboratory, Beijing University of Technology, Beijing, China","VLSI & System Lab, Beijing University of Technology, CHINA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VLSI and System Laboratory, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]},{"raw_affiliation_string":"VLSI & System Lab, Beijing University of Technology, CHINA","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108456717","display_name":"Ramalingam Sridhar","orcid":null},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramalingam Sridhar","raw_affiliation_strings":["University at Buffalo, State University of New York, Buffalo, NY, USA","University at Buffalo, State University of New York , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University at Buffalo, State University of New York, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"University at Buffalo, State University of New York , USA","institution_ids":["https://openalex.org/I63190737"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.23759745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"359","last_page":"364"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7080278396606445},{"id":"https://openalex.org/keywords/domino","display_name":"Domino","score":0.6852130889892578},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5607385039329529},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5355678796768188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48076388239860535},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.43415600061416626},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42362266778945923},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.41869205236434937},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39956292510032654},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2951204180717468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23614618182182312}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7080278396606445},{"id":"https://openalex.org/C2776416436","wikidata":"https://www.wikidata.org/wiki/Q3751781","display_name":"Domino","level":3,"score":0.6852130889892578},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5607385039329529},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5355678796768188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48076388239860535},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.43415600061416626},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42362266778945923},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.41869205236434937},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39956292510032654},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2951204180717468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23614618182182312},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2011.6085092","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2011.6085092","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International SOC Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1981720104","https://openalex.org/W1996424708","https://openalex.org/W2039097694","https://openalex.org/W2097321959","https://openalex.org/W2111762661","https://openalex.org/W2128350791","https://openalex.org/W2134076376","https://openalex.org/W2137366465","https://openalex.org/W2137416563","https://openalex.org/W2140541049"],"related_works":["https://openalex.org/W2382258274","https://openalex.org/W2949566546","https://openalex.org/W2055499991","https://openalex.org/W3206711179","https://openalex.org/W1831276183","https://openalex.org/W2352166889","https://openalex.org/W2097896055","https://openalex.org/W4293436957","https://openalex.org/W3215142653","https://openalex.org/W1487051936"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"determining":[3],"optimal":[4,63],"leakage":[5,69],"vector":[6,60,65,84],"for":[7,66],"dual":[8],"Vt":[9],"domino":[10],"OR":[11],"circuits":[12],"is":[13,61],"explored":[14],"under":[15],"process,":[16],"supply":[17],"voltage,":[18],"and":[19,28,46,73],"temperature":[20],"(PVT)":[21],"variations":[22],"based":[23],"on":[24],"65":[25],"nm":[26,30],"bulk":[27],"45":[29],"high":[31,53,57],"k/metal":[32],"gate":[33],"(HK+MG)":[34],"technologies,":[35],"while":[36],"considering":[37],"design":[38],"parameters,":[39,41],"environmental":[40],"working":[42],"characteristics":[43],"of":[44,81],"circuits,":[45],"application":[47],"cases.":[48],"It":[49],"concludes":[50],"that":[51],"the":[52,62,74,79,82],"clock":[54],"signal":[55],"with":[56],"inputs":[58],"(CHIH)":[59],"sleep":[64],"practical":[67],"low":[68],"register":[70],"files":[71],"applications,":[72],"HK+MG":[75],"technology":[76],"further":[77],"highlights":[78],"effectiveness":[80],"CHIH":[83],"as":[85],"compared":[86],"to":[87],"other":[88],"vectors.":[89]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}